Mapping valence electron distributions with multipole density formalism using 4D-STEM
Abstract
Recent advancement in aberration correction and detector technology opened a door to various applications using 4D-STEM, which yields a diffraction pattern for each scanning position within a crystal unit-cell in scanning transmission electron microscopy (STEM) and generates incredible amounts of data in momentum space. Currently 4D-STEM analysis relies on the center-of-mass of the diffraction patterns in electric field and charge density mapping. It only derives the total projected charge density and is limited to phase objects, e.g. extremely thin samples. Here, we propose a new analytical method to accurately map aspherical valence electron distributions with atom-centered multipolar functions formalism using the whole 4D-STEM dataset. We demonstrate that, with the full dynamical calculations for various sample thicknesses, the method is sensitive not only to the miniscule charge transfer, but also to the atomic site symmetry and aspherical electron orbitals. The process of the refinement is much more robust and reliable than quantitative convergent beam electron diffraction.
- Authors:
-
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1760644
- Alternate Identifier(s):
- OSTI ID: 1658413
- Report Number(s):
- BNL-220819-2021-JAAM
Journal ID: ISSN 0304-3991; TRN: US2205776
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Volume: 219; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 4D-STEM; Quantitative electron diffraction; Aberration correction; Valence electrons mapping
Citation Formats
Wu, Lijun, Meng, Qingping, and Zhu, Yimei. Mapping valence electron distributions with multipole density formalism using 4D-STEM. United States: N. p., 2020.
Web. doi:10.1016/j.ultramic.2020.113095.
Wu, Lijun, Meng, Qingping, & Zhu, Yimei. Mapping valence electron distributions with multipole density formalism using 4D-STEM. United States. https://doi.org/10.1016/j.ultramic.2020.113095
Wu, Lijun, Meng, Qingping, and Zhu, Yimei. Tue .
"Mapping valence electron distributions with multipole density formalism using 4D-STEM". United States. https://doi.org/10.1016/j.ultramic.2020.113095. https://www.osti.gov/servlets/purl/1760644.
@article{osti_1760644,
title = {Mapping valence electron distributions with multipole density formalism using 4D-STEM},
author = {Wu, Lijun and Meng, Qingping and Zhu, Yimei},
abstractNote = {Recent advancement in aberration correction and detector technology opened a door to various applications using 4D-STEM, which yields a diffraction pattern for each scanning position within a crystal unit-cell in scanning transmission electron microscopy (STEM) and generates incredible amounts of data in momentum space. Currently 4D-STEM analysis relies on the center-of-mass of the diffraction patterns in electric field and charge density mapping. It only derives the total projected charge density and is limited to phase objects, e.g. extremely thin samples. Here, we propose a new analytical method to accurately map aspherical valence electron distributions with atom-centered multipolar functions formalism using the whole 4D-STEM dataset. We demonstrate that, with the full dynamical calculations for various sample thicknesses, the method is sensitive not only to the miniscule charge transfer, but also to the atomic site symmetry and aspherical electron orbitals. The process of the refinement is much more robust and reliable than quantitative convergent beam electron diffraction.},
doi = {10.1016/j.ultramic.2020.113095},
journal = {Ultramicroscopy},
number = ,
volume = 219,
place = {United States},
year = {Tue Dec 01 00:00:00 EST 2020},
month = {Tue Dec 01 00:00:00 EST 2020}
}
Works referenced in this record:
The interplay between experiment and theory in charge-density analysis
journal, August 2004
- Coppens, Philip; Volkov, Anatoliy
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 60, Issue 5
Atomic-scale quantification of charge densities in two-dimensional materials
journal, September 2018
- Müller-Caspary, Knut; Duchamp, Martial; Rösner, Malte
- Physical Review B, Vol. 98, Issue 12
Confirmation of the Domino-Cascade Model by LiFePO 4 /FePO 4 Precession Electron Diffraction
journal, October 2011
- Brunetti, G.; Robert, D.; Bayle-Guillemaud, P.
- Chemistry of Materials, Vol. 23, Issue 20
GRASP92: A package for large-scale relativistic atomic structure calculations
journal, April 1996
- Parpia, F. A.; Fischer, C. Froese; Grant, I. P.
- Computer Physics Communications, Vol. 94, Issue 2-3
Charge-density analysis of YBa 2 Cu 3 O 6.98 . Comparison of theoretical and experimental results
journal, August 2003
- Lippmann, Thomas; Blaha, Peter; Andersen, Niels H.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 59, Issue 5
Lattice-resolution contrast from a focused coherent electron probe. Part II
journal, July 2003
- Findlay, S. D.; Allen, L. J.; Oxley, M. P.
- Ultramicroscopy, Vol. 96, Issue 1
Lattice-resolution contrast from a focused coherent electron probe. Part I
journal, July 2003
- Allen, L. J.; Findlay, S. D.; Oxley, M. P.
- Ultramicroscopy, Vol. 96, Issue 1
Direct observation of d-orbital holes and Cu–Cu bonding in Cu2O
journal, September 1999
- Zuo, J. M.; Kim, M.; O'Keeffe, M.
- Nature, Vol. 401, Issue 6748
Real-space charge-density imaging with sub-ångström resolution by four-dimensional electron microscopy
journal, October 2019
- Gao, Wenpei; Addiego, Christopher; Wang, Hui
- Nature, Vol. 575, Issue 7783
Normalization factors for Kubic harmonic density functions
journal, May 1994
- Su, Z.; Coppens, P.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 50, Issue 3
Symmetrized multipole analysis of orientational distributions
journal, March 1981
- Kara, M.; Kurki-Suonio, K.
- Acta Crystallographica Section A, Vol. 37, Issue 2
Towards quantitative measurements of charge transfer in complex crystals using imaging and diffraction of fast electrons
journal, October 1999
- Wu, L.; Zhu, Y.; Tafto, J.
- Micron, Vol. 30, Issue 5
Inhomogeneous Electron Gas
journal, November 1964
- Hohenberg, P.; Kohn, W.
- Physical Review, Vol. 136, Issue 3B, p. B864-B871
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence
journal, July 2018
- Grieb, Tim; Krause, Florian F.; Schowalter, Marco
- Ultramicroscopy, Vol. 190
Testing aspherical atom refinements on small-molecule data sets
journal, November 1978
- Hansen, N. K.; Coppens, P.
- Acta Crystallographica Section A, Vol. 34, Issue 6
Accurate Experimental Electronic Properties of DL-Proline Monohydrate Obtained Within 1 Day
journal, January 1998
- Koritsanszky, T.
- Science, Vol. 279, Issue 5349
Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018
- Jiang, Yi; Chen, Zhen; Han, Yimo
- Nature, Vol. 559, Issue 7714
Differential phase-contrast microscopy at atomic resolution
journal, June 2012
- Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
- Nature Physics, Vol. 8, Issue 8
The investigation of magnetic domain structures in thin foils by electron microscopy
journal, April 1984
- Chapman, J. N.
- Journal of Physics D: Applied Physics, Vol. 17, Issue 4
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
journal, May 2019
- Ophus, Colin
- Microscopy and Microanalysis, Vol. 25, Issue 3
Origin of Phonon Glass-Electron Crystal Behavior in Thermoelectric Layered Cobaltate
journal, June 2013
- Wu, Lijun; Meng, Qingping; Jooss, Christian
- Advanced Functional Materials, Vol. 23, Issue 46
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons
journal, December 2015
- Close, R.; Chen, Z.; Shibata, N.
- Ultramicroscopy, Vol. 159
Test of first-principle calculations of charge transfer and electron-hole distribution in oxide superconductors by precise measurements of structure factors
journal, March 1999
- Wu, Lijun; Zhu, Yimei; Tafto, J.
- Physical Review B, Vol. 59, Issue 9
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
journal, December 2014
- Müller, Knut; Krause, Florian F.; Béché, Armand
- Nature Communications, Vol. 5, Issue 1
On the sensitivity of electron and X-ray scattering factors to valence charge distributions
journal, July 2005
- Zheng, Jin-Cheng; Zhu, Yimei; Wu, Lijun
- Journal of Applied Crystallography, Vol. 38, Issue 4
On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material
journal, July 2015
- MacLaren, Ian; Wang, LiQiu; McGrouther, Damien
- Ultramicroscopy, Vol. 154
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
journal, July 2017
- Müller-Caspary, Knut; Krause, Florian F.; Grieb, Tim
- Ultramicroscopy, Vol. 178
Standardless Atom Counting in Scanning Transmission Electron Microscopy
journal, November 2010
- LeBeau, James M.; Findlay, Scott D.; Allen, Leslie J.
- Nano Letters, Vol. 10, Issue 11