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Title: X-ray free-electron laser wavefront sensing using the fractional Talbot effect

Abstract

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.

Authors:
ORCiD logo; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1617100
Alternate Identifier(s):
OSTI ID: 1595997; OSTI ID: 1607481; OSTI ID: 1633963
Grant/Contract Number:  
AC02-76SF00515; AC02-06CH11357
Resource Type:
Published Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online) Journal Volume: 27 Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
Denmark
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; wavefront sensing; free-electron lasers; FELs; interferometry; X-ray optics

Citation Formats

Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, and Sakdinawat, Anne. X-ray free-electron laser wavefront sensing using the fractional Talbot effect. Denmark: N. p., 2020. Web. doi:10.1107/S1600577519017107.
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Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, & Sakdinawat, Anne. X-ray free-electron laser wavefront sensing using the fractional Talbot effect. Denmark. doi:https://doi.org/10.1107/S1600577519017107
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Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, and Sakdinawat, Anne. Wed . "X-ray free-electron laser wavefront sensing using the fractional Talbot effect". Denmark. doi:https://doi.org/10.1107/S1600577519017107.
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@article{osti_1617100,
title = {X-ray free-electron laser wavefront sensing using the fractional Talbot effect},
author = {Liu, Yanwei and Seaberg, Matthew and Feng, Yiping and Li, Kenan and Ding, Yuantao and Marcus, Gabriel and Fritz, David and Shi, Xianbo and Grizolli, Walan and Assoufid, Lahsen and Walter, Peter and Sakdinawat, Anne},
abstractNote = {Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.},
doi = {10.1107/S1600577519017107},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 27,
place = {Denmark},
year = {2020},
month = {2}
}
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Journal Article:
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DOI: https://doi.org/10.1107/S1600577519017107
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