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Title: Chromatic interferometry with small frequency differences

Journal Article · · Optics Express
DOI: https://doi.org/10.1364/oe.402560 · OSTI ID:1671856
 [1];  [2];  [3];  [1];  [2];  [4];  [4];  [4];  [2];  [1];  [5];  [2]
  1. Univ. of Science and Technology of China, Hefei (China); Univ. of Science and Technology of China, Shanghai (China); Shanghai Research Center for Quantum Sciences (China); Jinan Inst. of Quantum Technology (China)
  2. Univ. of Science and Technology of China, Hefei (China); Univ. of Science and Technology of China, Shanghai (China); Shanghai Research Center for Quantum Sciences (China)
  3. Harvard Univ., Cambridge, MA (United States); Stanford Univ., CA (United States)
  4. Jinan Inst. of Quantum Technology (China)
  5. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Shanghai Jiao Tong Univ.(China); Stockholm Univ. (Sweden); Arizona State Univ., Mesa, AZ (United States)

By developing a ‘two-crystal’ method for color erasure, we can broaden the scope of chromatic interferometry to include optical photons whose frequency difference falls outside of the 400 nm to 4500 nm wavelength range, which is the passband of a PPLN crystal. We demonstrate this possibility experimentally, by observing interference patterns between sources at 1064.4 nm and 1063.6 nm, corresponding to a frequency difference of about 200 GHz.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE Office of Science (SC); National Key Research and Development Program of China; National Natural Science Foundation of China (NSFC); Chinese Academy of Sciences; Shanghai Municipal Science and Technology Major Project; Anhui Initiative in Quantum Information Technologies; Harvard University; Hertz Foundation; Stanford Graduate Fellowship program; European Research Council (ERC); Swedish Research Council (SRC)
Grant/Contract Number:
SC0012567; 2018YFB0504300; 2019SHZdZX; 742104; 335-2014-7424
OSTI ID:
1671856
Alternate ID(s):
OSTI ID: 1851685
Journal Information:
Optics Express, Vol. 28, Issue 22; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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