Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
Abstract
Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different approaches. Conductivity, in particular, is mapped using the contact-mode method. However, this modality can be destructive to delicate samples, since it involves continuously dragging the cantilever tip on the surface during the raster scan, while a constant tip–sample force is applied. In this paper we discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development ofmore »
- Authors:
-
[1];
[1]
- George Washington Univ., Washington, DC (United States). Dept. of Mechanical and Aerospace Engineering
- Publication Date:
- Research Org.:
- George Washington Univ., Washington, DC (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1603485
- Grant/Contract Number:
- SC0018041
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Beilstein Journal of Nanotechnology
- Additional Journal Information:
- Journal Volume: 11; Journal ID: ISSN 2190-4286
- Publisher:
- Beilstein Institute
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 30 DIRECT ENERGY CONVERSION; 36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; 77 NANOSCIENCE AND NANOTECHNOLOGY; tomic force microscopy (AFM); conductivity; current; intermittent contact; Fourier analysis; tapping-mode AFM
Citation Formats
Uluutku, Berkin, and Solares, Santiago D. Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis. United States: N. p., 2020.
Web. doi:10.3762/bjnano.11.37.
Uluutku, Berkin, & Solares, Santiago D. Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis. United States. https://doi.org/10.3762/bjnano.11.37
Uluutku, Berkin, and Solares, Santiago D. Fri .
"Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis". United States. https://doi.org/10.3762/bjnano.11.37. https://www.osti.gov/servlets/purl/1603485.
@article{osti_1603485,
title = {Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis},
author = {Uluutku, Berkin and Solares, Santiago D.},
abstractNote = {Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different approaches. Conductivity, in particular, is mapped using the contact-mode method. However, this modality can be destructive to delicate samples, since it involves continuously dragging the cantilever tip on the surface during the raster scan, while a constant tip–sample force is applied. In this paper we discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development of a reliable intermittent-contact conductive AFM method.},
doi = {10.3762/bjnano.11.37},
journal = {Beilstein Journal of Nanotechnology},
number = ,
volume = 11,
place = {United States},
year = {Fri Mar 13 00:00:00 EDT 2020},
month = {Fri Mar 13 00:00:00 EDT 2020}
}
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