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Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Abstract

Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

Authors:
ORCiD logo; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1619344
Alternate Identifier(s):
OSTI ID: 1580947
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Published Article
Journal Name:
European Physical Journal. C, Particles and Fields
Additional Journal Information:
Journal Name: European Physical Journal. C, Particles and Fields Journal Volume: 80 Journal Issue: 3; Journal ID: ISSN 1434-6044
Publisher:
Springer Science + Business Media
Country of Publication:
Germany
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; PTFE; reflectance; VUV; scintillation; liquid xenon; noble liquid detector

Citation Formats

Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, and Sakai, M. Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX. Germany: N. p., 2020. Web. https://doi.org/10.1140/epjc/s10052-020-7800-6.
Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, & Sakai, M. Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX. Germany. https://doi.org/10.1140/epjc/s10052-020-7800-6
Kravitz, S., Smith, R. J., Hagaman, L., Bernard, E. P., McKinsey, D. N., Rudd, L., Tvrznikova, L., Gann, G. D. Orebi, and Sakai, M. Sat . "Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX". Germany. https://doi.org/10.1140/epjc/s10052-020-7800-6.
@article{osti_1619344,
title = {Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX},
author = {Kravitz, S. and Smith, R. J. and Hagaman, L. and Bernard, E. P. and McKinsey, D. N. and Rudd, L. and Tvrznikova, L. and Gann, G. D. Orebi and Sakai, M.},
abstractNote = {Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.},
doi = {10.1140/epjc/s10052-020-7800-6},
journal = {European Physical Journal. C, Particles and Fields},
number = 3,
volume = 80,
place = {Germany},
year = {2020},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1140/epjc/s10052-020-7800-6

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