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Title: The 4D Camera: Very High Speed Electron Counting for 4D-STEM

Abstract

A vast array of new experimental modalities have been enabled in the past several years through the development of pixelated detectors synchronized to probe scanning electronics. Such camera systems can then acquire the rich information present in the central portion of the convergent beam electron diffraction pattern as a function of probe position (4D-STEM). Here, we present the development, installation, and characterization of the 4D Camera, a CMOS Active Pixel Sensor that consists of a 576 x 576 array of 10 μm pixels of a design related to the original TEAM detector and an outer HAADF detector with 16 concentric quadrant diodes.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1599804
Grant/Contract Number:  
[AC02-05CH11231]
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
[ Journal Volume: 25; Journal Issue: S2]; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Ciston, Jim, Johnson, Ian J., Draney, Brent R., Ercius, Peter, Fong, Erin, Goldschmidt, Azriel, Joseph, John M., Lee, Jason R., Mueller, Alexander, Ophus, Colin, Selvarajan, Ashwin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., Minor, Andrew M., and Denes, Peter. The 4D Camera: Very High Speed Electron Counting for 4D-STEM. United States: N. p., 2019. Web. doi:10.1017/s1431927619010389.
Ciston, Jim, Johnson, Ian J., Draney, Brent R., Ercius, Peter, Fong, Erin, Goldschmidt, Azriel, Joseph, John M., Lee, Jason R., Mueller, Alexander, Ophus, Colin, Selvarajan, Ashwin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., Minor, Andrew M., & Denes, Peter. The 4D Camera: Very High Speed Electron Counting for 4D-STEM. United States. doi:10.1017/s1431927619010389.
Ciston, Jim, Johnson, Ian J., Draney, Brent R., Ercius, Peter, Fong, Erin, Goldschmidt, Azriel, Joseph, John M., Lee, Jason R., Mueller, Alexander, Ophus, Colin, Selvarajan, Ashwin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., Minor, Andrew M., and Denes, Peter. Mon . "The 4D Camera: Very High Speed Electron Counting for 4D-STEM". United States. doi:10.1017/s1431927619010389.
@article{osti_1599804,
title = {The 4D Camera: Very High Speed Electron Counting for 4D-STEM},
author = {Ciston, Jim and Johnson, Ian J. and Draney, Brent R. and Ercius, Peter and Fong, Erin and Goldschmidt, Azriel and Joseph, John M. and Lee, Jason R. and Mueller, Alexander and Ophus, Colin and Selvarajan, Ashwin and Skinner, David E. and Stezelberger, Thorsten and Tindall, Craig S. and Minor, Andrew M. and Denes, Peter},
abstractNote = {A vast array of new experimental modalities have been enabled in the past several years through the development of pixelated detectors synchronized to probe scanning electronics. Such camera systems can then acquire the rich information present in the central portion of the convergent beam electron diffraction pattern as a function of probe position (4D-STEM). Here, we present the development, installation, and characterization of the 4D Camera, a CMOS Active Pixel Sensor that consists of a 576 x 576 array of 10 μm pixels of a design related to the original TEAM detector and an outer HAADF detector with 16 concentric quadrant diodes.},
doi = {10.1017/s1431927619010389},
journal = {Microscopy and Microanalysis},
number = [S2],
volume = [25],
place = {United States},
year = {2019},
month = {8}
}

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Works referenced in this record:

Characterisation of a CMOS active pixel sensor for use in the TEAM microscope
journal, October 2010

  • Battaglia, Marco; Contarato, Devis; Denes, Peter
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 622, Issue 3
  • DOI: 10.1016/j.nima.2010.07.066

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
journal, June 2015

  • Ozdol, V. B.; Gammer, C.; Jin, X. G.
  • Applied Physics Letters, Vol. 106, Issue 25
  • DOI: 10.1063/1.4922994

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016

  • Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
  • Microscopy and Microanalysis, Vol. 22, Issue 1
  • DOI: 10.1017/S1431927615015664

A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction
journal, August 2018

  • Johnson, Ian J.; Bustillo, Karen C.; Ciston, Jim
  • Microscopy and Microanalysis, Vol. 24, Issue S1
  • DOI: 10.1017/S1431927618001320

Resolution beyond the 'information limit' in transmission electron microscopy
journal, April 1995

  • Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M.
  • Nature, Vol. 374, Issue 6523
  • DOI: 10.1038/374630a0

Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
journal, February 2016

  • Ophus, Colin; Ciston, Jim; Pierce, Jordan
  • Nature Communications, Vol. 7, Issue 1
  • DOI: 10.1038/ncomms10719

Non-spectroscopic composition measurements of SrTiO 3 -La 0.7 Sr 0.3 MnO 3 multilayers using scanning convergent beam electron diffraction
journal, February 2017

  • Ophus, Colin; Ercius, Peter; Huijben, Mark
  • Applied Physics Letters, Vol. 110, Issue 6
  • DOI: 10.1063/1.4975932