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Title: Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Abstract

A model for charge trapping and impact ionization and an experiment to measure these parameters are presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also described. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.

Authors:
ORCiD logo; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1605192
Grant/Contract Number:  
[AC02-76SF00515]
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Low Temperature Physics
Additional Journal Information:
[Journal Name: Journal of Low Temperature Physics]; Journal ID: ISSN 0022-2291
Country of Publication:
United States
Language:
English

Citation Formats

Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., and Young, B. A. Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors. United States: N. p., 2020. Web. doi:10.1007/s10909-020-02349-x.
Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., & Young, B. A. Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors. United States. doi:10.1007/s10909-020-02349-x.
Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., and Young, B. A. Sat . "Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors". United States. doi:10.1007/s10909-020-02349-x.
@article{osti_1605192,
title = {Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors},
author = {Ponce, F. and Page, W. and Brink, P. L. and Cabrera, B. and Cherry, M. and Fink, C. and Kurinsky, N. and Partridge, R. and Pyle, M. and Sadoulet, B. and Serfass, B. and Stanford, C. and Watkins, S. and Yellin, S. and Young, B. A.},
abstractNote = {A model for charge trapping and impact ionization and an experiment to measure these parameters are presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also described. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.},
doi = {10.1007/s10909-020-02349-x},
journal = {Journal of Low Temperature Physics},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {2}
}

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