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Title: Atomic Mechanisms for the Si Atom Dynamics in Graphene: Chemical Transformations at the Edge and in the Bulk

Journal Article · · Advanced Functional Materials

The dynamic behavior of e-beam irradiated Si atoms in the bulk and at the edges of single-layer graphene is examined using scanning transmission electron microscopy (STEM). A deep learning network is used to convert experimental STEM movies into coordinates of individual Si and carbon atoms. A Gaussian mixture model is further used to establish the elementary atomic configurations of the Si atoms, defining the bonding geometries and chemical species and accounting for the discrete rotational symmetry of the host lattice. The frequencies and Markov transition probabilities between these states are determined. This analysis enables insight into the defect populations and chemical transformation networks from the atomically resolved STEM data. Here, a clear tendency is observed for the formation of a 1D Si crystal along zigzag direction of graphene edges and for the Si impurity coupling to topological defects in bulk graphene.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1607241
Alternate ID(s):
OSTI ID: 1575294
Journal Information:
Advanced Functional Materials, Vol. 29, Issue 52; ISSN 1616-301X
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 21 works
Citation information provided by
Web of Science

References (39)

Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision journal October 2015
The impact of STEM aberration correction on materials science journal September 2017
U-Net: Convolutional Networks for Biomedical Image Segmentation
  • Ronneberger, Olaf; Fischer, Philipp; Brox, Thomas
  • Medical Image Computing and Computer-Assisted Intervention – MICCAI 2015: 18th International Conference, Munich, Germany, October 5-9, 2015, Proceedings, Part III https://doi.org/10.1007/978-3-319-24574-4_28
book November 2015
Building Structures Atom by Atom via Electron Beam Manipulation journal August 2018
Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback journal April 2018
Interference Effects in the Electron Microscopy of Thin Crystal Foils journal September 1956
An atomic switch realized with the scanning tunnelling microscope journal August 1991
Directed Atom-by-Atom Assembly of Dopants in Silicon journal May 2018
Phase-Field Models for Microstructure Evolution journal August 2002
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations journal October 2016
A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images journal July 2018
E-beam manipulation of Si atoms on graphene edges with an aberration-corrected scanning transmission electron microscope journal July 2018
Computation of ring statistics for network models of solids journal September 1991
Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene journal June 2014
Manipulating low-dimensional materials down to the level of single atoms with electron irradiation journal September 2017
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study journal September 2019
Radiation damage in the TEM and SEM journal August 2004
Direct Determination of the Chemical Bonding of Individual Impurities in Graphene journal November 2012
Image Quality Assessment: From Error Visibility to Structural Similarity journal April 2004
Towards atomically precise manipulation of 2D nanostructures in the electron microscope journal September 2017
Electron-Beam Manipulation of Silicon Dopants in Graphene journal June 2018
Kinetics of Phase Change. II Transformation‐Time Relations for Random Distribution of Nuclei journal February 1940
Granulation, Phase Change, and Microstructure Kinetics of Phase Change. III journal February 1941
In Situ Observation of Oxygen Vacancy Dynamics and Ordering in the Epitaxial LaCoO 3 System journal June 2017
Engineering and modifying two-dimensional materials by electron beams journal September 2017
Single-atom dynamics in scanning transmission electron microscopy journal September 2017
Single-atom fabrication with electron and ion beams: From surfaces and two-dimensional materials toward three-dimensional atom-by-atom assembly journal September 2017
Kinetics of Phase Change. I General Theory journal December 1939
Atom-by-atom fabrication by electron beam via induced phase transformations journal September 2017
Imaging active topological defects in carbon nanotubes journal May 2007
Beam-Induced Damage to Thin Specimens in an Intense Electron Probe journal December 2005
Imaging atomic-level random walk of a point defect in graphene journal May 2014
Positioning single atoms with a scanning tunnelling microscope journal April 1990
Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy journal January 2013
Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes journal November 2008
Building Structures Atom by Atom via Electron Beam Manipulation journal February 2019
Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene journal June 2014
Interference Effects in the Electron Microscopy of Thin Crystal Foils journal October 2006
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations text January 2018

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