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Title: Current loss analysis in photoelectrochemical devices

ORCiD logo [1]; ORCiD logo [2]
  1. Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Walter Schottky Institute and Physics Department, Technische Universität München, Garching 85748, Germany
  2. Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Publication Date:
Sponsoring Org.:
OSTI Identifier:
Grant/Contract Number:  
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
[Journal Name: APL Materials Journal Volume: 8 Journal Issue: 3]; Journal ID: ISSN 2166-532X
American Institute of Physics
Country of Publication:
United States

Citation Formats

Kistler, Tobias A., and Agbo, Peter. Current loss analysis in photoelectrochemical devices. United States: N. p., 2020. Web. doi:10.1063/1.5142561.
Kistler, Tobias A., & Agbo, Peter. Current loss analysis in photoelectrochemical devices. United States. doi:10.1063/1.5142561.
Kistler, Tobias A., and Agbo, Peter. Sun . "Current loss analysis in photoelectrochemical devices". United States. doi:10.1063/1.5142561.
title = {Current loss analysis in photoelectrochemical devices},
author = {Kistler, Tobias A. and Agbo, Peter},
abstractNote = {},
doi = {10.1063/1.5142561},
journal = {APL Materials},
number = [3],
volume = [8],
place = {United States},
year = {2020},
month = {3}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.5142561

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