Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures
Abstract
During conventional nanoindentation measurements, the indentation depths are usually larger than 1–10 nm, which hinders the ability to study ultra-thin films (<10 nm) and supported atomically thin two-dimensional (2D) materials. Here, we discuss the development of modulated Å-indentation to achieve sub-Å indentations depths during force-indentation measurements while also imaging materials with nanoscale resolution. Modulated nanoindentation (MoNI) was originally invented to measure the radial elasticity of multi-walled nanotubes. Now, by using extremely small amplitude oscillations (<<1 Å) at high frequency, and stiff cantilevers, we show how modulated nano/Å-indentation (MoNI/ÅI) enables non-destructive measurements of the contact stiffness and indentation modulus of ultra-thin ultra-stiff films, including CVD diamond films (~1000 GPa stiffness), as well as the transverse modulus of 2D materials. Our analysis demonstrates that in presence of a standard laboratory noise floor, the signal to noise ratio of MoNI/ÅI implemented with a commercial atomic force microscope (AFM) is such that a dynamic range of 80 dB –– achievable with commercial Lock-in amplifiers –– is sufficient to observe superior indentation curves, having indentation depths as small as 0.3 Å, resolution in indentation <0.05 Å, and in normal load <0.5 nN. Being implemented on a standard AFM, this method has the potential for amore »
- Authors:
- Publication Date:
- Research Org.:
- New York Univ. (NYU), NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1619543
- Alternate Identifier(s):
- OSTI ID: 1613027
- Grant/Contract Number:
- SC0018924
- Resource Type:
- Published Article
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Name: Scientific Reports Journal Volume: 9 Journal Issue: 1; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United Kingdom
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Science & Technology - Other Topics
Citation Formats
Cellini, Filippo, Gao, Yang, and Riedo, Elisa. Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures. United Kingdom: N. p., 2019.
Web. doi:10.1038/s41598-019-40636-0.
Cellini, Filippo, Gao, Yang, & Riedo, Elisa. Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures. United Kingdom. https://doi.org/10.1038/s41598-019-40636-0
Cellini, Filippo, Gao, Yang, and Riedo, Elisa. Mon .
"Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures". United Kingdom. https://doi.org/10.1038/s41598-019-40636-0.
@article{osti_1619543,
title = {Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures},
author = {Cellini, Filippo and Gao, Yang and Riedo, Elisa},
abstractNote = {During conventional nanoindentation measurements, the indentation depths are usually larger than 1–10 nm, which hinders the ability to study ultra-thin films (<10 nm) and supported atomically thin two-dimensional (2D) materials. Here, we discuss the development of modulated Å-indentation to achieve sub-Å indentations depths during force-indentation measurements while also imaging materials with nanoscale resolution. Modulated nanoindentation (MoNI) was originally invented to measure the radial elasticity of multi-walled nanotubes. Now, by using extremely small amplitude oscillations (<<1 Å) at high frequency, and stiff cantilevers, we show how modulated nano/Å-indentation (MoNI/ÅI) enables non-destructive measurements of the contact stiffness and indentation modulus of ultra-thin ultra-stiff films, including CVD diamond films (~1000 GPa stiffness), as well as the transverse modulus of 2D materials. Our analysis demonstrates that in presence of a standard laboratory noise floor, the signal to noise ratio of MoNI/ÅI implemented with a commercial atomic force microscope (AFM) is such that a dynamic range of 80 dB –– achievable with commercial Lock-in amplifiers –– is sufficient to observe superior indentation curves, having indentation depths as small as 0.3 Å, resolution in indentation <0.05 Å, and in normal load <0.5 nN. Being implemented on a standard AFM, this method has the potential for a broad applicability.},
doi = {10.1038/s41598-019-40636-0},
journal = {Scientific Reports},
number = 1,
volume = 9,
place = {United Kingdom},
year = {Mon Mar 11 00:00:00 EDT 2019},
month = {Mon Mar 11 00:00:00 EDT 2019}
}
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