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Title: A versatile Johansson-type tender x-ray emission spectrometer

Abstract

We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (~0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (~30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [2];  [1];  [1];  [1];  [3]; ORCiD logo [1]
  1. SLAC National Accelerator Laboratory, 2575 Sand Hill Rd., Menlo Park, California 94025, USA
  2. National Renewable Energy Laboratory, 15013 Denver West Parkway, Golden, Colorado 80401, USA
  3. SLAC National Accelerator Laboratory, 2575 Sand Hill Rd., Menlo Park, California 94025, USA; Center of High Pressure Science and Technology Advanced Research (HPSTAR), Shanghai 202103, China
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1603648
Alternate Identifier(s):
OSTI ID: 1602590
Grant/Contract Number:  
[AC02-76SF00515, AC02-05CH11231; AC02-76SF00515, DE-AC02-05CH11231]
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
[ Journal Volume: 91; Journal Issue: 3]; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Nowak, S. H., Armenta, R., Schwartz, C. P., Gallo, A., Abraham, B., Garcia-Esparza, A. T., Biasin, E., Prado, A., Maciel, A., Zhang, D., Day, D., Christensen, S., Kroll, T., Alonso-Mori, R., Nordlund, D., Weng, T. -C., and Sokaras, D. A versatile Johansson-type tender x-ray emission spectrometer. United States: N. p., 2020. Web. doi:10.1063/1.5121853.
Nowak, S. H., Armenta, R., Schwartz, C. P., Gallo, A., Abraham, B., Garcia-Esparza, A. T., Biasin, E., Prado, A., Maciel, A., Zhang, D., Day, D., Christensen, S., Kroll, T., Alonso-Mori, R., Nordlund, D., Weng, T. -C., & Sokaras, D. A versatile Johansson-type tender x-ray emission spectrometer. United States. doi:10.1063/1.5121853.
Nowak, S. H., Armenta, R., Schwartz, C. P., Gallo, A., Abraham, B., Garcia-Esparza, A. T., Biasin, E., Prado, A., Maciel, A., Zhang, D., Day, D., Christensen, S., Kroll, T., Alonso-Mori, R., Nordlund, D., Weng, T. -C., and Sokaras, D. Tue . "A versatile Johansson-type tender x-ray emission spectrometer". United States. doi:10.1063/1.5121853.
@article{osti_1603648,
title = {A versatile Johansson-type tender x-ray emission spectrometer},
author = {Nowak, S. H. and Armenta, R. and Schwartz, C. P. and Gallo, A. and Abraham, B. and Garcia-Esparza, A. T. and Biasin, E. and Prado, A. and Maciel, A. and Zhang, D. and Day, D. and Christensen, S. and Kroll, T. and Alonso-Mori, R. and Nordlund, D. and Weng, T. -C. and Sokaras, D.},
abstractNote = {We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (~0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (~30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed.},
doi = {10.1063/1.5121853},
journal = {Review of Scientific Instruments},
number = [3],
volume = [91],
place = {United States},
year = {2020},
month = {3}
}

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