ToF-SIMS depth profiling of altered glass
Abstract
Glass and mineral corrosion usually leads to the formation of morphologically and compositionally complex surface layers that can be characterized by various analytical techniques to infer rate control mechanisms. In this study, we investigate the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to better understand chemical processes of glass corrosion. In particular, we focus on the potential impact of the ToF-SIMS ion beam on the distribution of several elements of interest in alteration layers formed on International Simple Glass, a six-oxide reference glass altered in a solution enriched in alkalis and spiked with H218O. A thin flake of glass partially altered on both sides is analyzed entirely from one side to the other to determine whether atoms weakly bonded to the solid are displaced by the beams. We highlight the beam effect on cations weakly bonded to the silicate network (Li, Na, K, and B, Ca, Cs to a lesser extent) affecting the profile shape of these elements. No impact is observed on 18O and H, but it is demonstrated that quantification of isotopic ratios is possible only for a limited range of isotopic enrichment.
- Authors:
-
- Alternative Energies and Atomic Energy Commission (CEA), Bagnols-sur-Ceze (France)
- Tescan Analytics, Fuveau (France)
- Univ. of Paris-Saclay, Gif-sur-Yvette (France)
- PRIME Verre, Montpellier (France)
- Publication Date:
- Research Org.:
- Energy Frontier Research Centers (EFRC) (United States). Center for Performance and Design of Nuclear Waste Forms and Containers (WastePD); Alternative Energies and Atomic Energy Commission (CEA), Bagnols-sur-Ceze (France)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1667377
- Grant/Contract Number:
- SC0016584
- Resource Type:
- Accepted Manuscript
- Journal Name:
- npj Materials Degradation
- Additional Journal Information:
- Journal Volume: 3; Journal Issue: 1; Journal ID: ISSN 2397-2106
- Publisher:
- Springer
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; chemical physics; solid-state chemistry
Citation Formats
Collin, Marie, Gin, Stéphane, Jollivet, Patrick, Dupuy, Laurent, Dauvois, Vincent, and Duffours, Laurent. ToF-SIMS depth profiling of altered glass. United States: N. p., 2019.
Web. doi:10.1038/s41529-019-0076-3.
Collin, Marie, Gin, Stéphane, Jollivet, Patrick, Dupuy, Laurent, Dauvois, Vincent, & Duffours, Laurent. ToF-SIMS depth profiling of altered glass. United States. https://doi.org/10.1038/s41529-019-0076-3
Collin, Marie, Gin, Stéphane, Jollivet, Patrick, Dupuy, Laurent, Dauvois, Vincent, and Duffours, Laurent. Tue .
"ToF-SIMS depth profiling of altered glass". United States. https://doi.org/10.1038/s41529-019-0076-3. https://www.osti.gov/servlets/purl/1667377.
@article{osti_1667377,
title = {ToF-SIMS depth profiling of altered glass},
author = {Collin, Marie and Gin, Stéphane and Jollivet, Patrick and Dupuy, Laurent and Dauvois, Vincent and Duffours, Laurent},
abstractNote = {Glass and mineral corrosion usually leads to the formation of morphologically and compositionally complex surface layers that can be characterized by various analytical techniques to infer rate control mechanisms. In this study, we investigate the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to better understand chemical processes of glass corrosion. In particular, we focus on the potential impact of the ToF-SIMS ion beam on the distribution of several elements of interest in alteration layers formed on International Simple Glass, a six-oxide reference glass altered in a solution enriched in alkalis and spiked with H218O. A thin flake of glass partially altered on both sides is analyzed entirely from one side to the other to determine whether atoms weakly bonded to the solid are displaced by the beams. We highlight the beam effect on cations weakly bonded to the silicate network (Li, Na, K, and B, Ca, Cs to a lesser extent) affecting the profile shape of these elements. No impact is observed on 18O and H, but it is demonstrated that quantification of isotopic ratios is possible only for a limited range of isotopic enrichment.},
doi = {10.1038/s41529-019-0076-3},
journal = {npj Materials Degradation},
number = 1,
volume = 3,
place = {United States},
year = {Tue Apr 02 00:00:00 EDT 2019},
month = {Tue Apr 02 00:00:00 EDT 2019}
}
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