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Title: Imaging Andreev Reflection in Graphene

Abstract

Coherent charge transport along ballistic paths can be introduced into graphene by Andreev reflection, for which an electron reflects from a superconducting contact as a hole, while a Cooper pair is transmitted. We use here a liquid-helium cooled scanning gate microscope (SGM) to image Andreev reflection in graphene in the magnetic focusing regime, where carriers move along cyclotron orbits between contacts. Images of flow are obtained by deflecting carrier paths and displaying the resulting change in conductance. When electrons enter the the superconductor, Andreev-reflected holes leave for the collecting contact. To test the findings, we destroy Andreev reflection with a large current and by heating above the critical temperature. In both cases, the reflected carriers change from holes to electrons.

Authors:
 [1];  [2];  [3];  [3];  [4]; ORCiD logo [4]
+ Show Author Affiliations
  1. Harvard Univ., Cambridge, MA (United States); Slippery Rock Univ., PA (United States)
  2. Harvard Univ., Cambridge, MA (United States); Pohang Univ. of Science and Technology (POSTECH) (Korea, Republic of)
  3. National Inst. for Materials Science (NIMS), Tsukuba (Japan)
  4. Harvard Univ., Cambridge, MA (United States)
Publication Date:
Research Org.:
Harvard Univ., Cambridge, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1631752
Grant/Contract Number:  
FG02-07ER46422; SC0012260
Resource Type:
Accepted Manuscript
Journal Name:
Nano Letters
Additional Journal Information:
Journal Volume: 20; Journal Issue: 7; Journal ID: ISSN 1530-6984
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; graphene; Andreev reflection; ballistic transport; scanning gate microscope

Citation Formats

Bhandari, Sagar, Lee, Gil-Ho, Watanabe, Kenji, Taniguchi, Takashi, Kim, Philip, and Westervelt, Robert M. Imaging Andreev Reflection in Graphene. United States: N. p., 2020. Web. doi:10.1021/acs.nanolett.0c00903.
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Bhandari, Sagar, Lee, Gil-Ho, Watanabe, Kenji, Taniguchi, Takashi, Kim, Philip, & Westervelt, Robert M. Imaging Andreev Reflection in Graphene. United States. https://doi.org/10.1021/acs.nanolett.0c00903
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Bhandari, Sagar, Lee, Gil-Ho, Watanabe, Kenji, Taniguchi, Takashi, Kim, Philip, and Westervelt, Robert M. Tue . "Imaging Andreev Reflection in Graphene". United States. https://doi.org/10.1021/acs.nanolett.0c00903. https://www.osti.gov/servlets/purl/1631752.
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@article{osti_1631752,
title = {Imaging Andreev Reflection in Graphene},
author = {Bhandari, Sagar and Lee, Gil-Ho and Watanabe, Kenji and Taniguchi, Takashi and Kim, Philip and Westervelt, Robert M},
abstractNote = {Coherent charge transport along ballistic paths can be introduced into graphene by Andreev reflection, for which an electron reflects from a superconducting contact as a hole, while a Cooper pair is transmitted. We use here a liquid-helium cooled scanning gate microscope (SGM) to image Andreev reflection in graphene in the magnetic focusing regime, where carriers move along cyclotron orbits between contacts. Images of flow are obtained by deflecting carrier paths and displaying the resulting change in conductance. When electrons enter the the superconductor, Andreev-reflected holes leave for the collecting contact. To test the findings, we destroy Andreev reflection with a large current and by heating above the critical temperature. In both cases, the reflected carriers change from holes to electrons.},
doi = {10.1021/acs.nanolett.0c00903},
journal = {Nano Letters},
number = 7,
volume = 20,
place = {United States},
year = {Tue Jun 02 00:00:00 EDT 2020},
month = {Tue Jun 02 00:00:00 EDT 2020}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1021/acs.nanolett.0c00903
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