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Title: Enhanced antiferromagnetic resonance linewidth in NiO/Pt and NiO/Pd

Authors:
ORCiD logo; ; ORCiD logo; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1599519
Grant/Contract Number:  
SC0012190
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Name: Physical Review B Journal Volume: 101 Journal Issue: 6; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Moriyama, Takahiro, Hayashi, Kensuke, Yamada, Keisuke, Shima, Mutsuhiro, Ohya, Yutaka, Tserkovnyak, Yaroslav, and Ono, Teruo. Enhanced antiferromagnetic resonance linewidth in NiO/Pt and NiO/Pd. United States: N. p., 2020. Web. doi:10.1103/PhysRevB.101.060402.
Moriyama, Takahiro, Hayashi, Kensuke, Yamada, Keisuke, Shima, Mutsuhiro, Ohya, Yutaka, Tserkovnyak, Yaroslav, & Ono, Teruo. Enhanced antiferromagnetic resonance linewidth in NiO/Pt and NiO/Pd. United States. doi:10.1103/PhysRevB.101.060402.
Moriyama, Takahiro, Hayashi, Kensuke, Yamada, Keisuke, Shima, Mutsuhiro, Ohya, Yutaka, Tserkovnyak, Yaroslav, and Ono, Teruo. Tue . "Enhanced antiferromagnetic resonance linewidth in NiO/Pt and NiO/Pd". United States. doi:10.1103/PhysRevB.101.060402.
@article{osti_1599519,
title = {Enhanced antiferromagnetic resonance linewidth in NiO/Pt and NiO/Pd},
author = {Moriyama, Takahiro and Hayashi, Kensuke and Yamada, Keisuke and Shima, Mutsuhiro and Ohya, Yutaka and Tserkovnyak, Yaroslav and Ono, Teruo},
abstractNote = {},
doi = {10.1103/PhysRevB.101.060402},
journal = {Physical Review B},
number = 6,
volume = 101,
place = {United States},
year = {2020},
month = {2}
}

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