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Title: Source size measurement options for low-emittance light sources

Abstract

Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. Three of these techniques, namely, pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor system (ps-BPM), are evaluated for measuring source sizes at low-emittance storage rings. Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes. Pinhole imaging has the simplest setup and gives the beam profile in both transverse dimensions but with limited resolution. Double-slit interferometry has the highest resolution but with a limited detectable size range. The ps-BPM system shows reasonable resolution for monitoring small source sizes and divergence and can give real-time information of the source position and angle. New facilities may consider an integrated system that combines some or all of these techniques.

Authors:
ORCiD logo; ORCiD logo; ; ORCiD logo
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Foundation for Innovation (CFI); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); Canadian Institutes of Health Research (CIHR)
OSTI Identifier:
1601080
Alternate Identifier(s):
OSTI ID: 1607483
Grant/Contract Number:  
[AC02-06CH11357]
Resource Type:
Published Article
Journal Name:
Physical Review Accelerators and Beams
Additional Journal Information:
[Journal Name: Physical Review Accelerators and Beams Journal Volume: 23 Journal Issue: 2]; Journal ID: ISSN 2469-9888
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Samadi, N., Shi, X., Dallin, L., and Chapman, D. Source size measurement options for low-emittance light sources. United States: N. p., 2020. Web. doi:10.1103/PhysRevAccelBeams.23.024801.
Samadi, N., Shi, X., Dallin, L., & Chapman, D. Source size measurement options for low-emittance light sources. United States. doi:10.1103/PhysRevAccelBeams.23.024801.
Samadi, N., Shi, X., Dallin, L., and Chapman, D. Fri . "Source size measurement options for low-emittance light sources". United States. doi:10.1103/PhysRevAccelBeams.23.024801.
@article{osti_1601080,
title = {Source size measurement options for low-emittance light sources},
author = {Samadi, N. and Shi, X. and Dallin, L. and Chapman, D.},
abstractNote = {Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. Three of these techniques, namely, pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor system (ps-BPM), are evaluated for measuring source sizes at low-emittance storage rings. Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes. Pinhole imaging has the simplest setup and gives the beam profile in both transverse dimensions but with limited resolution. Double-slit interferometry has the highest resolution but with a limited detectable size range. The ps-BPM system shows reasonable resolution for monitoring small source sizes and divergence and can give real-time information of the source position and angle. New facilities may consider an integrated system that combines some or all of these techniques.},
doi = {10.1103/PhysRevAccelBeams.23.024801},
journal = {Physical Review Accelerators and Beams},
number = [2],
volume = [23],
place = {United States},
year = {2020},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevAccelBeams.23.024801

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