Charge exchange recombination spectroscopy at Wendelstein 7-X

Ford, O. P.; Vanó, L.; Alonso, J. A.; Baldzuhn, J.; Beurskens, M. N.  A.; Biedermann, C.; Bozhenkov, S. A.; Fuchert, G.; Geiger, B.; Hartmann, D.; Jaspers, R. J.  E.; Kappatou, A.; Langenberg, A.; Lazerson, S. A.; McDermott, R. M.; McNeely, P.; Neelis, T. W.  C.; Pablant, N. A.; Pasch, E.; Rust, N.; Schroeder, R.; Scott, E. R.; Smith, H. M.; Wegner, Th.; Kunkel, F.; Wolf, R. C.

doi:10.1063/1.5132936

Title: Charge exchange recombination spectroscopy at Wendelstein 7-X

Journal Article · 06 February 2020 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/1.5132936 · OSTI ID:1616951

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Max-Planck Inst. für Plasmaphysik, Greifswald (Germany)
CIEMAT, Madrid (Spain)
Eindhoven Univ. of Technology (The Netherlands)
Max-Planck Institut für Plasmaphysik, 85748 Garching, Germany
Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)

The Charge Exchange Recombination Spectroscopy (CXRS) diagnostic has become a routine diagnostic on almost all major high temperature fusion experimental devices. For the optimized stellarator Wendelstein 7-X (W7-X), a highly flexible and extensive CXRS diagnostic has been built to provide high-resolution local measurements of several important plasma parameters using the recently commissioned neutral beam heating. This paper outlines the design specifics of the W7-X CXRS system and gives examples of the initial results obtained, to include typical ion temperature profiles for several common heating scenarios, toroidal flow and radial electric field derived from velocity measurements, beam attenuation via beam emission spectra, and normalized impurity density profiles under some typical plasma conditions.

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Research Organization:: Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)

Sponsoring Organization:: USDOE; Euratom Research and Training Programme

Contributing Organization:: W7-X Team

Grant/Contract Number:: AC02-09CH11466; 633053

OSTI ID:: 1616951

Journal Information:: Review of Scientific Instruments, Vol. 91, Issue 2; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 29 works

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References (39)

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