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Title: Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths

Abstract

Multiferroic BiFeO$$_3$$ (BFO) shows several phonon modes at infrared (IR) to THz energies, which are expected to carry information on any sample property coupled to crystal lattice vibrations. While macroscopic IR studies of BFO are often limited by single-crystal size, scattering-type scanning near-field optical microscopy (s-SNOM) allows for IR thin film spectroscopy of nanoscopic probing volumes with negligible direct substrate contribution to the optical signal. In fact, polaritons such as phonon polaritons of BFO introduce a resonant tip–sample coupling in s-SNOM, leading to both stronger signals and enhanced sensitivity to local material properties. Here in this paper, we explore the near-field response of BFO thin films at three consecutive resonances (centered around 5 THz, 13 THz, and 16 THz), by combining s-SNOM with a free-electron laser. We study the dependence of these near-field resonances on both the wavelength and tip–sample distance. Enabled by the broad spectral range of the measurement, we probe phonon modes connected to the predominant motion of either the bismuth or oxygen ions. Therefore, we propose s-SNOM at multiple near-field resonances as a versatile and very sensitive tool for the simultaneous investigation of various sample properties.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [2];  [3];  [4]; ORCiD logo [5];  [5]; ORCiD logo [6];  [1]
  1. Technische Univ. Dresden (Germany). Institute of Applied Physics
  2. Technische Univ. Dresden (Germany). Institute of Applied Physics; Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
  3. Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
  4. SanDisk, Western Digital Technologies Inc., Milpitas, CA (United States)
  5. Univ. of California, Berkeley, CA (United States)
  6. Technische Univ. Dresden (Germany). Institute of Applied Physics and Dresden-Wurzburg Cluster of Excellence-EXC 2147
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC); German Research Foundation (DFG); German Federal Ministry of Education and Research (BMBF)
OSTI Identifier:
1633262
Grant/Contract Number:  
AC02-05CH11231; KE2068/2-1; 05K16ODA; 05K16ODC; 05K19ODA; 05K19ODB
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 116; Journal Issue: 7; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Wehmeier, Lukas, Nörenberg, Tobias, de Oliveira, Thales V. A. G., Klopf, J. Michael, Yang, Seung-Yeul, Martin, Lane W., Ramesh, Ramamoorthy, Eng, Lukas M., and Kehr, Susanne C.. Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths. United States: N. p., 2020. Web. https://doi.org/10.1063/1.5133116.
Wehmeier, Lukas, Nörenberg, Tobias, de Oliveira, Thales V. A. G., Klopf, J. Michael, Yang, Seung-Yeul, Martin, Lane W., Ramesh, Ramamoorthy, Eng, Lukas M., & Kehr, Susanne C.. Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths. United States. https://doi.org/10.1063/1.5133116
Wehmeier, Lukas, Nörenberg, Tobias, de Oliveira, Thales V. A. G., Klopf, J. Michael, Yang, Seung-Yeul, Martin, Lane W., Ramesh, Ramamoorthy, Eng, Lukas M., and Kehr, Susanne C.. Tue . "Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths". United States. https://doi.org/10.1063/1.5133116. https://www.osti.gov/servlets/purl/1633262.
@article{osti_1633262,
title = {Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths},
author = {Wehmeier, Lukas and Nörenberg, Tobias and de Oliveira, Thales V. A. G. and Klopf, J. Michael and Yang, Seung-Yeul and Martin, Lane W. and Ramesh, Ramamoorthy and Eng, Lukas M. and Kehr, Susanne C.},
abstractNote = {Multiferroic BiFeO$_3$ (BFO) shows several phonon modes at infrared (IR) to THz energies, which are expected to carry information on any sample property coupled to crystal lattice vibrations. While macroscopic IR studies of BFO are often limited by single-crystal size, scattering-type scanning near-field optical microscopy (s-SNOM) allows for IR thin film spectroscopy of nanoscopic probing volumes with negligible direct substrate contribution to the optical signal. In fact, polaritons such as phonon polaritons of BFO introduce a resonant tip–sample coupling in s-SNOM, leading to both stronger signals and enhanced sensitivity to local material properties. Here in this paper, we explore the near-field response of BFO thin films at three consecutive resonances (centered around 5 THz, 13 THz, and 16 THz), by combining s-SNOM with a free-electron laser. We study the dependence of these near-field resonances on both the wavelength and tip–sample distance. Enabled by the broad spectral range of the measurement, we probe phonon modes connected to the predominant motion of either the bismuth or oxygen ions. Therefore, we propose s-SNOM at multiple near-field resonances as a versatile and very sensitive tool for the simultaneous investigation of various sample properties.},
doi = {10.1063/1.5133116},
journal = {Applied Physics Letters},
number = 7,
volume = 116,
place = {United States},
year = {2020},
month = {2}
}

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