Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Kravitz, S.; Smith, R. J.; Hagaman, L.; Bernard, E. P.; McKinsey, D. N.; Rudd, L.; Tvrznikova, L.; Gann, G. D. Orebi; Sakai, M.

doi:10.1140/epjc/s10052-020-7800-6

Title: Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Journal Article · 21 March 2020 · European Physical Journal. C, Particles and Fields

DOI: https://doi.org/10.1140/epjc/s10052-020-7800-6 · OSTI ID:1619344

; Smith, R. J.; Hagaman, L.; Bernard, E. P.; McKinsey, D. N.; Rudd, L.; Tvrznikova, L.; Gann, G. D. Orebi; Sakai, M.

Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1619344

Journal Information:: European Physical Journal. C, Particles and Fields, Journal Name: European Physical Journal. C, Particles and Fields Journal Issue: 3 Vol. 80; ISSN 1434-6044

Publisher:: Springer Science + Business MediaCopyright Statement

Country of Publication:: Germany

Language:: English

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72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
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VUV
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