Electron tomography imaging methods with diffraction contrast for materials research
Abstract
Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations)more »
- Authors:
-
- Kyushu Univ., Fukuoka (Japan). Ultramicroscopy Research Center; Kyushu Univ., Fukuoka (Japan). Dept. of Advanced Materials Science
- System in Fronteir, Inc., Tokyo (Japan)
- Research Lab., Mel-Build Corp., Fukuoka (Japan)
- Steel Research Lab., Nippon Steel Corp., Chiba (Japan)
- Hokkaido Univ. (Japan)
- Toray Research Center, Inc., Shiga (Japan). Morphological Research Lab.
- Kyushu Univ., Fukuoka (Japan). Ultramicroscopy Research Center; Kyushi Univ., Fukuoka (Japan). Dept. of Applied Quantum Physics and Nuclear Engineering
- Kyushu Univ., Fukuoka (Japan). Dept. of Advanced Materials Science
- Research Lab., Mel-Build Corp., Fukuoka (Japan); Analytical Instruments, Materials and Structural Analysis, Thermo Fisher Scientific, Tokyo (Japan)
- Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States); Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Kyushu Univ., Fukuoka (Japan). Inst. for Materials Chemistry and Engineering
- Publication Date:
- Research Org.:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE; Japan Society for the Promotion of Science (JSPS) Ministry of Education, Culture, Sports, Science, and Technology (MEXT); Japan Science and Technology Agency (JST)
- OSTI Identifier:
- 1638487
- Grant/Contract Number:
- JPMJCR18J4; JP18H05479; JP18K18954; JP25286027; JP22360267; JP22310068; JP22102002; JP18681019; JP15360336; AC05-76RL01830
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Microscopy
- Additional Journal Information:
- Journal Volume: 69; Journal Issue: 3; Journal ID: ISSN 2050-5698
- Publisher:
- Oxford University Press
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Electron tomography; three-dimensional (3D); diffraction contrast; domain structure; dislocation; specimen holder
Citation Formats
Hata, Satoshi, Furukawa, Hiromitsu, Gondo, Takashi, Hirakami, Daisuke, Horii, Noritaka, Ikeda, Ken-Ichi, Kawamoto, Katsumi, Kimura, Kosuke, Matsumura, Syo, Mitsuhara, Masatoshi, Miyazaki, Hiroya, Miyazaki, Shinsuke, Murayama, Mitsu Mitsuhiro, Nakashima, Hideharu, Saito, Hikaru, Sakamoto, Masashi, and Yamasaki, Shigeto. Electron tomography imaging methods with diffraction contrast for materials research. United States: N. p., 2020.
Web. doi:10.1093/jmicro/dfaa002.
Hata, Satoshi, Furukawa, Hiromitsu, Gondo, Takashi, Hirakami, Daisuke, Horii, Noritaka, Ikeda, Ken-Ichi, Kawamoto, Katsumi, Kimura, Kosuke, Matsumura, Syo, Mitsuhara, Masatoshi, Miyazaki, Hiroya, Miyazaki, Shinsuke, Murayama, Mitsu Mitsuhiro, Nakashima, Hideharu, Saito, Hikaru, Sakamoto, Masashi, & Yamasaki, Shigeto. Electron tomography imaging methods with diffraction contrast for materials research. United States. https://doi.org/10.1093/jmicro/dfaa002
Hata, Satoshi, Furukawa, Hiromitsu, Gondo, Takashi, Hirakami, Daisuke, Horii, Noritaka, Ikeda, Ken-Ichi, Kawamoto, Katsumi, Kimura, Kosuke, Matsumura, Syo, Mitsuhara, Masatoshi, Miyazaki, Hiroya, Miyazaki, Shinsuke, Murayama, Mitsu Mitsuhiro, Nakashima, Hideharu, Saito, Hikaru, Sakamoto, Masashi, and Yamasaki, Shigeto. Mon .
"Electron tomography imaging methods with diffraction contrast for materials research". United States. https://doi.org/10.1093/jmicro/dfaa002. https://www.osti.gov/servlets/purl/1638487.
@article{osti_1638487,
title = {Electron tomography imaging methods with diffraction contrast for materials research},
author = {Hata, Satoshi and Furukawa, Hiromitsu and Gondo, Takashi and Hirakami, Daisuke and Horii, Noritaka and Ikeda, Ken-Ichi and Kawamoto, Katsumi and Kimura, Kosuke and Matsumura, Syo and Mitsuhara, Masatoshi and Miyazaki, Hiroya and Miyazaki, Shinsuke and Murayama, Mitsu Mitsuhiro and Nakashima, Hideharu and Saito, Hikaru and Sakamoto, Masashi and Yamasaki, Shigeto},
abstractNote = {Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations) including a demonstration of in situ dislocation tomography.},
doi = {10.1093/jmicro/dfaa002},
journal = {Microscopy},
number = 3,
volume = 69,
place = {United States},
year = {2020},
month = {3}
}
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Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies
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3D reconstruction of the spatial distribution of dislocation loops using an automated stereo-imaging approach
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2pA_SS3-2In-situ straining and electron tomography: towards 3D imaging of dislocation dynamics
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Effect of Aging Treatment on Hydrogen Embrittlement of Drawn Pearlitic Steel Wire
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A new pnCCD-based color X-ray camera for fast spatial and energy-resolved measurements
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Dislocation tomography made easy: a reconstruction from ADF STEM images obtained using automated image shift correction
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Crack tip dislocations revealed by electron tomography in silicon single crystal
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Structural and Morphological Characterization of Cerium Oxide Nanocrystals Prepared by Hydrothermal Synthesis
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Three-Dimensional Orientation Mapping in the Transmission Electron Microscope
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