Synchrotron characterization of high-Z, current-mode x-ray detectors

Journal Article · 13 February 2020 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/1.5139403 · OSTI ID:1605729

Looker, Quinn  ^[1]; Wood, Michael G.  ^[1]; Miceli, Antonino ^[2]; Niraula, Madan ^[3]; Yasuda, Kazuhito ^[3]; Porter, John L. ^[1]

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1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States)
3. Nagoya Inst. of Technology (Japan)

Fast x-ray detectors are critical tools in pulsed power and fusion applications, where detector impulse response of a nanosecond or better is often required. Semiconductor detectors can create fast, sensitive devices with extensive operational flexibility. There is typically a trade-off between detector sensitivity and speed, but higher atomic number absorbers can increase hard x-ray absorption without increasing the charge collection time, provided carriers achieve high velocity. This paper presents x-ray pulse characterization conducted at the Advanced Photon Source of x-ray absorption efficiency and temporal impulse response of current-mode semiconductor x-ray detectors composed of Si, GaAs, and CdTe.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
• Grant/Contract Number: AC04-94AL85000; AC02-06CH11357; NA0003525
• OSTI ID: 1605729
• Alternate ID(s): OSTI ID: 1599475; OSTI ID: 1614916
• Report Number(s): SAND-2020-2085J; 684048; TRN: US2104710
• Journal Information: Review of Scientific Instruments, Vol. 91, Issue 2; ISSN 0034-6748
• Publisher: American Institute of Physics (AIP)Copyright Statement
• Country of Publication: United States
• Language: English