DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching

Authors:
ORCiD logo; ; ; ; ; ; ; ; ; ORCiD logo
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1616218
Alternate Identifier(s):
OSTI ID: 1616271; OSTI ID: 1616942; OSTI ID: 1638148
Report Number(s):
BNL-215880-2020-JAAM
Journal ID: ISSN 2334-2536
Grant/Contract Number:  
AC02-06CH11357; SC0012704; R01-MH115265; AC02-76SF00515
Resource Type:
Published Article
Journal Name:
Optica
Additional Journal Information:
Journal Name: Optica Journal Volume: 7 Journal Issue: 5; Journal ID: ISSN 2334-2536
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Li, Kenan, Ali, Sajid, Wojcik, Michael, De Andrade, Vincent, Huang, Xiaojing, Yan, Hanfei, Chu, Yong S., Nazaretski, Evgeny, Pattammattel, Ajith, and Jacobsen, Chris. Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching. United States: N. p., 2020. Web. doi:10.1364/OPTICA.387445.
Li, Kenan, Ali, Sajid, Wojcik, Michael, De Andrade, Vincent, Huang, Xiaojing, Yan, Hanfei, Chu, Yong S., Nazaretski, Evgeny, Pattammattel, Ajith, & Jacobsen, Chris. Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching. United States. https://doi.org/10.1364/OPTICA.387445
Li, Kenan, Ali, Sajid, Wojcik, Michael, De Andrade, Vincent, Huang, Xiaojing, Yan, Hanfei, Chu, Yong S., Nazaretski, Evgeny, Pattammattel, Ajith, and Jacobsen, Chris. Wed . "Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching". United States. https://doi.org/10.1364/OPTICA.387445.
@article{osti_1616218,
title = {Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching},
author = {Li, Kenan and Ali, Sajid and Wojcik, Michael and De Andrade, Vincent and Huang, Xiaojing and Yan, Hanfei and Chu, Yong S. and Nazaretski, Evgeny and Pattammattel, Ajith and Jacobsen, Chris},
abstractNote = {},
doi = {10.1364/OPTICA.387445},
journal = {Optica},
number = 5,
volume = 7,
place = {United States},
year = {Wed Apr 29 00:00:00 EDT 2020},
month = {Wed Apr 29 00:00:00 EDT 2020}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1364/OPTICA.387445

Citation Metrics:
Cited by: 15 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Development of scanning x-ray fluorescence microscope with spatial resolution of 30nm using Kirkpatrick-Baez mirror optics
journal, October 2006

  • Matsuyama, S.; Mimura, H.; Yumoto, H.
  • Review of Scientific Instruments, Vol. 77, Issue 10
  • DOI: 10.1063/1.2358699

X-ray zone plates with 25 aspect ratio using a 2-μm-thick ultrananocrystalline diamond mold
journal, January 2014

  • Wojcik, Michael J.; Mancini, Derrick C.; Divan, Ralu
  • Microsystem Technologies, Vol. 20, Issue 10-11
  • DOI: 10.1007/s00542-013-2058-7

Vertical directionality-controlled metal-assisted chemical etching for ultrahigh aspect ratio nanoscale structures
journal, November 2014

  • Tiberio, Richard C.; Rooks, Michael J.; Chang, Chieh
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 32, Issue 6
  • DOI: 10.1116/1.4898199

Interlaced zone plate optics for hard X-ray imaging in the 10 nm range
journal, March 2017

  • Mohacsi, Istvan; Vartiainen, Ismo; Rösner, Benedikt
  • Scientific Reports, Vol. 7, Issue 1
  • DOI: 10.1038/srep43624

Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography
journal, June 2006

  • Ercius, Peter; Weyland, Matthew; Muller, David A.
  • Applied Physics Letters, Vol. 88, Issue 24
  • DOI: 10.1063/1.2213185

Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science
journal, March 2018


Formation of High Aspect Ratio GaAs Nanostructures with Metal-Assisted Chemical Etching
journal, December 2011

  • DeJarld, Matt; Shin, Jae Cheol; Chern, Winston
  • Nano Letters, Vol. 11, Issue 12
  • DOI: 10.1021/nl202708d

High-resolution lenses for sub-100 nm x-ray fluorescence microscopy
journal, December 2000

  • David, C.; Kaulich, B.; Barrett, R.
  • Applied Physics Letters, Vol. 77, Issue 23
  • DOI: 10.1063/1.1329638

Real space soft x-ray imaging at 10 nm spatial resolution
journal, January 2012


The correction of electron lens aberrations
journal, September 2015


Fabrication of Fresnel zone plates for hard X-rays
journal, May 2007


Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses
journal, March 2017

  • Patommel, Jens; Klare, Susanne; Hoppe, Robert
  • Applied Physics Letters, Vol. 110, Issue 10
  • DOI: 10.1063/1.4977882

Phase zone plates for x rays and the extreme uv
journal, January 1974


Nanofabrication of high aspect ratio 24 nm x-ray zone plates for x-ray imaging applications
journal, January 2007

  • Feng, Yan; Feser, Michael; Lyon, Alan
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 25, Issue 6
  • DOI: 10.1116/1.2789447

Systematic efficiency study of line-doubled zone plates
journal, June 2017


Zone plates with high efficiency in high orders of diffraction described by dynamical theory
journal, October 1997

  • Schneider, G.
  • Applied Physics Letters, Vol. 71, Issue 16
  • DOI: 10.1063/1.120069

High-Resolution Scanning X-ray Diffraction Microscopy
journal, July 2008


The Effects of Manufacturing Inaccuracies on the Imaging Properties of Fresnel Zone Plates
journal, October 1983

  • Simpson, M. J.; Michette, A. G.
  • Optica Acta: International Journal of Optics, Vol. 30, Issue 10
  • DOI: 10.1080/713821074

Nanometer focusing of hard x rays by phase zone plates
journal, May 1999

  • Yun, W.; Lai, B.; Cai, Z.
  • Review of Scientific Instruments, Vol. 70, Issue 5
  • DOI: 10.1063/1.1149744

Unified Approach to Ultrasonic Light Diffraction
journal, July 1967

  • Klein, W. R.; Cook, B. D.
  • IEEE Transactions on Sonics and Ultrasonics, Vol. 14, Issue 3
  • DOI: 10.1109/T-SU.1967.29423

High-aspect ratio zone plate fabrication for hard x-ray nanoimaging
conference, August 2017

  • Parfeniukas, Karolis; Giakoumidis, Stylianos; Vogt, Ulrich
  • Advances in X-Ray/EUV Optics and Components XII
  • DOI: 10.1117/12.2272695

Process optimization for production of sub-20 nm soft x-ray zone plates
journal, November 1997

  • Spector, S. J.
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 15, Issue 6
  • DOI: 10.1116/1.589747

Chemical composition mapping with nanometre resolution by soft X-ray microscopy
journal, September 2014


Developments in synchrotron x-ray computed microtomography at the National Synchrotron Light Source
conference, September 1999

  • Dowd, Betsy A.; Campbell, Graham H.; Marr, Robert B.
  • SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, SPIE Proceedings
  • DOI: 10.1117/12.363725

Fabrication of hard x-ray zone plates with high aspect ratio using metal-assisted chemical etching
journal, November 2017

  • Li, Kenan; Wojcik, Michael J.; Divan, Ralu
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 35, Issue 6
  • DOI: 10.1116/1.4991794

Nanoscale x-ray imaging of circuit features without wafer etching
journal, March 2017


Illumination for coherent soft X-ray applications: the new X1A beamline at the NSLS
journal, November 2000


Optical Performance Of Apodized Zone Plates
conference, March 1982

  • Rarback, Harvey; Kirz, Janos
  • 1981 Brookhaven Conferences, SPIE Proceedings
  • DOI: 10.1117/12.933144

Metal-assisted chemical etching in HF/H2O2 produces porous silicon
journal, October 2000

  • Li, X.; Bohn, P. W.
  • Applied Physics Letters, Vol. 77, Issue 16
  • DOI: 10.1063/1.1319191

High resolution double-sided diffractive optics for hard X-ray microscopy
journal, January 2015

  • Mohacsi, Istvan; Vartiainen, Ismo; Guizar-Sicairos, Manuel
  • Optics Express, Vol. 23, Issue 2
  • DOI: 10.1364/OE.23.000776

A Fast Sinc Function Gridding Algorithm for Fourier Inversion in Computer Tomography
journal, December 1985


Probe retrieval in ptychographic coherent diffractive imaging
journal, March 2009


Ultra-high aspect ratio high-resolution nanofabrication for hard X-ray diffractive optics
journal, June 2014

  • Chang, Chieh; Sakdinawat, Anne
  • Nature Communications, Vol. 5, Issue 1
  • DOI: 10.1038/ncomms5243

Reconstructing state mixtures from diffraction measurements
journal, February 2013


TomoPy: a framework for the analysis of synchrotron tomographic data
journal, August 2014

  • Gürsoy, Dogˇa; De Carlo, Francesco; Xiao, Xianghui
  • Journal of Synchrotron Radiation, Vol. 21, Issue 5
  • DOI: 10.1107/S1600577514013939

Zone-Doubling Technique to Produce Ultrahigh-Resolution X-Ray Optics
journal, December 2007


Multilayer Laue lenses as high-resolution x-ray optics
conference, November 2004

  • Maser, Joerg; Stephenson, Gregory B.; Vogt, Stefan
  • Optical Science and Technology, the SPIE 49th Annual Meeting, SPIE Proceedings
  • DOI: 10.1117/12.560046

Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam
journal, April 2010

  • Ying, Andrew; Osting, Braxton; Noyan, I. C.
  • Journal of Applied Crystallography, Vol. 43, Issue 3
  • DOI: 10.1107/S0021889810008459

Influence of random zone positioning errors on the resolving power of Fresnel zone plates
journal, January 2014

  • Pratsch, Christoph; Rehbein, Stefan; Werner, Stephan
  • Optics Express, Vol. 22, Issue 25
  • DOI: 10.1364/OE.22.030482

X-ray focusing with efficient high-NA multilayer Laue lenses
journal, November 2017

  • Bajt, Saša; Prasciolu, Mauro; Fleckenstein, Holger
  • Light: Science & Applications, Vol. 7, Issue 3
  • DOI: 10.1038/lsa.2017.162

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
journal, July 1993

  • Henke, B. L.; Gullikson, E. M.; Davis, J. C.
  • Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342
  • DOI: 10.1006/adnd.1993.1013

Design and performance of a scanning ptychography microscope
journal, March 2014

  • Nazaretski, E.; Huang, X.; Yan, H.
  • Review of Scientific Instruments, Vol. 85, Issue 3
  • DOI: 10.1063/1.4868968

Hard x-ray nanoprobe based on refractive x-ray lenses
journal, September 2005

  • Schroer, C. G.; Kurapova, O.; Patommel, J.
  • Applied Physics Letters, Vol. 87, Issue 12
  • DOI: 10.1063/1.2053350

Resolution in soft X-ray microscopes
journal, November 1992


Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Hard-X-Ray Lensless Imaging of Extended Objects
journal, January 2007


Nanoscale silicon-on-insulator deformation induced by stressed liner structures
journal, April 2011

  • Murray, Conal E.; Ying, A.; Polvino, S. M.
  • Journal of Applied Physics, Vol. 109, Issue 8
  • DOI: 10.1063/1.3579421

Coupled wave description of the diffraction by zone plates with high aspect ratios
journal, May 1992


Hard x-ray nanofocusing by multilayer Laue lenses
journal, June 2014


Efficient concentration of high-energy x-rays for diffraction-limited imaging resolution
journal, January 2017


Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors
journal, September 2011


A Study in Diffraction Microscopy with Special Reference to X-Rays
journal, January 1952