Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Headrick, Randall L.; Ulbrandt, Jeffrey G.; Myint, Peco; Wan, Jing; Li, Yang; Fluerasu, Andrei; Zhang, Yugang; Wiegart, Lutz; Ludwig, Karl F.

doi:10.1038/s41467-019-10629-8

Title: Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Journal Article · 14 June 2019 · Nature Communications

DOI: https://doi.org/10.1038/s41467-019-10629-8 · OSTI ID:1619523

^[1]; Ulbrandt, Jeffrey G. ^[1];

^[2]; Wan, Jing ^[1]; Li, Yang ^[1]; Fluerasu, Andrei ^[3]; Zhang, Yugang ^[3]; Wiegart, Lutz ^[3]; Ludwig, Karl F. ^[2]

Univ. of Vermont, Burlington, VT (United States)
Boston Univ., MA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

The properties of artificially grown thin films are strongly affected by surface processes during growth. We demonstrate that the use of coherent X-rays provides an approach to better understand such processes and fluctuations far from equilibrium. In these experiments, vacuum deposition of C60 on a graphene-coated surface is investigated with X-ray Photon Correlation Spectroscopy in surface-sensitive conditions. Step-flow is observed through measurement of the step-edge velocity in the late stages of growth after crystalline mounds have formed. We show that the step-edge velocity on the growth surface is coupled to the terrace length, and that there is a variation in the velocity from larger step spacing at the center of crystalline mounds to closely-spaced, more slowly propagating steps at their edges. The results extend theories of surface growth during steady-state dynamics, since the behavior is consistent with surface evolution driven by processes spanning multiple length and time scales, including surface diffusion, the motion of fluctuating step-edges, and attachment at step edges with significant step-edge barriers.

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Research Organization:: Univ. of Vermont, Burlington, VT (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; National Science Foundation (NSF)

Grant/Contract Number:: SC0017802; DMR-1709380; SC0012704

OSTI ID:: 1619523

Alternate ID(s):: OSTI ID: 1594847; OSTI ID: 1706604

Report Number(s):: BNL-220577-2020-JAAM; arXiv:1810.11585; TRN: US2100970

Journal Information:: Nature Communications, Vol. 10, Issue 1; Related Information: https://static-content.springer.com/esm/art%3A10.1038%2Fs41467-019-10629-8/MediaObjects/41467_2019_10629_MOESM1_ESM.pdf; ISSN 2041-1723

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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