Femtosecond photoemission electron microscopy of surface plasmon polariton beam steering via nanohole arrays

Crampton, Kevin T.; Joly, Alan G.; El-Khoury, Patrick Z.

doi:10.1063/5.0021032

Title: Femtosecond photoemission electron microscopy of surface plasmon polariton beam steering via nanohole arrays

Journal Article · 26 August 2020 · Journal of Chemical Physics

DOI: https://doi.org/10.1063/5.0021032 · OSTI ID:1673297

Crampton, Kevin T. ^[1];

^[1];

^[1]

Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

Directional control over surface plasmon polariton (SPP) waves is a prerequisite for the development of miniaturized optical circuitry. Here, the efficacy of single and dual component SPP steering elements is explored through photoemission electron microscopy. Our imaging scheme relies on two-color photoemission and counter-propagating SPP generation, which collectively allow SPPs to be visualized in real space. Wave-vector difference mixing between two-dimensional arrays of nanoholes and photon momenta enables SPP steering with directionality governed by the array lattice constant. The magnitude of grating momentum required to achieve counter-propagation guarantees efficient steering over the full range of the negative half-space. In our dual component configuration, separate SPP generation and Bragg diffraction based steering optics are employed. We find that array Bragg planes principally influence the SPP angles through the array band structure, which allows us to visualize both positive and negative refractory waves.

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Research Organization:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division; USDOE

Grant/Contract Number:: AC05-76RL01830

OSTI ID:: 1673297

Alternate ID(s):: OSTI ID: 1650681

Report Number(s):: PNNL-SA-155077; TRN: US2203936

Journal Information:: Journal of Chemical Physics, Vol. 153, Issue 8; ISSN 0021-9606

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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