Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens

Chuirazzi, William C; Craft, Aaron E

doi:10.3390/jimaging6070056

Title: Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens

Journal Article · 29 June 2020 · Journal of Imaging

DOI: https://doi.org/10.3390/jimaging6070056 · OSTI ID:1635298

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Idaho National Lab. (INL), Idaho Falls, ID (United States)

Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example ⁶LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilities and service providers to determine the optimal screen parameters for their particular beam and imaging system.

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Research Organization:: Idaho National Laboratory (INL), Idaho Falls, ID (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

Grant/Contract Number:: AC07-05ID14517; 20A44-200FP

OSTI ID:: 1635298

Alternate ID(s):: OSTI ID: 1635528

Report Number(s):: INL/JOU-20-58131-Rev001; TRN: US2201579

Journal Information:: Journal of Imaging, Vol. 6, Issue 7; ISSN 2313-433X

Publisher:: MDPICopyright Statement

Country of Publication:: Switzerland

Language:: English

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Title: Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens

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