A tunable path-separated electron interferometer with an amplitude-dividing grating beamsplitter

Yasin, Fehmi S.; Harada, Ken; Shindo, Daisuke; Shinada, Hiroyuki; McMorran, Benjamin J.; Tanigaki, Toshiaki

doi:10.1063/1.5051380

Title: A tunable path-separated electron interferometer with an amplitude-dividing grating beamsplitter

Journal Article · 04 December 2018 · Applied Physics Letters

DOI: https://doi.org/10.1063/1.5051380 · OSTI ID:1611424

^[1]; Harada, Ken ^[2]; Shindo, Daisuke ^[3]; Shinada, Hiroyuki ^[4]; McMorran, Benjamin J. ^[5]; Tanigaki, Toshiaki ^[4]

Univ. of Oregon, Eugene, OR (United States); Hitachi Ltd., Hatoyama (Japan); DOE/OSTI
RIKEN Center for Emergent Matter Science (CEMS), Hatoyama (Japan)
RIKEN Center for Emergent Matter Science (CEMS), Hatoyama (Japan); Tohoku Univ., Sendai (Japan)
Hitachi Ltd., Hatoyama (Japan)
Univ. of Oregon, Eugene, OR (United States)

We demonstrate a tunable path-separated electron interferometer using a single amplitude-dividing beamsplitter to prepare multiple spatially isolated, coherent electron probe beams. We place four electrostatic bi-prisms in the optical column of a scanning transmission electron microscope (STEM) to achieve path separations of up to 25 μm, the largest demonstrated within amplitude-division electron interferometers while maintaining fringe visibility of the directly observed interference fringes at the detector. We characterize the fringe visibility of this setup over a range of path separations and perform STEM holography to reconstruct the full object wave of a fabricated Si ramp test phase object. We report a quantitative object-wave measurement in this configuration and confirm with an independent off-axis electron holography measurement. This experimental design can potentially be applied to high-resolution phase imaging and fundamental physics experiments, such as an exploration of the electron wave packet coherence length and the Aharonov-Bohm effect.

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Research Organization:: Univ. of Oregon, Eugene, OR (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0010466

OSTI ID:: 1611424

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 23 Vol. 113; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Ophus, Colin Microscopy and Microanalysis, Vol. 25, Issue 3 https://doi.org/10.1017/s1431927619000497	journal	May 2019

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