Optimized x-ray sources for x-ray diffraction measurements at the Omega Laser Facility

Coppari, F.; Smith, R. F.; Thorn, D. B.; Rygg, J. R.; Liedahl, D. A.; Kraus, R. G.; Lazicki, A.; Millot, M.; Eggert, J. H.

doi:10.1063/1.5111878

Title: Optimized x-ray sources for x-ray diffraction measurements at the Omega Laser Facility

Journal Article · 01 December 2019 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/1.5111878 · OSTI ID:1632368

^[1]; Smith, R. F. ^[1]; Thorn, D. B. ^[1];

^[2]; Liedahl, D. A. ^[1]; Kraus, R. G. ^[1]; Lazicki, A. ^[1];

^[1]; Eggert, J. H. ^[1]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of Rochester, NY (United States). Lab. for Laser Energetics

The use of x-ray diffraction (XRD) measurements in laser-driven dynamic compression experiments at high-power laser facilities is becoming increasingly common. Diffraction allows one to probe in situ the transformations occurring at the atomic level at extreme conditions of pressure, temperature, and time scale. In these measurements, the x-ray source is generated by irradiation of a solid foil. Under certain laser drive conditions, quasimonochromatic He-α radiation is generated. Careful analysis of the x-ray source plasma spectra reveals that this radiation is not a single line emission and that monochromaticity is highly dependent on the laser irradiance. In this work, we analyze how the spectra emitted by laser-irradiated copper, germanium, and iron foils at the Omega Laser vary depending on different laser drive conditions and discuss the implications for XRD experiments.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1632368

Alternate ID(s):: OSTI ID: 1579584

Report Number(s):: LLNL-JRNL-757490; 944391; TRN: US2201373

Journal Information:: Review of Scientific Instruments, Vol. 90, Issue 12; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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