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Title: Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors

Abstract

Resonant energy X-ray diffraction was used to quantify cation site ordering in ZnGeP 2 thin films.

Authors:
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [3]; ORCiD logo [4]; ORCiD logo [1]; ORCiD logo [5]; ORCiD logo [5]; ORCiD logo [5]; ORCiD logo [1]; ORCiD logo [1]
  1. National Renewable Energy Laboratory, Golden, USA, Department of Physics, Colorado School of Mines
  2. SLAC National Accelerator Laboratory, Menlo Park, California, USA, Department of Mechanical Engineering
  3. National Renewable Energy Laboratory, Golden, USA
  4. Department of Physics, Colorado School of Mines, Golden, USA
  5. SLAC National Accelerator Laboratory, Menlo Park, California, USA
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1604243
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Materials Chemistry C
Additional Journal Information:
Journal Name: Journal of Materials Chemistry C Journal Volume: 8 Journal Issue: 13; Journal ID: ISSN 2050-7526
Publisher:
Royal Society of Chemistry (RSC)
Country of Publication:
United Kingdom
Language:
English

Citation Formats

Schnepf, Rekha R., Levy-Wendt, Ben L., Tellekamp, M. Brooks, Ortiz, Brenden R., Melamed, Celeste L., Schelhas, Laura T., Stone, Kevin H., Toney, Michael F., Toberer, Eric S., and Tamboli, Adele C. Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors. United Kingdom: N. p., 2020. Web. doi:10.1039/C9TC06699C.
Schnepf, Rekha R., Levy-Wendt, Ben L., Tellekamp, M. Brooks, Ortiz, Brenden R., Melamed, Celeste L., Schelhas, Laura T., Stone, Kevin H., Toney, Michael F., Toberer, Eric S., & Tamboli, Adele C. Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors. United Kingdom. doi:10.1039/C9TC06699C.
Schnepf, Rekha R., Levy-Wendt, Ben L., Tellekamp, M. Brooks, Ortiz, Brenden R., Melamed, Celeste L., Schelhas, Laura T., Stone, Kevin H., Toney, Michael F., Toberer, Eric S., and Tamboli, Adele C. Thu . "Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors". United Kingdom. doi:10.1039/C9TC06699C.
@article{osti_1604243,
title = {Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors},
author = {Schnepf, Rekha R. and Levy-Wendt, Ben L. and Tellekamp, M. Brooks and Ortiz, Brenden R. and Melamed, Celeste L. and Schelhas, Laura T. and Stone, Kevin H. and Toney, Michael F. and Toberer, Eric S. and Tamboli, Adele C.},
abstractNote = {Resonant energy X-ray diffraction was used to quantify cation site ordering in ZnGeP 2 thin films.},
doi = {10.1039/C9TC06699C},
journal = {Journal of Materials Chemistry C},
number = 13,
volume = 8,
place = {United Kingdom},
year = {2020},
month = {4}
}

Journal Article:
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