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Title: Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams

Abstract

Silicon is a commonly used material for the fabrication of beams for use in micro-electrical-mechanical systems (MEMS). Although silicon is a brittle material, it has been shown to accumulate fatigue damage at the micro-scale. Understanding the effect this has on the overall device performance is critical to the design of reliable devices. Analytical methods for modeling damage provide expedient results but are limited by broad modeling assumptions. Numerical models account for more detailed physical phenomena but can be computationally intensive. In this work, two different crack scenarios are modeled using both analytical techniques and 3D computational simulations. First, the effects of a single surface crack on the static deflection and natural frequency of an electrostatically actuated micro-beam are formulated and compared. Then, a new method for approximating damage associated with realistic distributed crack networks is formulated for use in an analytical model and numerical simulations. A method for utilizing experimentally derived crack statistics to inform the analytical and numerical distributed crack models is developed. Good agreement between the analytical and numerical models is obtained for both crack scenarios. Altogether, these models can be used to effectively simulate a variety of damage and fatigue behaviors in silicon-based MEMS devices.

Authors:
 [1]; ORCiD logo [2];  [3]
  1. New Mexico State University, Las Cruces, NM (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  2. Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  3. New Mexico State University, Las Cruces, NM (United States)
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE Advanced Research Projects Agency - Energy (ARPA-E)
OSTI Identifier:
1673376
Report Number(s):
LA-UR-20-24703
Journal ID: ISSN 0020-7403
Grant/Contract Number:  
89233218CNA000001
Resource Type:
Accepted Manuscript
Journal Name:
International Journal of Mechanical Sciences
Additional Journal Information:
Journal Name: International Journal of Mechanical Sciences; Journal ID: ISSN 0020-7403
Publisher:
Elsevier
Country of Publication:
United States
Language:
English

Citation Formats

Larkin, Kevin, Hunter, Abigail, and Abdelkefi, Abdessattar. Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams. United States: N. p., 2020. Web. doi:10.1016/j.ijmecsci.2020.106139.
Larkin, Kevin, Hunter, Abigail, & Abdelkefi, Abdessattar. Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams. United States. doi:10.1016/j.ijmecsci.2020.106139.
Larkin, Kevin, Hunter, Abigail, and Abdelkefi, Abdessattar. Thu . "Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams". United States. doi:10.1016/j.ijmecsci.2020.106139.
@article{osti_1673376,
title = {Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams},
author = {Larkin, Kevin and Hunter, Abigail and Abdelkefi, Abdessattar},
abstractNote = {Silicon is a commonly used material for the fabrication of beams for use in micro-electrical-mechanical systems (MEMS). Although silicon is a brittle material, it has been shown to accumulate fatigue damage at the micro-scale. Understanding the effect this has on the overall device performance is critical to the design of reliable devices. Analytical methods for modeling damage provide expedient results but are limited by broad modeling assumptions. Numerical models account for more detailed physical phenomena but can be computationally intensive. In this work, two different crack scenarios are modeled using both analytical techniques and 3D computational simulations. First, the effects of a single surface crack on the static deflection and natural frequency of an electrostatically actuated micro-beam are formulated and compared. Then, a new method for approximating damage associated with realistic distributed crack networks is formulated for use in an analytical model and numerical simulations. A method for utilizing experimentally derived crack statistics to inform the analytical and numerical distributed crack models is developed. Good agreement between the analytical and numerical models is obtained for both crack scenarios. Altogether, these models can be used to effectively simulate a variety of damage and fatigue behaviors in silicon-based MEMS devices.},
doi = {10.1016/j.ijmecsci.2020.106139},
journal = {International Journal of Mechanical Sciences},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {10}
}

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This content will become publicly available on October 8, 2021
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