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Title: Proliferation of Faulty Materials Data Analysis in the Literature

Abstract

As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem with very undesirable consequences. This issue may contribute to what has been identified as a “reproducibility crisis”1,2 that was the subject of a recent U.S. National Academies study. We are using XPS as one example of what we observe to be a systemic issue.

Authors:
 [1];  [2];  [3];  [4];  [5];  [6];  [7];  [8];  [9];  [10];  [11];  [12];  [13];  [14];  [14];  [1];  [15];  [15];  [16];  [17] more »;  [18];  [16] « less
  1. Brigham Young Univ., Provo, UT (United States)
  2. General Electric Global Research, Niskayuna, NY (United States)
  3. Surface Analysis Consultant, Clearwater, FL (United States)
  4. C.R. Brundle & Associates, Soquel, CA (United States)
  5. Univ. of Washington, Seattle, WA (United States)
  6. Univ. of Western Ontario, London, ON (Canada)
  7. Illinois Inst. of Technology, Chicago, IL (United States)
  8. Physical Electronics, Chanhassen, MN (United States)
  9. The Center for Research and Advanced Studies of the National Polytechnic Institute (CINVESTAV), Mexico City (Mexico)
  10. Univ. of Southern Denmark, Odense (Denmark)
  11. Univ. of South Australia, Adelaide, SA (Australia)
  12. Univ. of Namur (Belgium). Namur Inst. of Structured Matter
  13. The Royal Melbourne Inst. of Technology (Australia)
  14. CSIRO Manufacturing, Ian Wark Lab., Clayton, VC (Australia)
  15. SPECS Surface Nano Analysis GmbH, Berlin (Germany)
  16. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
  17. National Inst. of Standards and Technology, Gaithersburg, MD (United States)
  18. Univ. of Maryland, College Park, MD (United States)
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1603314
Report Number(s):
PNNL-SA-141475
Journal ID: ISSN 1431-9276
Grant/Contract Number:  
AC05-76RL01830
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 26; Journal Issue: 1; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; XPS; reproducibility; materials analysis

Citation Formats

Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M. A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., and Baer, Donald R. Proliferation of Faulty Materials Data Analysis in the Literature. United States: N. p., 2020. Web. doi:10.1017/S1431927619015332.
Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M. A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., & Baer, Donald R. Proliferation of Faulty Materials Data Analysis in the Literature. United States. doi:https://doi.org/10.1017/S1431927619015332
Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M. A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., and Baer, Donald R. Fri . "Proliferation of Faulty Materials Data Analysis in the Literature". United States. doi:https://doi.org/10.1017/S1431927619015332. https://www.osti.gov/servlets/purl/1603314.
@article{osti_1603314,
title = {Proliferation of Faulty Materials Data Analysis in the Literature},
author = {Linford, Matthew R. and Smentkowski, Vincent S. and Grant, John T. and Brundle, C. Richard and Sherwood, Peter M. A. and Biesinger, Mark C. and Terry, Jeff and Artyushkova, Kateryna and Herrera-Gómez, Alberto and Tougaard, Sven and Skinner, William and Pireaux, Jean-Jacques and McConville, Christopher F. and Easton, Christopher D. and Gengenbach, Thomas R. and Major, George H. and Dietrich, Paul and Thissen, Andreas and Engelhard, Mark and Powell, Cedric J. and Gaskell, Karen J. and Baer, Donald R.},
abstractNote = {As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem with very undesirable consequences. This issue may contribute to what has been identified as a “reproducibility crisis”1,2 that was the subject of a recent U.S. National Academies study. We are using XPS as one example of what we observe to be a systemic issue.},
doi = {10.1017/S1431927619015332},
journal = {Microscopy and Microanalysis},
number = 1,
volume = 26,
place = {United States},
year = {2020},
month = {1}
}

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