Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures
Abstract
High-resolution and high-pressure X-ray diffraction measurements were performed to determine the effects of 5% Y, 3% Gd, and 50% Zr substitution on the crystal structure and polymorphism of HfO2. High-resolution experiments at ambient pressure show a mixture of monoclinic and cubic fluorite phases in 5% Y:HfO2 and 3% Gd:HfO2, while 50% Zr:HfO2 formed a monoclinic, single-phase solid solution. Crystallographic refinement using the Rietveld method indicates that Y and Gd substitute for Hf in both the monoclinic and cubic phases. High-pressure X-ray diffraction was performed in situ up to 31 GPa and shows that the pressure-induced phase transitions were reduced with the addition of either Y, Gd, or Zr relative to the transition pressures in undoped HfO2. Finally, the pressure-induced changes in lattice parameter, relative volume, and spontaneous strain are reported.
- Authors:
-
- North Carolina State Univ., Raleigh, NC (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES); Army Research Office (USARO)
- OSTI Identifier:
- 1607279
- Alternate Identifier(s):
- OSTI ID: 1575803
- Grant/Contract Number:
- AC05-00OR22725; NA0001974; FG02-99ER45775; AC02-06CH11357; W911NF-15-1-0593
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 126; Journal Issue: 20; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; hafnia; x-ray diffraction; monoclinic; orthorhombic; dopants
Citation Formats
Johnson, Brienne, Fancher, Chris M., Hou, Dong, and Jones, Jacob L. Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures. United States: N. p., 2019.
Web. doi:10.1063/1.5121024.
Johnson, Brienne, Fancher, Chris M., Hou, Dong, & Jones, Jacob L. Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures. United States. https://doi.org/10.1063/1.5121024
Johnson, Brienne, Fancher, Chris M., Hou, Dong, and Jones, Jacob L. Mon .
"Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures". United States. https://doi.org/10.1063/1.5121024. https://www.osti.gov/servlets/purl/1607279.
@article{osti_1607279,
title = {Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures},
author = {Johnson, Brienne and Fancher, Chris M. and Hou, Dong and Jones, Jacob L.},
abstractNote = {High-resolution and high-pressure X-ray diffraction measurements were performed to determine the effects of 5% Y, 3% Gd, and 50% Zr substitution on the crystal structure and polymorphism of HfO2. High-resolution experiments at ambient pressure show a mixture of monoclinic and cubic fluorite phases in 5% Y:HfO2 and 3% Gd:HfO2, while 50% Zr:HfO2 formed a monoclinic, single-phase solid solution. Crystallographic refinement using the Rietveld method indicates that Y and Gd substitute for Hf in both the monoclinic and cubic phases. High-pressure X-ray diffraction was performed in situ up to 31 GPa and shows that the pressure-induced phase transitions were reduced with the addition of either Y, Gd, or Zr relative to the transition pressures in undoped HfO2. Finally, the pressure-induced changes in lattice parameter, relative volume, and spontaneous strain are reported.},
doi = {10.1063/1.5121024},
journal = {Journal of Applied Physics},
number = 20,
volume = 126,
place = {United States},
year = {2019},
month = {11}
}
Web of Science
Works referenced in this record:
Hafnia and hafnia-toughened ceramics
journal, January 1992
- Wang, J.; Li, H. P.; Stevens, R.
- Journal of Materials Science, Vol. 27, Issue 20
Ferroelectric HfO 2 -based materials for next-generation ferroelectric memories
journal, June 2016
- Fan, Zhen; Chen, Jingsheng; Wang, John
- Journal of Advanced Dielectrics, Vol. 06, Issue 02
Phase relationships in the Hafnia-Gadolinia system
journal, October 1977
- Durán, P.
- Ceramurgia International, Vol. 3, Issue 4
Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO2
journal, October 2013
- Martin, Dominik; Yurchuk, Ekaterina; Müller, Stefan
- Solid-State Electronics, Vol. 88
Pressure-induced phase transitions and volume changes in up to 50 GPa
journal, July 1993
- Leger, J. M.; Atouf, A.; Tomaszewski, P. E.
- Physical Review B, Vol. 48, Issue 1
Crystal Structure of Monoclinic Hafnia and Comparison with Monoclinic Zirconia
journal, March 1970
- Ruh, Robert; Corfield, Peter W. R.
- Journal of the American Ceramic Society, Vol. 53, Issue 3
Ferroelectricity in Si-Doped HfO 2 Revealed: A Binary Lead-Free Ferroelectric
journal, October 2014
- Martin, Dominik; Müller, Johannes; Schenk, Tony
- Advanced Materials, Vol. 26, Issue 48
Hafnium Oxide Based CMOS Compatible Ferroelectric Materials
journal, January 2013
- Schroeder, U.; Mueller, S.; Mueller, J.
- ECS Journal of Solid State Science and Technology, Vol. 2, Issue 4
Impact of different dopants on the switching properties of ferroelectric hafniumoxide
journal, July 2014
- Schroeder, Uwe; Yurchuk, Ekaterina; Müller, Johannes
- Japanese Journal of Applied Physics, Vol. 53, Issue 8S1
EXPGUI , a graphical user interface for GSAS
journal, April 2001
- Toby, Brian H.
- Journal of Applied Crystallography, Vol. 34, Issue 2
Ferroelectric Zr 0.5 Hf 0.5 O 2 thin films for nonvolatile memory applications
journal, September 2011
- Müller, J.; Böscke, T. S.; Bräuhaus, D.
- Applied Physics Letters, Vol. 99, Issue 11
On the structural origins of ferroelectricity in HfO 2 thin films
journal, April 2015
- Sang, Xiahan; Grimley, Everett D.; Schenk, Tony
- Applied Physics Letters, Vol. 106, Issue 16
Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric properties
journal, August 2012
- Olsen, T.; Schröder, U.; Müller, S.
- Applied Physics Letters, Vol. 101, Issue 8
Relative stability of and structural phases
journal, December 1999
- Lowther, J. E.; Dewhurst, J. K.; Leger, J. M.
- Physical Review B, Vol. 60, Issue 21
Crystal Structure of Orthorhombic Zirconia in Partially Stabilized Zirconia
journal, September 1989
- Kisi, Erich H.; Howard, Christopher J.; Hill, Roderick J.
- Journal of the American Ceramic Society, Vol. 72, Issue 9
Cation doping and oxygen diffusion in zirconia: a combined atomistic simulation and molecular dynamics study
journal, January 1998
- Khan, M. Sakib; Islam, M. Saiful; Bates, David R.
- Journal of Materials Chemistry, Vol. 8, Issue 10
Processing and crystallographic structure of non-equilibrium Si-doped HfO 2
journal, June 2015
- Hou, Dong; Fancher, Chris M.; Zhao, Lili
- Journal of Applied Physics, Vol. 117, Issue 24
Incipient Ferroelectricity in Al-Doped HfO2 Thin Films
journal, March 2012
- Mueller, Stefan; Mueller, Johannes; Singh, Aarti
- Advanced Functional Materials, Vol. 22, Issue 11
Ferroelectricity in Gd-Doped HfO 2 Thin Films
journal, January 2012
- Mueller, S.; Adelmann, C.; Singh, A.
- ECS Journal of Solid State Science and Technology, Vol. 1, Issue 6
Flexible Inorganic Ferroelectric Thin Films for Nonvolatile Memory Devices
journal, April 2017
- Yu, Hyeonggeun; Chung, Ching-Chang; Shewmon, Nate
- Advanced Functional Materials, Vol. 27, Issue 21
Crystal structure of Si-doped HfO 2
journal, January 2014
- Zhao, Lili; Nelson, Matthew; Aldridge, Henry
- Journal of Applied Physics, Vol. 115, Issue 3
Pathways towards ferroelectricity in hafnia
journal, August 2014
- Huan, Tran Doan; Sharma, Vinit; Rossetti, George A.
- Physical Review B, Vol. 90, Issue 6
Pressure-induced structures of Si-doped HfO2
journal, June 2015
- Fancher, Chris M.; Zhao, Lili; Nelson, Matthew
- Journal of Applied Physics, Vol. 117, Issue 23
Ferroelectricity and Antiferroelectricity of Doped Thin HfO 2 -Based Films
journal, February 2015
- Park, Min Hyuk; Lee, Young Hwan; Kim, Han Joon
- Advanced Materials, Vol. 27, Issue 11
Antiferroelectricity in thin-film from first principles
journal, October 2014
- Reyes-Lillo, Sebastian E.; Garrity, Kevin F.; Rabe, Karin M.
- Physical Review B, Vol. 90, Issue 14
Ferroelectricity in hafnium oxide thin films
journal, September 2011
- Böscke, T. S.; Müller, J.; Bräuhaus, D.
- Applied Physics Letters, Vol. 99, Issue 10
First-principles study of the structural phase transformation of hafnia under pressure
journal, August 2003
- Kang, Joongoo; Lee, E. -C.; Chang, K. J.
- Physical Review B, Vol. 68, Issue 5
A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants
journal, January 2017
- Park, M. H.; Schenk, T.; Fancher, C. M.
- Journal of Materials Chemistry C, Vol. 5, Issue 19
The origin of ferroelectricity in Hf 1−x Zr x O 2 : A computational investigation and a surface energy model
journal, April 2015
- Materlik, R.; Künneth, C.; Kersch, A.
- Journal of Applied Physics, Vol. 117, Issue 13
Ferroelectricity in yttrium-doped hafnium oxide
journal, December 2011
- Müller, J.; Schröder, U.; Böscke, T. S.
- Journal of Applied Physics, Vol. 110, Issue 11
Neutron Diffraction Studies of Phase Transformations between Tetragonal and Orthorhombic Zirconia in Magnesia-Partially-Stabilized Zirconia
journal, October 1990
- Howard, Christopher J.; Kisi, Erich H.; Roberts, Ronald B.
- Journal of the American Ceramic Society, Vol. 73, Issue 10
Growth of epitaxial orthorhombic YO 1.5 -substituted HfO 2 thin film
journal, July 2015
- Shimizu, Takao; Katayama, Kiliha; Kiguchi, Takanori
- Applied Physics Letters, Vol. 107, Issue 3
Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns
journal, October 2015
- Zhao, Lili; Hou, Dong; Usher, Tedi-Marie
- Journal of Alloys and Compounds, Vol. 646
Spontaneous strain and the ferroelastic phase transition in As 2 O 5
journal, January 1988
- Redfern, S. A. T.; Salje, E.
- Journal of Physics C: Solid State Physics, Vol. 21, Issue 2
Ferroelectricity in Simple Binary ZrO 2 and HfO 2
journal, July 2012
- Müller, Johannes; Böscke, Tim S.; Schröder, Uwe
- Nano Letters, Vol. 12, Issue 8
Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO 2
conference, March 2012
- Martin, Dominik; Yurchuk, Ekaterina; Muller, Stefan
- 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)
Pathways Towards Ferroelectricity in Hafnia
text, January 2014
- Huan, Tran Doan; Sharma, Vinit; Rossetti,, George A.
- arXiv