Cryogenic specimens for nanoscale characterization of solid–liquid interfaces
Abstract
We report new cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid–liquid interfaces have recently been developed. These techniques provide high-resolution information about buried interfaces from large samples or devices that cannot be obtained by other means. These advancements were enabled by the development of instrumentation for cryogenic focused ion beam liftout, which allows intact solid–liquid interfaces to be extracted from large samples and thinned to electron-transparent thicknesses for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in situ liquid-phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid–liquid interfaces.
- Authors:
-
[1];
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
- INM–Leibniz Inst. for New Materials (Germany)
- Univ. of Oregon, Eugene, OR (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies (CINT)
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
- Publication Date:
- Research Org.:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies (CINT); Energy Frontier Research Centers (EFRC) (United States). Center for Performance and Design of Nuclear Waste Forms and Containers (WastePD); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Biological and Environmental Research (BER); USDOE National Nuclear Security Administration (NNSA); INM–Leibniz Institute for New Materials; USDOE Laboratory Directed Research and Development (LDRD) Program
- OSTI Identifier:
- 1601443
- Alternate Identifier(s):
- OSTI ID: 1616828
- Report Number(s):
- SAND-2019-11876J
Journal ID: ISSN 0883-7694; 679963
- Grant/Contract Number:
- AC04-94AL85000; NA0003525; SC0016584; AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- MRS Bulletin
- Additional Journal Information:
- Journal Volume: 44; Journal Issue: 12; Journal ID: ISSN 0883-7694
- Publisher:
- Materials Research Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 77 NANOSCIENCE AND NANOTECHNOLOGY; focused ion beam (FIB); scanning transmission electron rnicroscopy (STEM); atom probe tomography; fluid; interface
Citation Formats
Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, and Perea, Daniel E. Cryogenic specimens for nanoscale characterization of solid–liquid interfaces. United States: N. p., 2019.
Web. doi:10.1557/mrs.2019.289.
Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, & Perea, Daniel E. Cryogenic specimens for nanoscale characterization of solid–liquid interfaces. United States. https://doi.org/10.1557/mrs.2019.289
Zachman, Michael J., de Jonge, Niels, Fischer, Robert, Jungjohann, Katherine Leigh, and Perea, Daniel E. Sun .
"Cryogenic specimens for nanoscale characterization of solid–liquid interfaces". United States. https://doi.org/10.1557/mrs.2019.289. https://www.osti.gov/servlets/purl/1601443.
@article{osti_1601443,
title = {Cryogenic specimens for nanoscale characterization of solid–liquid interfaces},
author = {Zachman, Michael J. and de Jonge, Niels and Fischer, Robert and Jungjohann, Katherine Leigh and Perea, Daniel E.},
abstractNote = {We report new cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid–liquid interfaces have recently been developed. These techniques provide high-resolution information about buried interfaces from large samples or devices that cannot be obtained by other means. These advancements were enabled by the development of instrumentation for cryogenic focused ion beam liftout, which allows intact solid–liquid interfaces to be extracted from large samples and thinned to electron-transparent thicknesses for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in situ liquid-phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid–liquid interfaces.},
doi = {10.1557/mrs.2019.289},
journal = {MRS Bulletin},
number = 12,
volume = 44,
place = {United States},
year = {2019},
month = {12}
}
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