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Title: General Failure Modes and Effects Analysis for Accelerator and Detector Magnet Design at JLab

Abstract

The aim of this article is to develop a risk management procedure, which could be applied to the magnet design process, for both superconducting and normal magnets at the Jefferson Laboratory (JLab). This procedure allowed us to identify the key risks at each of the critical phases of design and propose procedures, tests, and checks to mitigate each risk. In this article, we present a qualitative and quantitative risk management procedure commonly referred to a “failure modes and effects analysis.” As part of this procedure, we calculated a risk priority number (RPN) for each activity of the process, identified the most critical activities and proposed mitigation activities, which in turn resulted in a revised RPN. Additionally, another benefit of this procedure was the identification of appropriate “control and hold” points within the design process, which allowed one to review and approve a particular outcome before proceeding to the next sequential activity.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [1];  [3];  [1];  [2]; ORCiD logo [1];  [2];  [3];  [4];  [4]; ORCiD logo [1]
  1. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
  2. Massachusetts Inst. of Technology (MIT), Middleton, MA (United States). Bates Research and Engineering Center
  3. Univ. of Massachusetts, Amherst, MA (United States)
  4. Univ. of Manitoba, Winnepeg, MB (Canada)
Publication Date:
Research Org.:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP)
OSTI Identifier:
1671745
Report Number(s):
JLAB-PHY-20-3189; DOE/OR-23177-4969
Journal ID: ISSN 1051-8223; TRN: US2203908
Grant/Contract Number:  
AC05-06OR23177
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Applied Superconductivity
Additional Journal Information:
Journal Volume: 30; Journal Issue: 8; Journal ID: ISSN 1051-8223
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; Superconducting magnets; process control; manufacturing; electric potential; risk management; physics; hazards; risk mitigation

Citation Formats

Ghoshal, Probir K., Bessuille, Jason, Fair, Ruben J., Ghosh, Chandan, Gopinath, Sandesh, Ihloff, Ernie, Kashy, David H., Kelsey, James E., Kumar, Krishna, Mammie, Juliette, Rahman, Sakib, and Rajput-Ghoshal, Renuka. General Failure Modes and Effects Analysis for Accelerator and Detector Magnet Design at JLab. United States: N. p., 2020. Web. doi:10.1109/tasc.2020.3022993.
Ghoshal, Probir K., Bessuille, Jason, Fair, Ruben J., Ghosh, Chandan, Gopinath, Sandesh, Ihloff, Ernie, Kashy, David H., Kelsey, James E., Kumar, Krishna, Mammie, Juliette, Rahman, Sakib, & Rajput-Ghoshal, Renuka. General Failure Modes and Effects Analysis for Accelerator and Detector Magnet Design at JLab. United States. https://doi.org/10.1109/tasc.2020.3022993
Ghoshal, Probir K., Bessuille, Jason, Fair, Ruben J., Ghosh, Chandan, Gopinath, Sandesh, Ihloff, Ernie, Kashy, David H., Kelsey, James E., Kumar, Krishna, Mammie, Juliette, Rahman, Sakib, and Rajput-Ghoshal, Renuka. Wed . "General Failure Modes and Effects Analysis for Accelerator and Detector Magnet Design at JLab". United States. https://doi.org/10.1109/tasc.2020.3022993. https://www.osti.gov/servlets/purl/1671745.
@article{osti_1671745,
title = {General Failure Modes and Effects Analysis for Accelerator and Detector Magnet Design at JLab},
author = {Ghoshal, Probir K. and Bessuille, Jason and Fair, Ruben J. and Ghosh, Chandan and Gopinath, Sandesh and Ihloff, Ernie and Kashy, David H. and Kelsey, James E. and Kumar, Krishna and Mammie, Juliette and Rahman, Sakib and Rajput-Ghoshal, Renuka},
abstractNote = {The aim of this article is to develop a risk management procedure, which could be applied to the magnet design process, for both superconducting and normal magnets at the Jefferson Laboratory (JLab). This procedure allowed us to identify the key risks at each of the critical phases of design and propose procedures, tests, and checks to mitigate each risk. In this article, we present a qualitative and quantitative risk management procedure commonly referred to a “failure modes and effects analysis.” As part of this procedure, we calculated a risk priority number (RPN) for each activity of the process, identified the most critical activities and proposed mitigation activities, which in turn resulted in a revised RPN. Additionally, another benefit of this procedure was the identification of appropriate “control and hold” points within the design process, which allowed one to review and approve a particular outcome before proceeding to the next sequential activity.},
doi = {10.1109/tasc.2020.3022993},
journal = {IEEE Transactions on Applied Superconductivity},
number = 8,
volume = 30,
place = {United States},
year = {2020},
month = {9}
}

Works referenced in this record:

Failure Assessments for MQXF Magnet Support Structure With a Graded Approach
journal, August 2019

  • Pan, Heng; Anderssen, Eric C.; Cheng, Daniel W.
  • IEEE Transactions on Applied Superconductivity, Vol. 29, Issue 5
  • DOI: 10.1109/TASC.2019.2908113

A novel approach to increasing the reliability of accelerator magnets
journal, March 2000

  • Bellomo, P.; Rago, C. E.; Spencer, C. M.
  • IEEE Transactions on Appiled Superconductivity, Vol. 10, Issue 1
  • DOI: 10.1109/77.828230

Fault Tree Analysis, Methods, and Applications ߝ A Review
journal, August 1985

  • Lee, W. S.; Grosh, D. L.; Tillman, F. A.
  • IEEE Transactions on Reliability, Vol. R-34, Issue 3
  • DOI: 10.1109/TR.1985.5222114

Interactions Observed Between Torus and Solenoid Superconducting Magnets at JLab
journal, June 2020

  • Kashy, David; Fair, Ruben; Ghoshal, Probir
  • IEEE Transactions on Applied Superconductivity, Vol. 30, Issue 4
  • DOI: 10.1109/TASC.2020.2989474

Development of FPGA-based multi-sensor excitation low voltage (MSELV) chassis at Jefferson Lab
journal, December 2019

  • Ghoshal, P. K.; Bachimanchi, R.; Bonneau, P.
  • Review of Scientific Instruments, Vol. 90, Issue 12
  • DOI: 10.1063/1.5127460

Transformer Failure Due to Circuit-Breaker-Induced Switching Transients
journal, March 2011

  • Shipp, David D.; Dionise, Thomas J.; Lorch, Visuth
  • IEEE Transactions on Industry Applications, Vol. 47, Issue 2
  • DOI: 10.1109/TIA.2010.2101996