Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials

Ziatdinov, Maxim; Kim, Dohyung; Neumayer, Sabine M.; Collins, Liam; Ahmadi, Mahshid; Vasudevan, Rama K.; Jesse, Stephen; Ann, Myung Hyun; Kim, Jong H.; Kalinin, Sergei V.

doi:10.1063/5.0013847

Title: Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials

Journal Article · 02 August 2020 · Journal of Applied Physics

DOI: https://doi.org/10.1063/5.0013847 · OSTI ID:1649367

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^[1]; Ahmadi, Mahshid ^[2];

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^[1]; Ann, Myung Hyun ^[3]; Kim, Jong H. ^[3];

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Univ. of Tennessee, Knoxville, TN (United States)
Ajou Univ., Suwon (Korea)

In this work, imaging mechanisms in contact Kelvin probe force microscopy (cKPFM) are explored via information theory-based methods. Gaussian processes are used to achieve super-resolution in the cKPFM signal, effectively extrapolating across the spatial and parameter space. Tensor factorization is applied to reduce the multidimensional signal to the tensor convolution of the scalar functions that show a clear trending behavior with the imaging parameters. These methods establish a workflow for the analysis of the multidimensional datasets that can then be related to the relevant physical mechanisms. We also provide an interactive Google Colab notebook that goes through all the analyses discussed in the paper.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1649367

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 5 Vol. 128; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials

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