Method for conducting in situ high-temperature digital image correlation with simultaneous synchrotron measurements under thermomechanical conditions

Rossmann, Lin; Sarley, Brooke; Hernandez, Johnathan; Kenesei, Peter; Köster, Alain; Wischek, Janine; Almer, Jonathan; Maurel, Vincent; Bartsch, Marion; Raghavan, Seetha

doi:10.1063/1.5124496

Title: Method for conducting in situ high-temperature digital image correlation with simultaneous synchrotron measurements under thermomechanical conditions

Journal Article · 04 March 2020 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/1.5124496 · OSTI ID:1604143

^[1]; Sarley, Brooke ^[1]; Hernandez, Johnathan ^[1]; Kenesei, Peter ^[2]; Köster, Alain ^[3]; Wischek, Janine ^[4]; Almer, Jonathan ^[2]; Maurel, Vincent ^[3]; Bartsch, Marion ^[4];

^[1]

Univ. of Central Florida, Orlando, FL (United States)
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
PSL Research Univ., Évry (France). MINES ParisTech
Inst. of Materials Research, Köln (Germany). German Aerospace Center

This work presents a novel method of obtaining in situ strain measurements at high temperature by simultaneous digital image correlation (DIC), which provides the total strain on the specimen surface, and synchrotron x-ray diffraction (XRD), which provides lattice strains of crystalline materials. DIC at high temperature requires specialized techniques to overcome the effects of increased blackbody radiation that would otherwise overexpose the images. The technique presented herein is unique in that it can be used with a sample enclosed in an infrared heater, remotely and simultaneously with synchrotron XRD measurements. The heater included a window for camera access, and the light of the heater lamps is used as illumination. High-temperature paint is used to apply a random speckle pattern to the sample to allow the tracking of displacements and the calculation of the DIC strains. An inexpensive blue theatrical gel filter is used to block interfering visible and infrared light at high temperatures. This technique successfully produces properly exposed images at 870 °C and is expected to perform similarly at higher temperatures. The average strains measured by DIC were validated by an analytical calculation of the theoretical strain. Simultaneous DIC and XRD strain measurements of Inconel 718 (IN718) tensile test specimens were performed under thermal and mechanical loads and evaluated. Finally, this approach uses the fact that with DIC, the total strain is measured, including plastic strain, while with XRD, only elastic strain is captured. The observed differences were discussed with respect to the effective deformation mechanisms.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: German Science Foundation (DFG); National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1604143

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 3 Vol. 91; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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