Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Kravitz, S.; Smith, R. J.; Hagaman, L.; Bernard, E. P.; McKinsey, D. N.; Rudd, L.; Tvrznikova, L.; Gann, G. D. Orebi; Sakai, M.

doi:10.1140/epjc/s10052-020-7800-6

Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Abstract

Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

Authors:

; Smith, R. J.; Hagaman, L.; Bernard, E. P.; McKinsey, D. N.; Rudd, L.; Tvrznikova, L.; Gann, G. D. Orebi; Sakai, M.

Publication Date:: 2020-03-21

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1619344

Alternate Identifier(s):: OSTI ID: 1580947

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Published Article

Journal Name:: European Physical Journal. C, Particles and Fields

Additional Journal Information:: Journal Name: European Physical Journal. C, Particles and Fields Journal Volume: 80 Journal Issue: 3; Journal ID: ISSN 1434-6044

Publisher:: Springer Science + Business Media

Country of Publication:: Germany

Language:: English

Subject:: 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; PTFE; reflectance; VUV; scintillation; liquid xenon; noble liquid detector

Citation Formats


                    Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, and Sakai, M. Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX.  Germany: N. p., 2020. 
Web.  doi:10.1140/epjc/s10052-020-7800-6.

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                    Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, & Sakai, M. Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX.  Germany.  https://doi.org/10.1140/epjc/s10052-020-7800-6

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                    Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, and Sakai, M. Sat .  
"Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX".  Germany.  https://doi.org/10.1140/epjc/s10052-020-7800-6.

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@article{osti_1619344,

  title        = {Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX},

  author       = {Kravitz, S. and Smith, R. J. and Hagaman, L. and Bernard, E. P. and McKinsey, D. N. and Rudd, L. and Tvrznikova, L. and Gann, G. D. Orebi and Sakai, M.},

  abstractNote = {Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.},

  doi          = {10.1140/epjc/s10052-020-7800-6},

  journal      = {European Physical Journal. C, Particles and Fields},

  number       = 3,

  volume       = 80,

  place        = {Germany},

  year         = {2020},

  month        = {3}

}

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Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Abstract

Citation Formats

Generalization of Lambert's reflectance model conference, January 1994

What is the lowest refractive index of an organic polymer? journal, December 1991

Wave scattering from rough surfaces journal, December 1987

Electronic structure of poly(tetrafluoroethylene) studied by UPS, VUV absorption, and band calculations journal, January 1990

Scintillation response of liquid Xe surrounded by PTFE reflector for gamma rays journal, December 2004

PandaX: a liquid xenon dark matter experiment at CJPL journal, June 2014

Calibration, event reconstruction, data analysis, and limit calculation for the LUX dark matter experiment journal, May 2018

Measurements of the intrinsic quantum efficiency and absorption length of tetraphenyl butadiene thin films in the vacuum ultraviolet regime journal, April 2018

The Light Response of the XENON100 Time Projection Chamber and the Measurements of the Optical Parameters with the Xenon Scintillation Light text, January 2013

Localized Excitations in Condensed Ne, Ar, Kr, and Xe journal, June 1965

Performance of a chamber for studying the liquid xenon response to /spl gamma/-rays and nuclear recoils journal, December 2005

The EXO-200 detector, part I: detector design and construction journal, May 2012

Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light journal, June 2017

Measuring and modeling anisotropic reflection journal, July 1992

A reflectance model for computer graphics journal, August 1981

Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material journal, January 1993

On the fluorescence from integrating spheres journal, January 2008

Refractive Indices of the Condensed Inert Gases journal, May 1969

Reflectance of polytetrafluoroethylene for xenon scintillation light journal, March 2010

Geometrical shadowing of a random rough surface journal, September 1967

Optimizing liquid Xenon TPCs text, January 2017

Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon journal, January 2017

Index of refraction, Rayleigh scattering length, and Sellmeier coefficients in solid and liquid argon and xenon journal, September 2017

Measurement of the refractive index and attenuation length of liquid xenon for its scintillation light journal, January 2004

Reflection properties of pressed polytetrafluoroethylene powder journal, January 1981

The XENON1T dark matter experiment journal, December 2017

Average irregularity representation of a rough surface for ray reflection journal, January 1975

Microfacet Models for Refraction through Rough Surfaces null, January 2007

Search for the lepton flavour violating decay $$\mu ^+ \rightarrow \mathrm {e}^+ \gamma $$ μ + → e + γ with the full dataset of the MEG experiment: MEG Collaboration journal, August 2016

Dependence of the fluorescence intensity of polytetrafluoroethylene on the conditions of synthesis and molecular weight journal, November 1969

The Large Underground Xenon (LUX) experiment journal, March 2013

Diffuse-reflectance model for smooth dielectric surfaces journal, January 1994

Spectral irradiance measurements: effect of uv-produced fluorescence in integrating spheres journal, January 1976

A model of the reflection distribution in the vacuum ultra violet region journal, July 2010

Generalization of Lambert's reflectance model
conference, January 1994

What is the lowest refractive index of an organic polymer?
journal, December 1991

Wave scattering from rough surfaces
journal, December 1987

Electronic structure of poly(tetrafluoroethylene) studied by UPS, VUV absorption, and band calculations
journal, January 1990

Scintillation response of liquid Xe surrounded by PTFE reflector for gamma rays
journal, December 2004

PandaX: a liquid xenon dark matter experiment at CJPL
journal, June 2014

Calibration, event reconstruction, data analysis, and limit calculation for the LUX dark matter experiment
journal, May 2018

Measurements of the intrinsic quantum efficiency and absorption length of tetraphenyl butadiene thin films in the vacuum ultraviolet regime
journal, April 2018

The Light Response of the XENON100 Time Projection Chamber and the Measurements of the Optical Parameters with the Xenon Scintillation Light
text, January 2013

Localized Excitations in Condensed Ne, Ar, Kr, and Xe
journal, June 1965

Performance of a chamber for studying the liquid xenon response to /spl gamma/-rays and nuclear recoils
journal, December 2005

The EXO-200 detector, part I: detector design and construction
journal, May 2012

Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light
journal, June 2017

Measuring and modeling anisotropic reflection
journal, July 1992

A reflectance model for computer graphics
journal, August 1981

Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material
journal, January 1993

On the fluorescence from integrating spheres
journal, January 2008

Refractive Indices of the Condensed Inert Gases
journal, May 1969

Reflectance of polytetrafluoroethylene for xenon scintillation light
journal, March 2010

Geometrical shadowing of a random rough surface
journal, September 1967

Optimizing liquid Xenon TPCs
text, January 2017

Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon
journal, January 2017

Index of refraction, Rayleigh scattering length, and Sellmeier coefficients in solid and liquid argon and xenon
journal, September 2017

Measurement of the refractive index and attenuation length of liquid xenon for its scintillation light
journal, January 2004

Reflection properties of pressed polytetrafluoroethylene powder
journal, January 1981

The XENON1T dark matter experiment
journal, December 2017

Average irregularity representation of a rough surface for ray reflection
journal, January 1975

Microfacet Models for Refraction through Rough Surfaces
null, January 2007

Search for the lepton flavour violating decay $$\mu ^+ \rightarrow \mathrm {e}^+ \gamma $$ μ + → e + γ with the full dataset of the MEG experiment: MEG Collaboration
journal, August 2016

Dependence of the fluorescence intensity of polytetrafluoroethylene on the conditions of synthesis and molecular weight
journal, November 1969

The Large Underground Xenon (LUX) experiment
journal, March 2013

Diffuse-reflectance model for smooth dielectric surfaces
journal, January 1994

Spectral irradiance measurements: effect of uv-produced fluorescence in integrating spheres
journal, January 1976

A model of the reflection distribution in the vacuum ultra violet region
journal, July 2010