Experimental studies of the arc chamber short circuit failure mechanism on the DIII-D neutral beam system
- General Atomics, San Diego, CA (United States)
- Eindhoven Univ. of Technology (Netherlands)
- National Univ. of Engineering, Lima (Peru)
Here we report on efforts to improve performance and longevity of the Neutral Beam Injection (NBI) system by initiating a R&D program aimed at studying the most common failure mechanism for the ion sources. To this end a filament driven plasma chamber has been constructed with plasma parameters similar to the arc chamber of NBI ion sources. A preliminary report of an investigation into the most common failure is presented here: The failure mechanism observed during helium operations on DIII-D is the result of electrical breakdown of the insulation material that separates the filament plates from the anode. The fault is reproduced in a table top experiment analogous to the DIII-D NBI ion source in key parameters and proposals for amelioration of the issue are discussed.
- Research Organization:
- General Atomics, San Diego, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Fusion Energy Sciences (FES); USDOE
- Grant/Contract Number:
- FC02-04ER54698
- OSTI ID:
- 1609185
- Alternate ID(s):
- OSTI ID: 2325550
- Journal Information:
- Fusion Engineering and Design, Vol. 146, Issue B; ISSN 0920-3796
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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