Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Kravitz, S.; Smith, R. J.; Hagaman, L.; Bernard, E. P.; McKinsey, D. N.; Rudd, L.; Tvrznikova, L.; Gann, G. D.  Orebi; Sakai, M.

doi:10.1140/epjc/s10052-020-7800-6

Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Journal Article · 21 March 2020 · European Physical Journal. C, Particles and Fields

DOI: https://doi.org/10.1140/epjc/s10052-020-7800-6 · OSTI ID:1619344

^[1]; Smith, R. J. ^[2]; Hagaman, L. ^[2]; Bernard, E. P. ^[2]; McKinsey, D. N. ^[3]; Rudd, L. ^[2]; Tvrznikova, L. ^[4]; Gann, G. D. Orebi ^[3]; Sakai, M. ^[3]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States); Yale Univ., New Haven, CT (United States)

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is unknown. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC); USDOE

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1619344

Alternate ID(s):: OSTI ID: 1580947

Journal Information:: European Physical Journal. C, Particles and Fields, Vol. 80, Issue 3; ISSN 1434-6044

Publisher:: SpringerCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 7 works

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Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

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