Simulation Informed CAD for 3D Nanoprinting

Fowlkes, Jason Davidson; Winkler, Robert; Mutunga, Eva M.; Rack, Philip D.; Plank, Harald

doi:10.3390/mi11010008

Title: Simulation Informed CAD for 3D Nanoprinting

Journal Article · 17 December 2019 · Micromachines

DOI: https://doi.org/10.3390/mi11010008 · OSTI ID:1606817

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^[2]; Mutunga, Eva M. ^[3];

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
Graz Univ. of Technology (Austria)
Univ. of Tennessee, Knoxville, TN (United States)
Graz Univ. of Technology (Austria); Graz Centre for Electron Microscopy (Austria)

A promising 3D nanoprinting method, used to deposit nanoscale mesh style objects, is prone to non-linear distortions which limits the complexity and variety of deposit geometries. The method, focused electron beam-induced deposition (FEBID), uses a nanoscale electron probe for continuous dissociation of surface adsorbed precursor molecules which drives highly localized deposition. Three dimensional objects are deposited using a 2D digital scanning pattern—the digital beam speed controls deposition into the third, or out-of-plane dimension. Multiple computer-aided design (CAD) programs exist for FEBID mesh object definition but rely on the definition of nodes and interconnecting linear nanowires. Thus, a method is needed to prevent non-linear/bending nanowires for accurate geometric synthesis. An analytical model is derived based on simulation results, calibrated using real experiments, to ensure linear nanowire deposition to compensate for implicit beam heating that takes place during FEBID. The model subsequently compensates and informs the exposure file containing the pixel-by-pixel scanning instructions, ensuring nanowire linearity by appropriately adjusting the patterning beam speeds. The derivation of the model is presented, based on a critical mass balance revealed by simulations and the strategy used to integrate the physics-based analytical model into an existing 3D nanoprinting CAD program is overviewed.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: Austrian Cooperative Research (ACR); Austrian Federal Ministry for Digital and Economic Affairs and the National Foundation for Research Technology and Development; Christian Doppler Research Association (CDL-DEFINE); USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1606817

Journal Information:: Micromachines, Journal Name: Micromachines Journal Issue: 1 Vol. 11; ISSN 2072-666X

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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Cited By (2)

Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review Plank, Harald; Winkler, Robert; Schwalb, Christian H. Micromachines, Vol. 11, Issue 1 https://doi.org/10.3390/mi11010048	journal	December 2019
Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review Plank, Harald; Winkler, Robert; Schwalb, Christian H. Micromachines, Vol. 11, Issue 1 https://doi.org/10.3390/mi11010048	journal	December 2019

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