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Title: Design and characterization of Ion sources for CHIP-TRAP

Abstract

At Central Michigan University, we are developing a high-precision Penning trap mass spectrometer (CHIP-TRAP) for precise mass measurements with stable and long-lived isotopes. Ions will be produced using external ion sources and then transported to the Penning trap at low energy using electrostatic ion optics. Ion sources that will be utilized with CHIP-TRAP include a laser ablation ion source (LAS) that has already been commissioned, and a low current Penning ion trap (PIT) source that is currently being developed. The LAS enables ion production from solid targets via ablation and ionization with a high-powered laser pulse. The PIT source is a novel Penning ionization gauge (PIG) type source, consisting of a 0.55 T NdFeB ring magnet, cylindrical Penning trap, and low current thermal electron emitter that enables ion production via electron impact ionization of gaseous samples. For both ion sources, small bunches of ~100 – 1000 ions can be produced from a minimal sample of source material. Finally, the ion bunches are then transported along the CHIP-TRAP beamline, where time-of-flight mass filtering can be performed before they are captured in the CHIP-TRAP Penning traps.

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [2]
  1. Central Michigan Univ., Mount Pleasant, MI (United States)
  2. Central Michigan Univ., Mount Pleasant, MI (United States); National Superconducting Cyclotron Lab., East Lansing, MI (United States)
Publication Date:
Research Org.:
Central Michigan Univ., Mount Pleasant, MI (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP); National Science Foundation (NSF)
OSTI Identifier:
1674970
Grant/Contract Number:  
SC0015927; PHY-1307233; PHY-1607429
Resource Type:
Accepted Manuscript
Journal Name:
Hyperfine Interactions
Additional Journal Information:
Journal Volume: 240; Journal Issue: 1; Journal ID: ISSN 0304-3843
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 47 OTHER INSTRUMENTATION; 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS; penning traps; ion source; electron impact ionization

Citation Formats

Horana Gamage, M., Arnold, A. L., Bhandari, R., Gamage, N. D., Purcell, Z., Sandler, R., and Redshaw, M.. Design and characterization of Ion sources for CHIP-TRAP. United States: N. p., 2019. Web. https://doi.org/10.1007/s10751-019-1617-4.
Horana Gamage, M., Arnold, A. L., Bhandari, R., Gamage, N. D., Purcell, Z., Sandler, R., & Redshaw, M.. Design and characterization of Ion sources for CHIP-TRAP. United States. https://doi.org/10.1007/s10751-019-1617-4
Horana Gamage, M., Arnold, A. L., Bhandari, R., Gamage, N. D., Purcell, Z., Sandler, R., and Redshaw, M.. Tue . "Design and characterization of Ion sources for CHIP-TRAP". United States. https://doi.org/10.1007/s10751-019-1617-4. https://www.osti.gov/servlets/purl/1674970.
@article{osti_1674970,
title = {Design and characterization of Ion sources for CHIP-TRAP},
author = {Horana Gamage, M. and Arnold, A. L. and Bhandari, R. and Gamage, N. D. and Purcell, Z. and Sandler, R. and Redshaw, M.},
abstractNote = {At Central Michigan University, we are developing a high-precision Penning trap mass spectrometer (CHIP-TRAP) for precise mass measurements with stable and long-lived isotopes. Ions will be produced using external ion sources and then transported to the Penning trap at low energy using electrostatic ion optics. Ion sources that will be utilized with CHIP-TRAP include a laser ablation ion source (LAS) that has already been commissioned, and a low current Penning ion trap (PIT) source that is currently being developed. The LAS enables ion production from solid targets via ablation and ionization with a high-powered laser pulse. The PIT source is a novel Penning ionization gauge (PIG) type source, consisting of a 0.55 T NdFeB ring magnet, cylindrical Penning trap, and low current thermal electron emitter that enables ion production via electron impact ionization of gaseous samples. For both ion sources, small bunches of ~100 – 1000 ions can be produced from a minimal sample of source material. Finally, the ion bunches are then transported along the CHIP-TRAP beamline, where time-of-flight mass filtering can be performed before they are captured in the CHIP-TRAP Penning traps.},
doi = {10.1007/s10751-019-1617-4},
journal = {Hyperfine Interactions},
number = 1,
volume = 240,
place = {United States},
year = {2019},
month = {8}
}

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