Size dependent arsenic volatilization in ErAs nanoparticle powders

Lewis, Matthew R.; Remy, Roddel A.; Tew, Bo E.; Zide, Joshua M.  O.

doi:10.1063/1.5048191

Title: Size dependent arsenic volatilization in ErAs nanoparticle powders

Journal Article · 14 October 2018 · Applied Physics Letters

DOI: https://doi.org/10.1063/1.5048191 · OSTI ID:1611023

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^[2]; Tew, Bo E. ^[3];

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Univ. of Delaware, Newark, DE (United States); DOE/OSTI
Univ. of Delaware, Newark, DE (United States). Advanced Materials Characterization Lab.
Univ. of Delaware, Newark, DE (United States)

The thermal stability of ErAs nanoparticles and bulk-like powders, synthesized by pulsed laser ablation and direct reaction, respectively, is investigated up to 700 °C in N₂. Thermogravimetric analysis and XRD are used to monitor the decomposition temperatures and crystalline compositions of the synthesized powders, respectively. Degradation of unagglomerated nanoparticle powders is observed at 350°C accompanied by the crystallization of amorphous Er₂O₃. Mass balance analysis suggests that the mass loss occurs as a result of arsenic volatilization rather than congruent sublimation of ErAs. Conversely, micron-sized agglomerated particles grown by direct reaction show little evidence for degradation under similar thermal processing conditions. This significant decrease in ErAs stability compared to agglomerated powders suggests a size dependence on the degradation characteristics of ErAs.

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Research Organization:: Univ. of Delaware, Newark, DE (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0008166

OSTI ID:: 1611023

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 16 Vol. 113; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Growth and Thermal Characterization of TbAs Nanoparticles Grown by Inert Gas Condensation Tew, Bo E.; Zhang, Yuying; Shahid, Areej Journal of Electronic Materials, Vol. 49, Issue 1 https://doi.org/10.1007/s11664-019-07737-y	journal	October 2019

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