Imaging mechanism for hyperspectral scanning probe microscopy via Gaussian process modelling

Ziatdinov, Maxim; Kim, Dohyung; Neumayer, Sabine M.; Vasudevan, Rama K.; Collins, Liam; Jesse, Stephen; Ahmadi, Mahshid; Kalinin, Sergei V.

doi:10.1038/s41524-020-0289-6

Title: Imaging mechanism for hyperspectral scanning probe microscopy via Gaussian process modelling

Journal Article · 19 March 2020 · npj Computational Materials

DOI: https://doi.org/10.1038/s41524-020-0289-6 · OSTI ID:1608212

^[1]; Kim, Dohyung ^[2];

^[1];

^[1]; Ahmadi, Mahshid ^[2];

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States)

We investigate the ability to reconstruct and derive spatial structure from sparsely sampled 3D piezoresponse force microcopy data, captured using the band-excitation (BE) technique, via Gaussian Process (GP) methods. Even for weakly informative priors, GP methods allow unambiguous determination of the characteristic length scales of the imaging process both in spatial and frequency domains. We further show that BE data set tends to be oversampled in the spatial domains, with ~30% of original data set sufficient for high-quality reconstruction, potentially enabling faster BE imaging. At the same time, reliable reconstruction along the frequency domain requires the resonance peak to be within the measured band. This behavior suggests the optimal strategy for the BE imaging on unknown samples. Finally, we discuss how GP can be used for automated experimentation in SPM, by combining GP regression with non-rectangular scans.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1608212

Journal Information:: npj Computational Materials, Vol. 6, Issue 1; ISSN 2057-3960

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 12 works

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Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials Ziatdinov, Maxim; Kim, Dohyung; Neumayer, Sabine arXiv https://doi.org/10.48550/arxiv.2002.03591	text	January 2020

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