Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements
Abstract
In this work a 300 keV transmission electron microscope was modified to produce broadband pulsed beams that can be, in principle, between 40 MHz and 12 GHz, corresponding to temporal resolution in the nanosecond to picosecond range without an excitation laser. The key enabling technology is a pair of phase-matched modulating and de-modulating traveling wave metallic comb striplines (pulsers). An initial temporal resolution of 30 ps was achieved with a strobe frequency of 6.0 GHz. The placement of the pulsers, mounted immediately below the gun, allows for preservation of all optical configurations, otherwise available to the unmodified instrument, and therefore makes such a post-modified instrument for dual-use, i.e., both pulsed-beam mode (i.e., stroboscopic time-resolved) and conventional continuous waveform mode. In this article, we describe the elements inserted into the beam path, challenges encountered during integration with an in-service microscope, and early results from an electric-field-driven pump–probe experiment. We conclude with ideas for making this class of instruments broadly applicable for examining cyclical and repeatable phenomena.
- Authors:
-
[1];
[1];
- National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
- Euclid Techlabs, LLC, Bolingbrook, IL (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- OSTI Identifier:
- 1614974
- Alternate Identifier(s):
- OSTI ID: 1601320
- Report Number(s):
- BNL-213823-2020-JAAM
Journal ID: ISSN 0034-6748; TRN: US2106324
- Grant/Contract Number:
- SC0012704; SC0013121; SB1341-16-CN-0035
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 91; Journal Issue: 2; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; TEM; Ultrafast electron microscopy; Stroboscopic; Electron beam pulser; Electron beams; Transmission electron microscopy; Pump probe experiments; Optical phase shifters; Stroboscopic effect; Ultrafast measurements
Citation Formats
Lau, June W., Schliep, Karl B., Katz, Michael B., Gokhale, Vikrant J., Gorman, Jason J., Jing, Chunguang, Liu, Ao, Zhao, Yubin, Montgomery, Eric, Choe, Hyeokmin, Rush, Wade, Kanareykin, Alexei, Fu, Xuewen, and Zhu, Yimei. Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements. United States: N. p., 2020.
Web. doi:10.1063/1.5131758.
Lau, June W., Schliep, Karl B., Katz, Michael B., Gokhale, Vikrant J., Gorman, Jason J., Jing, Chunguang, Liu, Ao, Zhao, Yubin, Montgomery, Eric, Choe, Hyeokmin, Rush, Wade, Kanareykin, Alexei, Fu, Xuewen, & Zhu, Yimei. Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements. United States. https://doi.org/10.1063/1.5131758
Lau, June W., Schliep, Karl B., Katz, Michael B., Gokhale, Vikrant J., Gorman, Jason J., Jing, Chunguang, Liu, Ao, Zhao, Yubin, Montgomery, Eric, Choe, Hyeokmin, Rush, Wade, Kanareykin, Alexei, Fu, Xuewen, and Zhu, Yimei. Mon .
"Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements". United States. https://doi.org/10.1063/1.5131758. https://www.osti.gov/servlets/purl/1614974.
@article{osti_1614974,
title = {Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements},
author = {Lau, June W. and Schliep, Karl B. and Katz, Michael B. and Gokhale, Vikrant J. and Gorman, Jason J. and Jing, Chunguang and Liu, Ao and Zhao, Yubin and Montgomery, Eric and Choe, Hyeokmin and Rush, Wade and Kanareykin, Alexei and Fu, Xuewen and Zhu, Yimei},
abstractNote = {In this work a 300 keV transmission electron microscope was modified to produce broadband pulsed beams that can be, in principle, between 40 MHz and 12 GHz, corresponding to temporal resolution in the nanosecond to picosecond range without an excitation laser. The key enabling technology is a pair of phase-matched modulating and de-modulating traveling wave metallic comb striplines (pulsers). An initial temporal resolution of 30 ps was achieved with a strobe frequency of 6.0 GHz. The placement of the pulsers, mounted immediately below the gun, allows for preservation of all optical configurations, otherwise available to the unmodified instrument, and therefore makes such a post-modified instrument for dual-use, i.e., both pulsed-beam mode (i.e., stroboscopic time-resolved) and conventional continuous waveform mode. In this article, we describe the elements inserted into the beam path, challenges encountered during integration with an in-service microscope, and early results from an electric-field-driven pump–probe experiment. We conclude with ideas for making this class of instruments broadly applicable for examining cyclical and repeatable phenomena.},
doi = {10.1063/1.5131758},
journal = {Review of Scientific Instruments},
number = 2,
volume = 91,
place = {United States},
year = {Mon Feb 24 00:00:00 EST 2020},
month = {Mon Feb 24 00:00:00 EST 2020}
}
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