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Title: X-ray free-electron laser wavefront sensing using the fractional Talbot effect

Abstract

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.

Authors:
ORCiD logo; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1617100
Alternate Identifier(s):
OSTI ID: 1595997; OSTI ID: 1607481; OSTI ID: 1633963
Grant/Contract Number:  
AC02-76SF00515; AC02-06CH11357
Resource Type:
Published Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online) Journal Volume: 27 Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
Denmark
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; wavefront sensing; free-electron lasers; FELs; interferometry; X-ray optics

Citation Formats

Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, and Sakdinawat, Anne. X-ray free-electron laser wavefront sensing using the fractional Talbot effect. Denmark: N. p., 2020. Web. doi:10.1107/S1600577519017107.
Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, & Sakdinawat, Anne. X-ray free-electron laser wavefront sensing using the fractional Talbot effect. Denmark. doi:https://doi.org/10.1107/S1600577519017107
Liu, Yanwei, Seaberg, Matthew, Feng, Yiping, Li, Kenan, Ding, Yuantao, Marcus, Gabriel, Fritz, David, Shi, Xianbo, Grizolli, Walan, Assoufid, Lahsen, Walter, Peter, and Sakdinawat, Anne. Wed . "X-ray free-electron laser wavefront sensing using the fractional Talbot effect". Denmark. doi:https://doi.org/10.1107/S1600577519017107.
@article{osti_1617100,
title = {X-ray free-electron laser wavefront sensing using the fractional Talbot effect},
author = {Liu, Yanwei and Seaberg, Matthew and Feng, Yiping and Li, Kenan and Ding, Yuantao and Marcus, Gabriel and Fritz, David and Shi, Xianbo and Grizolli, Walan and Assoufid, Lahsen and Walter, Peter and Sakdinawat, Anne},
abstractNote = {Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.},
doi = {10.1107/S1600577519017107},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 27,
place = {Denmark},
year = {2020},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: https://doi.org/10.1107/S1600577519017107

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Works referenced in this record:

Lithographically fabricated gratings for the interferometric measurement of material shear moduli under extreme conditions
journal, November 2012

  • Gleason, Arianna E.; Tiberio, Richard C.; Mao, Wendy L.
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 30, Issue 6
  • DOI: 10.1116/1.4767323

Hartmann wavefront sensors and their application at FLASH
journal, January 2016

  • Keitel, Barbara; Plönjes, Elke; Kreis, Svea
  • Journal of Synchrotron Radiation, Vol. 23, Issue 1
  • DOI: 10.1107/S1600577515020354

Diffraction-limited storage rings – a window to the science of tomorrow
journal, August 2014

  • Eriksson, Mikael; van der Veen, J. Friso; Quitmann, Christoph
  • Journal of Synchrotron Radiation, Vol. 21, Issue 5
  • DOI: 10.1107/S1600577514019286

The physics of x-ray free-electron lasers
journal, March 2016


Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry
journal, January 2012

  • Matsuyama, Satoshi; Yokoyama, Hikaru; Fukui, Ryosuke
  • Optics Express, Vol. 20, Issue 22
  • DOI: 10.1364/OE.20.024977

X-ray pulse wavefront metrology using speckle tracking
journal, May 2015

  • Berujon, Sebastien; Ziegler, Eric; Cloetens, Peter
  • Journal of Synchrotron Radiation, Vol. 22, Issue 4
  • DOI: 10.1107/S1600577515005433

Development and implementation of a portable grating interferometer system as a standard tool for testing optics at the Advanced Photon Source beamline 1-BM
journal, May 2016

  • Assoufid, Lahsen; Shi, Xianbo; Marathe, Shashidhara
  • Review of Scientific Instruments, Vol. 87, Issue 5
  • DOI: 10.1063/1.4950775

High-accuracy wavefront sensing for x-ray free electron lasers
journal, January 2018


The LAMP instrument at the Linac Coherent Light Source free-electron laser
journal, March 2018

  • Osipov, Timur; Bostedt, Christoph; Castagna, J. -C.
  • Review of Scientific Instruments, Vol. 89, Issue 3
  • DOI: 10.1063/1.5017727

Spot size characterization of focused non-Gaussian X-ray laser beams
journal, January 2010

  • Chalupský, J.; Krzywinski, J.; Juha, L.
  • Optics Express, Vol. 18, Issue 26
  • DOI: 10.1364/OE.18.027836

Exploring the wavefront of hard X-ray free-electron laser radiation
journal, January 2012

  • Rutishauser, Simon; Samoylova, Liubov; Krzywinski, Jacek
  • Nature Communications, Vol. 3, Issue 1
  • DOI: 10.1038/ncomms1950

Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates
journal, August 2011

  • David, C.; Gorelick, S.; Rutishauser, S.
  • Scientific Reports, Vol. 1, Issue 1
  • DOI: 10.1038/srep00057

A wavefront sensor based on the fractional Talbot effect
journal, July 2001


Shearing Interferometer for Quantifying the Coherence of Hard X-Ray Beams
journal, April 2005


A 2 D high accuracy slope measuring system based on a Stitching Shack Hartmann Optical Head
journal, January 2014

  • Idir, Mourad; Kaznatcheev, Konstantine; Dovillaire, Guillaume
  • Optics Express, Vol. 22, Issue 3
  • DOI: 10.1364/OE.22.002770

Soft x-ray free-electron laser induced damage to inorganic scintillators
journal, January 2015

  • Burian, Tomáš; Hájková, Věra; Chalupský, Jaromír
  • Optical Materials Express, Vol. 5, Issue 2
  • DOI: 10.1364/OME.5.000254