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Title: Cryogenic specimens for nanoscale characterization of solid–liquid interfaces

Abstract

We report new cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid–liquid interfaces have recently been developed. These techniques provide high-resolution information about buried interfaces from large samples or devices that cannot be obtained by other means. These advancements were enabled by the development of instrumentation for cryogenic focused ion beam liftout, which allows intact solid–liquid interfaces to be extracted from large samples and thinned to electron-transparent thicknesses for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in situ liquid-phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid–liquid interfaces.

Authors:
 [1];  [2];  [3];  [4];  [5]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
  2. INM–Leibniz Inst. for New Materials (Germany)
  3. Univ. of Oregon, Eugene, OR (United States)
  4. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies (CINT)
  5. Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Energy Frontier Research Enters (EFRC) (United States). Center for Performance and Design of Nuclear Waste Forms and Containers (WastePD)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Science (SC), Biological and Environmental Research (BER) (SC-23); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1601443
Report Number(s):
[SAND-2019-11876J]
[Journal ID: ISSN 0883-7694; 679963]
Grant/Contract Number:  
[AC04-94AL85000; NA0003525; SC0016584]
Resource Type:
Accepted Manuscript
Journal Name:
MRS Bulletin
Additional Journal Information:
[ Journal Volume: 44; Journal Issue: 12]; Journal ID: ISSN 0883-7694
Publisher:
Materials Research Society
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; focused ion beam (FIB); scanning transmission electron rnicroscopy (STEM); atom probe tomography; fluid; interface

Citation Formats

Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, and Perea, Daniel E. Cryogenic specimens for nanoscale characterization of solid–liquid interfaces. United States: N. p., 2019. Web. doi:10.1557/mrs.2019.289.
Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, & Perea, Daniel E. Cryogenic specimens for nanoscale characterization of solid–liquid interfaces. United States. doi:10.1557/mrs.2019.289.
Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, and Perea, Daniel E. Sun . "Cryogenic specimens for nanoscale characterization of solid–liquid interfaces". United States. doi:10.1557/mrs.2019.289.
@article{osti_1601443,
title = {Cryogenic specimens for nanoscale characterization of solid–liquid interfaces},
author = {Zachman, Michael J. and de Jonge, Niels and Fischer, Robert and Jungjohann, Katherine Leigh and Perea, Daniel E.},
abstractNote = {We report new cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid–liquid interfaces have recently been developed. These techniques provide high-resolution information about buried interfaces from large samples or devices that cannot be obtained by other means. These advancements were enabled by the development of instrumentation for cryogenic focused ion beam liftout, which allows intact solid–liquid interfaces to be extracted from large samples and thinned to electron-transparent thicknesses for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in situ liquid-phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid–liquid interfaces.},
doi = {10.1557/mrs.2019.289},
journal = {MRS Bulletin},
number = [12],
volume = [44],
place = {United States},
year = {2019},
month = {12}
}

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