The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Abstract
Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques are needed to provide accurate and precise measurements for complex samples and non-ideal conditions. Here we present an approach to address these challenges using a transform, called the exit wave power cepstrum (EWPC), inspired by cepstral analysis in audio signal processing. The EWPC transforms NBED patterns into real-space patterns with sharp peaks corresponding to inter-atomic spacings. We describe a simple analytical model for interpretation of these patterns that cleanly decouples lattice information from the intensity variations in NBED patterns caused by tilt and thickness. With tracking the inter-atomic spacing peaks in EWPC patterns, strain mapping is demonstrated for two practical applications: mapping of ferroelectric domains in epitaxially strained PbTiO3 films and mapping of strain profiles in arbitrarily oriented core-shell Pt-Co nanoparticle fuel-cell catalysts. The EWPC transform enables lattice structure measurement at sub-pm precision and sub-nm resolution that is robust to small sample mistilts and random orientations.
- Authors:
-
- Cornell Univ., Ithaca, NY (United States)
- Cornell Univ., Ithaca, NY (United States). Kavli Institute for Nanoscale Science
- Publication Date:
- Research Org.:
- General Motors LLC, Detroit, MI (United States); Cornell Univ., Ithaca, NY (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- OSTI Identifier:
- 1799288
- Alternate Identifier(s):
- OSTI ID: 1618179
- Grant/Contract Number:
- EE0007271; SC0002334; SC0019445
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Volume: 214; Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; Microscopy
Citation Formats
Padgett, Elliot, Holtz, Megan E., Cueva, Paul, Shao, Yu-Tsun, Langenberg, Eric, Schlom, Darrell G., and Muller, David A. The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision. United States: N. p., 2020.
Web. doi:10.1016/j.ultramic.2020.112994.
Padgett, Elliot, Holtz, Megan E., Cueva, Paul, Shao, Yu-Tsun, Langenberg, Eric, Schlom, Darrell G., & Muller, David A. The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision. United States. https://doi.org/10.1016/j.ultramic.2020.112994
Padgett, Elliot, Holtz, Megan E., Cueva, Paul, Shao, Yu-Tsun, Langenberg, Eric, Schlom, Darrell G., and Muller, David A. Tue .
"The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision". United States. https://doi.org/10.1016/j.ultramic.2020.112994. https://www.osti.gov/servlets/purl/1799288.
@article{osti_1799288,
title = {The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision},
author = {Padgett, Elliot and Holtz, Megan E. and Cueva, Paul and Shao, Yu-Tsun and Langenberg, Eric and Schlom, Darrell G. and Muller, David A.},
abstractNote = {Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques are needed to provide accurate and precise measurements for complex samples and non-ideal conditions. Here we present an approach to address these challenges using a transform, called the exit wave power cepstrum (EWPC), inspired by cepstral analysis in audio signal processing. The EWPC transforms NBED patterns into real-space patterns with sharp peaks corresponding to inter-atomic spacings. We describe a simple analytical model for interpretation of these patterns that cleanly decouples lattice information from the intensity variations in NBED patterns caused by tilt and thickness. With tracking the inter-atomic spacing peaks in EWPC patterns, strain mapping is demonstrated for two practical applications: mapping of ferroelectric domains in epitaxially strained PbTiO3 films and mapping of strain profiles in arbitrarily oriented core-shell Pt-Co nanoparticle fuel-cell catalysts. The EWPC transform enables lattice structure measurement at sub-pm precision and sub-nm resolution that is robust to small sample mistilts and random orientations.},
doi = {10.1016/j.ultramic.2020.112994},
journal = {Ultramicroscopy},
number = C,
volume = 214,
place = {United States},
year = {Tue Feb 04 00:00:00 EST 2020},
month = {Tue Feb 04 00:00:00 EST 2020}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 17 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Absorptive form factors for high-energy electron diffraction
journal, March 1990
- Bird, D. M.; King, Q. A.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 46, Issue 3
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
journal, January 2016
- Cooper, David; Denneulin, Thibaud; Bernier, Nicolas
- Micron, Vol. 80
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
journal, November 2015
- Mahr, Christoph; Müller-Caspary, Knut; Grieb, Tim
- Ultramicroscopy, Vol. 158
Observing and measuring strain in nanostructures and devices with transmission electron microscopy
journal, February 2014
- Hÿtch, Martin J.; Minor, Andrew M.
- MRS Bulletin, Vol. 39, Issue 2
Strain Mapping of Two-Dimensional Heterostructures with Subpicometer Precision
journal, May 2018
- Han, Yimo; Nguyen, Kayla; Cao, Michael
- Nano Letters, Vol. 18, Issue 6
Improved precision in strain measurement using nanobeam electron diffraction
journal, September 2009
- Béché, A.; Rouvière, J. L.; Clément, L.
- Applied Physics Letters, Vol. 95, Issue 12
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
journal, October 2012
- Müller, Knut; Rosenauer, Andreas; Schowalter, Marco
- Microscopy and Microanalysis, Vol. 18, Issue 5
Strain-release mechanisms in bimetallic core–shell nanoparticles as revealed by Cs-corrected STEM
journal, March 2013
- Bhattarai, Nabraj; Casillas, Gilberto; Ponce, Arturo
- Surface Science, Vol. 609
Mitigation of PEM Fuel Cell Catalyst Degradation with Porous Carbon Supports
journal, January 2019
- Padgett, Elliot; Yarlagadda, Venkata; Holtz, Megan E.
- Journal of The Electrochemical Society, Vol. 166, Issue 4
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
journal, November 2012
- Müller, Knut; Ryll, Henning; Ordavo, Ivan
- Applied Physics Letters, Vol. 101, Issue 21
Cepstrum Pitch Determination
journal, February 1967
- Noll, A. Michael
- The Journal of the Acoustical Society of America, Vol. 41, Issue 2
Atomic-Resolution Spectroscopic Imaging of Ensembles of Nanocatalyst Particles Across the Life of a Fuel Cell
journal, December 2011
- Xin, Huolin L.; Mundy, Julia A.; Liu, Zhongyi
- Nano Letters, Vol. 12, Issue 1
Double conical beam-rocking system for measurement of integrated electron diffraction intensities
journal, March 1994
- Vincent, R.; Midgley, P. A.
- Ultramicroscopy, Vol. 53, Issue 3
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
journal, May 2017
- Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim
- Ultramicroscopy, Vol. 176
Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
journal, June 2014
- Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, W.
- Nature Communications, Vol. 5, Issue 1
The Role of OOH Binding Site and Pt Surface Structure on ORR Activities
journal, January 2014
- Jia, Qingying; Caldwell, Keegan; Ziegelbauer, Joseph M.
- Journal of The Electrochemical Society, Vol. 161, Issue 14
Precession electron diffraction – a topical review
journal, January 2015
- Midgley, Paul A.; Eggeman, Alexander S.
- IUCrJ, Vol. 2, Issue 1
High-resolution scanning precession electron diffraction: Alignment and spatial resolution
journal, March 2017
- Barnard, Jonathan S.; Johnstone, Duncan N.; Midgley, Paul A.
- Ultramicroscopy, Vol. 174
A Fourier Series Method for the Determination of the Components of Interatomic Distances in Crystals
journal, September 1934
- Patterson, A. L.
- Physical Review, Vol. 46, Issue 5
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016
- Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
- Microscopy and Microanalysis, Vol. 22, Issue 1
Ferroelectric Domain Walls in PbTiO 3 Are Effective Regulators of Heat Flow at Room Temperature
journal, September 2019
- Langenberg, Eric; Saha, Dipanjan; Holtz, Megan E.
- Nano Letters, Vol. 19, Issue 11
CO Chemisorption at Metal Surfaces and Overlayers
journal, March 1996
- Hammer, B.; Morikawa, Y.; Nørskov, J. K.
- Physical Review Letters, Vol. 76, Issue 12
Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation
journal, March 2004
- Usuda, Koji; Mizuno, Tomohisa; Tezuka, Tsutomu
- Applied Surface Science, Vol. 224, Issue 1-4
Multislice formula for inclined illumination
journal, November 1982
- Ishizuka, K.
- Acta Crystallographica Section A, Vol. 38, Issue 6
Spectroscopic in situ Measurements of the Relative Pt Skin Thicknesses and Porosities of Dealloyed PtM n (Ni, Co) Electrocatalysts
journal, December 2014
- Caldwell, Keegan M.; Ramaker, David E.; Jia, Qingying
- The Journal of Physical Chemistry C, Vol. 119, Issue 1
Relativistic Hartree–Fock X-ray and electron scattering factors
journal, May 1968
- Doyle, P. A.; Turner, P. S.
- Acta Crystallographica Section A, Vol. 24, Issue 3
Effect of Strain on the Reactivity of Metal Surfaces
journal, September 1998
- Mavrikakis, M.; Hammer, B.; Nørskov, J. K.
- Physical Review Letters, Vol. 81, Issue 13
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
journal, August 2013
- Béché, A.; Rouvière, J. L.; Barnes, J. P.
- Ultramicroscopy, Vol. 131
Lattice strain mapping using circular Hough transform for electron diffraction disk detection
journal, December 2019
- Yuan, Renliang; Zhang, Jiong; Zuo, Jian-Min
- Ultramicroscopy, Vol. 207
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
journal, August 2013
- Béché, A.; Rouvière, J. L.; Barnes, J. P.
- Ultramicroscopy, Vol. 131
Observing and measuring strain in nanostructures and devices with transmission electron microscopy
journal, February 2014
- Hÿtch, Martin J.; Minor, Andrew M.
- MRS Bulletin, Vol. 39, Issue 2
Works referencing / citing this record:
Lattice strain measurement of core@shell electrocatalysts with 4D-STEM nanobeam electron diffraction
text, January 2020
- Mukherjee, Debangshu; Gamler, Jocelyn T. L.; Skrabalak, Sara E.
- arXiv