Electron tomography imaging methods with diffraction contrast for materials research

Hata, Satoshi; Furukawa, Hiromitsu; Gondo, Takashi; Hirakami, Daisuke; Horii, Noritaka; Ikeda, Ken-Ichi; Kawamoto, Katsumi; Kimura, Kosuke; Matsumura, Syo; Mitsuhara, Masatoshi; Miyazaki, Hiroya; Miyazaki, Shinsuke; Murayama, Mitsu Mitsuhiro; Nakashima, Hideharu; Saito, Hikaru; Sakamoto, Masashi; Yamasaki, Shigeto

doi:10.1093/jmicro/dfaa002

Title: Electron tomography imaging methods with diffraction contrast for materials research

Journal Article · 02 March 2020 · Microscopy

DOI: https://doi.org/10.1093/jmicro/dfaa002 · OSTI ID:1638487

Hata, Satoshi ^[1]; Furukawa, Hiromitsu ^[2]; Gondo, Takashi ^[3]; Hirakami, Daisuke ^[4]; Horii, Noritaka ^[2]; Ikeda, Ken-Ichi ^[5]; Kawamoto, Katsumi ^[2]; Kimura, Kosuke ^[6]; Matsumura, Syo ^[7]; Mitsuhara, Masatoshi ^[8]; Miyazaki, Hiroya ^[3]; Miyazaki, Shinsuke ^[9]; Murayama, Mitsu Mitsuhiro ^[10]; Nakashima, Hideharu ^[8]; Saito, Hikaru ^[8]; Sakamoto, Masashi ^[4]; Yamasaki, Shigeto ^[8]

Kyushu Univ., Fukuoka (Japan). Ultramicroscopy Research Center; Kyushu Univ., Fukuoka (Japan). Dept. of Advanced Materials Science
System in Fronteir, Inc., Tokyo (Japan)
Research Lab., Mel-Build Corp., Fukuoka (Japan)
Steel Research Lab., Nippon Steel Corp., Chiba (Japan)
Hokkaido Univ. (Japan)
Toray Research Center, Inc., Shiga (Japan). Morphological Research Lab.
Kyushu Univ., Fukuoka (Japan). Ultramicroscopy Research Center; Kyushi Univ., Fukuoka (Japan). Dept. of Applied Quantum Physics and Nuclear Engineering
Kyushu Univ., Fukuoka (Japan). Dept. of Advanced Materials Science
Research Lab., Mel-Build Corp., Fukuoka (Japan); Analytical Instruments, Materials and Structural Analysis, Thermo Fisher Scientific, Tokyo (Japan)
Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States); Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Kyushu Univ., Fukuoka (Japan). Inst. for Materials Chemistry and Engineering

Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations) including a demonstration of in situ dislocation tomography.

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Research Organization:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Organization:: Japan Science and Technology Agency (JST); Japan Society for the Promotion of Science (JSPS) Ministry of Education, Culture, Sports, Science, and Technology (MEXT); USDOE

Grant/Contract Number:: AC05-76RL01830

OSTI ID:: 1638487

Journal Information:: Microscopy, Journal Name: Microscopy Journal Issue: 3 Vol. 69; ISSN 2050-5698; ISSN 2050-5701

Publisher:: Oxford University PressCopyright Statement

Country of Publication:: United States

Language:: English

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