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Title: Synchrotron characterization of high-Z, current-mode x-ray detectors

Abstract

Fast x-ray detectors are critical tools in pulsed power and fusion applications, where detector impulse response of a nanosecond or better is often required. Semiconductor detectors can create fast, sensitive devices with extensive operational flexibility. There is typically a trade-off between detector sensitivity and speed, but higher atomic number absorbers can increase hard x-ray absorption without increasing the charge collection time, provided carriers achieve high velocity. This paper presents x-ray pulse characterization conducted at the Advanced Photon Source of x-ray absorption efficiency and temporal impulse response of current-mode semiconductor x-ray detectors composed of Si, GaAs, and CdTe.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [2];  [3];  [3];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Nagoya Inst. of Technology (Japan)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
OSTI Identifier:
1605729
Alternate Identifier(s):
OSTI ID: 1599475; OSTI ID: 1614916
Report Number(s):
SAND-2020-2085J
Journal ID: ISSN 0034-6748; 684048
Grant/Contract Number:  
AC04-94AL85000; AC02-06CH11357; NA0003525
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 91; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; Synchrotrons; Signal processing; Quantum efficiency; Semiconductor detectors; Monochromators; Epitaxy; Hard X-rays; X-ray absorption spectroscopy

Citation Formats

Looker, Quinn, Wood, Michael G., Miceli, Antonino, Niraula, Madan, Yasuda, Kazuhito, and Porter, John L. Synchrotron characterization of high-Z, current-mode x-ray detectors. United States: N. p., 2020. Web. https://doi.org/10.1063/1.5139403.
Looker, Quinn, Wood, Michael G., Miceli, Antonino, Niraula, Madan, Yasuda, Kazuhito, & Porter, John L. Synchrotron characterization of high-Z, current-mode x-ray detectors. United States. https://doi.org/10.1063/1.5139403
Looker, Quinn, Wood, Michael G., Miceli, Antonino, Niraula, Madan, Yasuda, Kazuhito, and Porter, John L. Thu . "Synchrotron characterization of high-Z, current-mode x-ray detectors". United States. https://doi.org/10.1063/1.5139403. https://www.osti.gov/servlets/purl/1605729.
@article{osti_1605729,
title = {Synchrotron characterization of high-Z, current-mode x-ray detectors},
author = {Looker, Quinn and Wood, Michael G. and Miceli, Antonino and Niraula, Madan and Yasuda, Kazuhito and Porter, John L.},
abstractNote = {Fast x-ray detectors are critical tools in pulsed power and fusion applications, where detector impulse response of a nanosecond or better is often required. Semiconductor detectors can create fast, sensitive devices with extensive operational flexibility. There is typically a trade-off between detector sensitivity and speed, but higher atomic number absorbers can increase hard x-ray absorption without increasing the charge collection time, provided carriers achieve high velocity. This paper presents x-ray pulse characterization conducted at the Advanced Photon Source of x-ray absorption efficiency and temporal impulse response of current-mode semiconductor x-ray detectors composed of Si, GaAs, and CdTe.},
doi = {10.1063/1.5139403},
journal = {Review of Scientific Instruments},
number = 2,
volume = 91,
place = {United States},
year = {2020},
month = {2}
}

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