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Title: Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures

Abstract

High-resolution and high-pressure X-ray diffraction measurements were performed to determine the effects of 5% Y, 3% Gd, and 50% Zr substitution on the crystal structure and polymorphism of HfO2. High-resolution experiments at ambient pressure show a mixture of monoclinic and cubic fluorite phases in 5% Y:HfO2 and 3% Gd:HfO2, while 50% Zr:HfO2 formed a monoclinic, single-phase solid solution. Crystallographic refinement using the Rietveld method indicates that Y and Gd substitute for Hf in both the monoclinic and cubic phases. High-pressure X-ray diffraction was performed in situ up to 31 GPa and shows that the pressure-induced phase transitions were reduced with the addition of either Y, Gd, or Zr relative to the transition pressures in undoped HfO2. Finally, the pressure-induced changes in lattice parameter, relative volume, and spontaneous strain are reported.

Authors:
 [1]; ORCiD logo [2]; ORCiD logo [1];  [1]
  1. North Carolina State Univ., Raleigh, NC (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES); Army Research Office (USARO)
OSTI Identifier:
1607279
Alternate Identifier(s):
OSTI ID: 1575803
Grant/Contract Number:  
AC05-00OR22725; NA0001974; FG02-99ER45775; AC02-06CH11357; W911NF-15-1-0593
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 126; Journal Issue: 20; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; hafnia; x-ray diffraction; monoclinic; orthorhombic; dopants

Citation Formats

Johnson, Brienne, Fancher, Chris M., Hou, Dong, and Jones, Jacob L. Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures. United States: N. p., 2019. Web. doi:10.1063/1.5121024.
Johnson, Brienne, Fancher, Chris M., Hou, Dong, & Jones, Jacob L. Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures. United States. https://doi.org/10.1063/1.5121024
Johnson, Brienne, Fancher, Chris M., Hou, Dong, and Jones, Jacob L. Mon . "Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures". United States. https://doi.org/10.1063/1.5121024. https://www.osti.gov/servlets/purl/1607279.
@article{osti_1607279,
title = {Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures},
author = {Johnson, Brienne and Fancher, Chris M. and Hou, Dong and Jones, Jacob L.},
abstractNote = {High-resolution and high-pressure X-ray diffraction measurements were performed to determine the effects of 5% Y, 3% Gd, and 50% Zr substitution on the crystal structure and polymorphism of HfO2. High-resolution experiments at ambient pressure show a mixture of monoclinic and cubic fluorite phases in 5% Y:HfO2 and 3% Gd:HfO2, while 50% Zr:HfO2 formed a monoclinic, single-phase solid solution. Crystallographic refinement using the Rietveld method indicates that Y and Gd substitute for Hf in both the monoclinic and cubic phases. High-pressure X-ray diffraction was performed in situ up to 31 GPa and shows that the pressure-induced phase transitions were reduced with the addition of either Y, Gd, or Zr relative to the transition pressures in undoped HfO2. Finally, the pressure-induced changes in lattice parameter, relative volume, and spontaneous strain are reported.},
doi = {10.1063/1.5121024},
journal = {Journal of Applied Physics},
number = 20,
volume = 126,
place = {United States},
year = {2019},
month = {11}
}

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Works referenced in this record:

Hafnia and hafnia-toughened ceramics
journal, January 1992

  • Wang, J.; Li, H. P.; Stevens, R.
  • Journal of Materials Science, Vol. 27, Issue 20
  • DOI: 10.1007/BF00541601

Ferroelectric HfO 2 -based materials for next-generation ferroelectric memories
journal, June 2016


Phase relationships in the Hafnia-Gadolinia system
journal, October 1977


Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO2
journal, October 2013


Pressure-induced phase transitions and volume changes in HfO 2 up to 50 GPa
journal, July 1993


Crystal Structure of Monoclinic Hafnia and Comparison with Monoclinic Zirconia
journal, March 1970


Ferroelectricity in Si-Doped HfO 2 Revealed: A Binary Lead-Free Ferroelectric
journal, October 2014

  • Martin, Dominik; Müller, Johannes; Schenk, Tony
  • Advanced Materials, Vol. 26, Issue 48
  • DOI: 10.1002/adma.201403115

Hafnium Oxide Based CMOS Compatible Ferroelectric Materials
journal, January 2013

  • Schroeder, U.; Mueller, S.; Mueller, J.
  • ECS Journal of Solid State Science and Technology, Vol. 2, Issue 4
  • DOI: 10.1149/2.010304jss

Impact of different dopants on the switching properties of ferroelectric hafniumoxide
journal, July 2014

  • Schroeder, Uwe; Yurchuk, Ekaterina; Müller, Johannes
  • Japanese Journal of Applied Physics, Vol. 53, Issue 8S1
  • DOI: 10.7567/JJAP.53.08LE02

EXPGUI , a graphical user interface for GSAS
journal, April 2001


Ferroelectric Zr 0.5 Hf 0.5 O 2 thin films for nonvolatile memory applications
journal, September 2011

  • Müller, J.; Böscke, T. S.; Bräuhaus, D.
  • Applied Physics Letters, Vol. 99, Issue 11
  • DOI: 10.1063/1.3636417

On the structural origins of ferroelectricity in HfO 2 thin films
journal, April 2015

  • Sang, Xiahan; Grimley, Everett D.; Schenk, Tony
  • Applied Physics Letters, Vol. 106, Issue 16
  • DOI: 10.1063/1.4919135

Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric properties
journal, August 2012

  • Olsen, T.; Schröder, U.; Müller, S.
  • Applied Physics Letters, Vol. 101, Issue 8
  • DOI: 10.1063/1.4747209

Relative stability of ZrO 2 and HfO 2 structural phases
journal, December 1999


Crystal Structure of Orthorhombic Zirconia in Partially Stabilized Zirconia
journal, September 1989


Cation doping and oxygen diffusion in zirconia: a combined atomistic simulation and molecular dynamics study
journal, January 1998

  • Khan, M. Sakib; Islam, M. Saiful; Bates, David R.
  • Journal of Materials Chemistry, Vol. 8, Issue 10
  • DOI: 10.1039/a803917h

Processing and crystallographic structure of non-equilibrium Si-doped HfO 2
journal, June 2015

  • Hou, Dong; Fancher, Chris M.; Zhao, Lili
  • Journal of Applied Physics, Vol. 117, Issue 24
  • DOI: 10.1063/1.4923023

Incipient Ferroelectricity in Al-Doped HfO2 Thin Films
journal, March 2012

  • Mueller, Stefan; Mueller, Johannes; Singh, Aarti
  • Advanced Functional Materials, Vol. 22, Issue 11
  • DOI: 10.1002/adfm.201103119

Ferroelectricity in Gd-Doped HfO 2 Thin Films
journal, January 2012

  • Mueller, S.; Adelmann, C.; Singh, A.
  • ECS Journal of Solid State Science and Technology, Vol. 1, Issue 6
  • DOI: 10.1149/2.002301jss

Flexible Inorganic Ferroelectric Thin Films for Nonvolatile Memory Devices
journal, April 2017

  • Yu, Hyeonggeun; Chung, Ching-Chang; Shewmon, Nate
  • Advanced Functional Materials, Vol. 27, Issue 21
  • DOI: 10.1002/adfm.201700461

Crystal structure of Si-doped HfO 2
journal, January 2014

  • Zhao, Lili; Nelson, Matthew; Aldridge, Henry
  • Journal of Applied Physics, Vol. 115, Issue 3
  • DOI: 10.1063/1.4861733

Pathways towards ferroelectricity in hafnia
journal, August 2014


Pressure-induced structures of Si-doped HfO2
journal, June 2015

  • Fancher, Chris M.; Zhao, Lili; Nelson, Matthew
  • Journal of Applied Physics, Vol. 117, Issue 23
  • DOI: 10.1063/1.4922717

Ferroelectricity and Antiferroelectricity of Doped Thin HfO 2 -Based Films
journal, February 2015

  • Park, Min Hyuk; Lee, Young Hwan; Kim, Han Joon
  • Advanced Materials, Vol. 27, Issue 11
  • DOI: 10.1002/adma.201404531

Antiferroelectricity in thin-film ZrO 2 from first principles
journal, October 2014

  • Reyes-Lillo, Sebastian E.; Garrity, Kevin F.; Rabe, Karin M.
  • Physical Review B, Vol. 90, Issue 14
  • DOI: 10.1103/PhysRevB.90.140103

Ferroelectricity in hafnium oxide thin films
journal, September 2011

  • Böscke, T. S.; Müller, J.; Bräuhaus, D.
  • Applied Physics Letters, Vol. 99, Issue 10
  • DOI: 10.1063/1.3634052

First-principles study of the structural phase transformation of hafnia under pressure
journal, August 2003


A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants
journal, January 2017

  • Park, M. H.; Schenk, T.; Fancher, C. M.
  • Journal of Materials Chemistry C, Vol. 5, Issue 19
  • DOI: 10.1039/C7TC01200D

The origin of ferroelectricity in Hf 1−x Zr x O 2 : A computational investigation and a surface energy model
journal, April 2015

  • Materlik, R.; Künneth, C.; Kersch, A.
  • Journal of Applied Physics, Vol. 117, Issue 13
  • DOI: 10.1063/1.4916707

Ferroelectricity in yttrium-doped hafnium oxide
journal, December 2011

  • Müller, J.; Schröder, U.; Böscke, T. S.
  • Journal of Applied Physics, Vol. 110, Issue 11
  • DOI: 10.1063/1.3667205

Neutron Diffraction Studies of Phase Transformations between Tetragonal and Orthorhombic Zirconia in Magnesia-Partially-Stabilized Zirconia
journal, October 1990


Growth of epitaxial orthorhombic YO 1.5 -substituted HfO 2 thin film
journal, July 2015

  • Shimizu, Takao; Katayama, Kiliha; Kiguchi, Takanori
  • Applied Physics Letters, Vol. 107, Issue 3
  • DOI: 10.1063/1.4927450

Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns
journal, October 2015


Spontaneous strain and the ferroelastic phase transition in As 2 O 5
journal, January 1988


Ferroelectricity in Simple Binary ZrO 2 and HfO 2
journal, July 2012

  • Müller, Johannes; Böscke, Tim S.; Schröder, Uwe
  • Nano Letters, Vol. 12, Issue 8
  • DOI: 10.1021/nl302049k

Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO 2
conference, March 2012

  • Martin, Dominik; Yurchuk, Ekaterina; Muller, Stefan
  • 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)
  • DOI: 10.1109/ulis.2012.6193391

Pathways Towards Ferroelectricity in Hafnia
text, January 2014