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Title: Design of target irradiation and diagnostic chamber to study ps-laser generated plasma as a source of singly charged ions for external injection into an electron beam ion source

Journal Article · · Review of Scientific Instruments
DOI: https://doi.org/10.1063/1.5127833 · OSTI ID:1599584

High repetition-rate (~10 kHz) ps-lasers are becoming available on the market with reasonable cost and may offer several advantages compared to ns-lasers by generating nearly continuous beams of singly charged ions appropriate for the “slow” injection mode into the Electron Beam Ion Source (EBIS). To evaluate these advantages, we will perform studies of a ps-laser generated plasma using a laser with a pulse duration of 8 ps and energy up to 5 mJ per pulse. A vacuum chamber equipped with a 3D target positioner, a focusing lens, and a Faraday Cup has been designed and built for this study. Lens-to-target distance variations have been measured using a laser tracker over the whole range of horizontal and vertical translation for all five targets we will use. The variations were found to be within ±150 µm. This level of “target flatness” should be acceptable for our experimental conditions. Ion currents and ion pulse durations of various elements (from Al to Ta) will be measured for different target irradiation conditions (focal spot size and laser pulse energy). The results obtained will allow us to specify all parameters and geometry of a laser ion source based on a ps-laser to provide external ion injection into the relativistic heavy ion collider EBIS

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Office of Nuclear Physics (NP); National Aeronautics and Space Administration (NASA)
Grant/Contract Number:
SC0012704; AC02-06CH11357
OSTI ID:
1599584
Alternate ID(s):
OSTI ID: 1761512
Report Number(s):
BNL-213634-2020-JAAM; TRN: US2103481
Journal Information:
Review of Scientific Instruments, Vol. 91, Issue 2; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

References (3)

Reliable operation of the Brookhaven EBIS for highly charged ion production for RHIC and NSRL
  • Beebe, E.; Alessi, J.; Binello, S.
  • PROCEEDINGS OF THE XII INTERNATIONAL SYMPOSIUM ON ELECTRON BEAM ION SOURCES AND TRAPS, AIP Conference Proceedings https://doi.org/10.1063/1.4905394
conference January 2015
A hollow cathode ion source for production of primary ions for the BNL electron beam ion source journal February 2014
Isotope separator for external ion injection into EBIS conference January 2018