Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

doi:10.1007/s10909-020-02349-x

This content will become publicly available on February 1, 2021

Title: Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Abstract

A model for charge trapping and impact ionization and an experiment to measure these parameters are presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also described. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.

Authors:

; Page, W.; Brink, P. L.; Cabrera, B.; Cherry, M.; Fink, C.; Kurinsky, N.; Partridge, R.; Pyle, M.; Sadoulet, B.; Serfass, B.; Stanford, C.; Watkins, S.; Yellin, S.; Young, B. A.

Publication Date:: 2020-02-01

Research Org.:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1605192

Grant/Contract Number:: [AC02-76SF00515]

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Low Temperature Physics

Additional Journal Information:: [Journal Name: Journal of Low Temperature Physics]; Journal ID: ISSN 0022-2291

Country of Publication:: United States

Language:: English

Citation Formats


                    Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., and Young, B. A. Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors.  United States: N. p., 2020. 
        Web.  doi:10.1007/s10909-020-02349-x.

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                    Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., & Young, B. A. Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors.  United States.  doi:10.1007/s10909-020-02349-x.

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                    Ponce, F., Page, W., Brink, P. L., Cabrera, B., Cherry, M., Fink, C., Kurinsky, N., Partridge, R., Pyle, M., Sadoulet, B., Serfass, B., Stanford, C., Watkins, S., Yellin, S., and Young, B. A. Sat .  
        "Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors".  United States.  doi:10.1007/s10909-020-02349-x.

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@article{osti_1605192,

  title        = {Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors},

  author       = {Ponce, F. and Page, W. and Brink, P. L. and Cabrera, B. and Cherry, M. and Fink, C. and Kurinsky, N. and Partridge, R. and Pyle, M. and Sadoulet, B. and Serfass, B. and Stanford, C. and Watkins, S. and Yellin, S. and Young, B. A.},

  abstractNote = {A model for charge trapping and impact ionization and an experiment to measure these parameters are presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also described. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.},

  doi          = {10.1007/s10909-020-02349-x},

  journal      = {Journal of Low Temperature Physics},

  number       = ,

  volume       = ,

  place        = {United States},

  year         = {2020},

  month        = {2}

}

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Works referenced in this record:

Direct detection of sub-GeV dark matter
journal, April 2012

Essig, Rouven; Mardon, Jeremy; Volansky, Tomer
Physical Review D, Vol. 85, Issue 7
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Dark light, dark matter, and the misalignment mechanism
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Thermal detection of single e-h pairs in a biased silicon crystal detector
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Voltage‐assisted calorimetric ionization detector
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Luke, P. N.
Journal of Applied Physics, Vol. 64, Issue 12
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First Dark Matter Constraints from a SuperCDMS Single-Charge Sensitive Detector
journal, August 2018

Agnese, R.; Aralis, T.; Aramaki, T.
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Similar Records

This content will become publicly available on February 1, 2021

Title: Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Abstract

Citation Formats

Direct detection of sub-GeV dark matter journal, April 2012

Dark light, dark matter, and the misalignment mechanism journal, November 2011

Searching for ϵ charges and a new U(1) journal, September 1986

Thermal detection of single e-h pairs in a biased silicon crystal detector journal, January 2018

Single-Electron and Single-Photon Sensitivity with a Silicon Skipper CCD journal, September 2017

Voltage‐assisted calorimetric ionization detector journal, December 1988

First Dark Matter Constraints from a SuperCDMS Single-Charge Sensitive Detector journal, August 2018

Electronic structure of copper, silver, and gold impurities in silicon journal, July 1985

Direct detection of sub-GeV dark matter
journal, April 2012

Dark light, dark matter, and the misalignment mechanism
journal, November 2011

Searching for ϵ charges and a new U(1)
journal, September 1986

Thermal detection of single e-h pairs in a biased silicon crystal detector
journal, January 2018

Single-Electron and Single-Photon Sensitivity with a Silicon Skipper CCD
journal, September 2017

Voltage‐assisted calorimetric ionization detector
journal, December 1988

First Dark Matter Constraints from a SuperCDMS Single-Charge Sensitive Detector
journal, August 2018

Electronic structure of copper, silver, and gold impurities in silicon
journal, July 1985