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Title: Wavefront sensing at X-ray free-electron lasers

Journal Article · · Journal of Synchrotron Radiation (Online)
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  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. European Synchrotron Radiation Facility (France)
  3. Paul Scherrer Institut (Switzerland)
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. European XFEL GmbH, Schenefeld (Germany)
  6. RIKEN SPring-8 Center, Sayo-cho, Sayo-gun (Japan); Japan Synchrotron Radiation Research Institute (JASRI), Sayo-cho, Sayo-gun (Japan)
  7. European XFEL GmbH, Schenefeld (Germany); La Trobe Univ., Melbourne, VIC (Australia)
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany)
  9. European XFEL GmbH, Schenefeld (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic)
+ Show Author Affiliations

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
1617935
Alternate ID(s):
OSTI ID: 1527375
Journal Information:
Journal of Synchrotron Radiation (Online), Vol. 26, Issue 4; ISSN 1600-5775
Publisher:
International Union of CrystallographyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 25 works
Citation information provided by
Web of Science

References (35)

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47 OTHER INSTRUMENTATION
42 ENGINEERING
X-ray free-electron lasers
wavefront sensing
grating interferometry
speckle tracking