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Title: Proliferation of Faulty Materials Data Analysis in the Literature

Abstract

As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem with very undesirable consequences. This issue may contribute to what has been identified as a “reproducibility crisis”1,2 that was the subject of a recent U.S. National Academies study. We are using XPS as one example of what we observe to be a systemic issue.

Authors:
 [1];  [2];  [3];  [4];  [5];  [6];  [7];  [8];  [9];  [10];  [11];  [12];  [13];  [14];  [15];  [16];  [17];  [15]; ORCiD logo [18];  [19] more »;  [20]; ORCiD logo [18] « less
  1. BRIGHAM YOUNG UNIVERSITY
  2. General Electric Global Research Center
  3. Dayton, Univ Of
  4. Brundle and Associates
  5. Oklahoma State University
  6. University of Western Ontario
  7. Illinois Institute of Technology
  8. University of New Mexico
  9. Other
  10. VISITORS
  11. University of South Australia
  12. University of Namur
  13. Royal Melbourne Institute of Technology
  14. CSIRO Manufacturing
  15. SPECS Surface Nano Analysis GmbH
  16. Department of Chemistry and Biochemistry, Brigham Young University
  17. 8BAM Federal Institute for Materials Research and Testing
  18. BATTELLE (PACIFIC NW LAB)
  19. National Institute of Standards and Technology
  20. University of Maryland at College Park
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1603314
Report Number(s):
[PNNL-SA-141475]
Grant/Contract Number:  
[AC05-76RL01830]
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
[ Journal Volume: 26; Journal Issue: 1]
Country of Publication:
United States
Language:
English
Subject:
XPS, reproducibility, materials analysis

Citation Formats

Linford, Matthew R., Smentkowski, Vincent S., Grant, J T., Brundle, Christopher R., Sherwood, Peter M., Biesinger,, Mark C., Terry, Jeff H., Artyushkova, Kateryna, Herrera-Gomez, A, Tougaard, Sven M., Skinner, William, Pireaux, Jean-Jacques, McConville, Chris, Easton, Christopher D., Gengenbach, Donald R., Major, George H., Dietrich, Paul M., Thissen, Andreas, Engelhard, Mark H., Powell, Cedric J., Gaskell, Karen J., and Baer, Donald R. Proliferation of Faulty Materials Data Analysis in the Literature. United States: N. p., 2020. Web. doi:10.1017/S1431927619015332.
Linford, Matthew R., Smentkowski, Vincent S., Grant, J T., Brundle, Christopher R., Sherwood, Peter M., Biesinger,, Mark C., Terry, Jeff H., Artyushkova, Kateryna, Herrera-Gomez, A, Tougaard, Sven M., Skinner, William, Pireaux, Jean-Jacques, McConville, Chris, Easton, Christopher D., Gengenbach, Donald R., Major, George H., Dietrich, Paul M., Thissen, Andreas, Engelhard, Mark H., Powell, Cedric J., Gaskell, Karen J., & Baer, Donald R. Proliferation of Faulty Materials Data Analysis in the Literature. United States. doi:10.1017/S1431927619015332.
Linford, Matthew R., Smentkowski, Vincent S., Grant, J T., Brundle, Christopher R., Sherwood, Peter M., Biesinger,, Mark C., Terry, Jeff H., Artyushkova, Kateryna, Herrera-Gomez, A, Tougaard, Sven M., Skinner, William, Pireaux, Jean-Jacques, McConville, Chris, Easton, Christopher D., Gengenbach, Donald R., Major, George H., Dietrich, Paul M., Thissen, Andreas, Engelhard, Mark H., Powell, Cedric J., Gaskell, Karen J., and Baer, Donald R. Mon . "Proliferation of Faulty Materials Data Analysis in the Literature". United States. doi:10.1017/S1431927619015332.
@article{osti_1603314,
title = {Proliferation of Faulty Materials Data Analysis in the Literature},
author = {Linford, Matthew R. and Smentkowski, Vincent S. and Grant, J T. and Brundle, Christopher R. and Sherwood, Peter M. and Biesinger,, Mark C. and Terry, Jeff H. and Artyushkova, Kateryna and Herrera-Gomez, A and Tougaard, Sven M. and Skinner, William and Pireaux, Jean-Jacques and McConville, Chris and Easton, Christopher D. and Gengenbach, Donald R. and Major, George H. and Dietrich, Paul M. and Thissen, Andreas and Engelhard, Mark H. and Powell, Cedric J. and Gaskell, Karen J. and Baer, Donald R.},
abstractNote = {As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem with very undesirable consequences. This issue may contribute to what has been identified as a “reproducibility crisis”1,2 that was the subject of a recent U.S. National Academies study. We are using XPS as one example of what we observe to be a systemic issue.},
doi = {10.1017/S1431927619015332},
journal = {Microscopy and Microanalysis},
number = [1],
volume = [26],
place = {United States},
year = {2020},
month = {2}
}

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Works referenced in this record:

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