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Title: Correlating dynamic microstructure to observed color in electrophoretic displays via in situ small-angle x-ray scattering

Abstract

Electrophoretic deposition (EPD) is an industrially relevant and scalable technique used to form particle deposits from colloidal suspensions. Highly concentrated particle suspensions generally prevent real-time in situ microscopy observations which limit the characterization of EPD films to ex situ, or postprocessed, laboratory techniques. For dynamic systems, such as tunable amorphous photonic crystals (APCs), only reversible deposits are formed during the EPD process. Since reversible deposits cannot be characterized with standard ex situ methods, the particle-particle and particle-field interactions that govern the displayed color and crystallinity of these systems are not well understood. In this paper, we present in situ small-angle x-ray scattering and UV-Vis techniques for measuring both the structural and optical response of an APC under applied electric fields. Furthermore, we also develop a computational model based on colloidal interactions to explain the observed change in the interparticle spacing of APCs due to the applied electric field which correlates to displayed color. Ultimately, this work provides a new in situ characterization method that could be expanded for other dynamic, tunable colloidal systems.

Authors:
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [2];  [2];  [2];  [2];  [2];  [2];  [2]; ORCiD logo [2]; ORCiD logo [2];  [3]; ORCiD logo [2]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of California, Davis, CA (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Univ. of California, Davis, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC)
OSTI Identifier:
1643782
Report Number(s):
LLNL-JRNL-750717
Journal ID: ISSN 2475-9953; PRMHAR; 936055; TRN: US2201970
Grant/Contract Number:  
AC52-07NA27344; AC02-06CH1135
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Materials
Additional Journal Information:
Journal Volume: 4; Journal Issue: 7; Journal ID: ISSN 2475-9953
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; 42 ENGINEERING; Colloids; small-angle x-ray scattering; fluid dynamics

Citation Formats

Bukosky, Scott C., Hammons, Joshua A., Giera, Brian, Lee, Elaine, Han, Jinkyu, Freyman, Megan C., Ivanovskaya, Anna, Krauter, Kerry G., Kuntz, Joshua D., Worsley, Marcus A., Han, T. Yong-Jin, Ristenpart, William D., and Pascall, Andrew J. Correlating dynamic microstructure to observed color in electrophoretic displays via in situ small-angle x-ray scattering. United States: N. p., 2020. Web. doi:10.1103/PhysRevMaterials.4.075802.
Bukosky, Scott C., Hammons, Joshua A., Giera, Brian, Lee, Elaine, Han, Jinkyu, Freyman, Megan C., Ivanovskaya, Anna, Krauter, Kerry G., Kuntz, Joshua D., Worsley, Marcus A., Han, T. Yong-Jin, Ristenpart, William D., & Pascall, Andrew J. Correlating dynamic microstructure to observed color in electrophoretic displays via in situ small-angle x-ray scattering. United States. https://doi.org/10.1103/PhysRevMaterials.4.075802
Bukosky, Scott C., Hammons, Joshua A., Giera, Brian, Lee, Elaine, Han, Jinkyu, Freyman, Megan C., Ivanovskaya, Anna, Krauter, Kerry G., Kuntz, Joshua D., Worsley, Marcus A., Han, T. Yong-Jin, Ristenpart, William D., and Pascall, Andrew J. Mon . "Correlating dynamic microstructure to observed color in electrophoretic displays via in situ small-angle x-ray scattering". United States. https://doi.org/10.1103/PhysRevMaterials.4.075802. https://www.osti.gov/servlets/purl/1643782.
@article{osti_1643782,
title = {Correlating dynamic microstructure to observed color in electrophoretic displays via in situ small-angle x-ray scattering},
author = {Bukosky, Scott C. and Hammons, Joshua A. and Giera, Brian and Lee, Elaine and Han, Jinkyu and Freyman, Megan C. and Ivanovskaya, Anna and Krauter, Kerry G. and Kuntz, Joshua D. and Worsley, Marcus A. and Han, T. Yong-Jin and Ristenpart, William D. and Pascall, Andrew J.},
abstractNote = {Electrophoretic deposition (EPD) is an industrially relevant and scalable technique used to form particle deposits from colloidal suspensions. Highly concentrated particle suspensions generally prevent real-time in situ microscopy observations which limit the characterization of EPD films to ex situ, or postprocessed, laboratory techniques. For dynamic systems, such as tunable amorphous photonic crystals (APCs), only reversible deposits are formed during the EPD process. Since reversible deposits cannot be characterized with standard ex situ methods, the particle-particle and particle-field interactions that govern the displayed color and crystallinity of these systems are not well understood. In this paper, we present in situ small-angle x-ray scattering and UV-Vis techniques for measuring both the structural and optical response of an APC under applied electric fields. Furthermore, we also develop a computational model based on colloidal interactions to explain the observed change in the interparticle spacing of APCs due to the applied electric field which correlates to displayed color. Ultimately, this work provides a new in situ characterization method that could be expanded for other dynamic, tunable colloidal systems.},
doi = {10.1103/PhysRevMaterials.4.075802},
journal = {Physical Review Materials},
number = 7,
volume = 4,
place = {United States},
year = {Mon Jul 27 00:00:00 EDT 2020},
month = {Mon Jul 27 00:00:00 EDT 2020}
}

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