Long-range exciton transport and slow annihilation in two-dimensional hybrid perovskites

Deng, Shibin; Shi, Enzheng; Yuan, Long; Jin, Linrui; Dou, Letian; Huang, Libai

doi:10.1038/s41467-020-14403-z

Title: Long-range exciton transport and slow annihilation in two-dimensional hybrid perovskites

Journal Article · 31 January 2020 · Nature Communications

DOI: https://doi.org/10.1038/s41467-020-14403-z · OSTI ID:1619478

;

; Jin, Linrui;

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Two-dimensional hybrid organic-inorganic perovskites with strongly bound excitons and tunable structures are desirable for optoelectronic applications. Exciton transport and annihilation are two key processes in determining device efficiencies; however, a thorough understanding of these processes is hindered by that annihilation rates are often convoluted with exciton diffusion constants. Here we employ transient absorption microscopy to disentangle quantum-well-thickness-dependent exciton diffusion and annihilation in twodimensional perovskites, unraveling the key role of electron-hole interactions and dielectric screening. The exciton diffusion constant is found to increase with quantum-well thickness, ranging from 0.06 ± 0.03 to 0.34 ± 0.03 cm² s^–1 , which leads to long-range exciton diffusion over hundreds of nanometers. The exciton annihilation rates are more than one order of magnitude lower than those found in the monolayers of transition metal dichalcogenides. The combination of long-range exciton transport and slow annihilation highlights the unique attributes of two-dimensional perovskites as an exciting class of optoelectronic materials.

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Research Organization:: Purdue Univ., West Lafayette, IN (United States)

Sponsoring Organization:: US Department of the Navy, Office of Naval Research (ONR); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0016356

OSTI ID:: 1619478

Journal Information:: Nature Communications, Journal Name: Nature Communications Journal Issue: 1 Vol. 11; ISSN 2041-1723

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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