Two-photon X-ray ghost microscope
Abstract
This article presents a non-classical imaging mechanism that produces a diffraction-limited and magnified ghost image of the internal structure of an object through the measurement of intensity fluctuation correlation formed by two-photon interference. In principle, the lensless X-ray ghost imaging mechanism may achieve a spatial resolution determined by the wavelength and the angular diameter of the X-ray source, ∼ λ /Δ θ s , with possible reduction caused by additional optics. In addition, it has the ability to image select “slices” deep within an object, which can be used for constructing 3D view of its internal structure.
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1671853
- Resource Type:
- Published Article
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Name: Optics Express Journal Volume: 28 Journal Issue: 22; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Smith, Thomas A., Wang, Zhehui, and Shih, Yanhua. Two-photon X-ray ghost microscope. United States: N. p., 2020.
Web. doi:10.1364/OE.401449.
Smith, Thomas A., Wang, Zhehui, & Shih, Yanhua. Two-photon X-ray ghost microscope. United States. https://doi.org/10.1364/OE.401449
Smith, Thomas A., Wang, Zhehui, and Shih, Yanhua. Mon .
"Two-photon X-ray ghost microscope". United States. https://doi.org/10.1364/OE.401449.
@article{osti_1671853,
title = {Two-photon X-ray ghost microscope},
author = {Smith, Thomas A. and Wang, Zhehui and Shih, Yanhua},
abstractNote = {This article presents a non-classical imaging mechanism that produces a diffraction-limited and magnified ghost image of the internal structure of an object through the measurement of intensity fluctuation correlation formed by two-photon interference. In principle, the lensless X-ray ghost imaging mechanism may achieve a spatial resolution determined by the wavelength and the angular diameter of the X-ray source, ∼ λ /Δ θ s , with possible reduction caused by additional optics. In addition, it has the ability to image select “slices” deep within an object, which can be used for constructing 3D view of its internal structure.},
doi = {10.1364/OE.401449},
journal = {Optics Express},
number = 22,
volume = 28,
place = {United States},
year = {2020},
month = {10}
}
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