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Title: Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films

Authors:
; ; ; ORCiD logo; ; ; ; ; ORCiD logo
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1599490
Grant/Contract Number:  
AC02-05CH11231; AC0500OR22725
Resource Type:
Published Article
Journal Name:
Physical Review Materials
Additional Journal Information:
Journal Name: Physical Review Materials Journal Volume: 4 Journal Issue: 2; Journal ID: ISSN 2475-9953
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Kelley, K. P., Yilmaz, D. E., Collins, L., Sharma, Y., Lee, H. N., Akbarian, D., van Duin, A. C. T., Ganesh, P., and Vasudevan, R. K. Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films. United States: N. p., 2020. Web. doi:10.1103/PhysRevMaterials.4.024407.
Kelley, K. P., Yilmaz, D. E., Collins, L., Sharma, Y., Lee, H. N., Akbarian, D., van Duin, A. C. T., Ganesh, P., & Vasudevan, R. K. Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films. United States. doi:10.1103/PhysRevMaterials.4.024407.
Kelley, K. P., Yilmaz, D. E., Collins, L., Sharma, Y., Lee, H. N., Akbarian, D., van Duin, A. C. T., Ganesh, P., and Vasudevan, R. K. Wed . "Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films". United States. doi:10.1103/PhysRevMaterials.4.024407.
@article{osti_1599490,
title = {Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films},
author = {Kelley, K. P. and Yilmaz, D. E. and Collins, L. and Sharma, Y. and Lee, H. N. and Akbarian, D. and van Duin, A. C. T. and Ganesh, P. and Vasudevan, R. K.},
abstractNote = {},
doi = {10.1103/PhysRevMaterials.4.024407},
journal = {Physical Review Materials},
number = 2,
volume = 4,
place = {United States},
year = {2020},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevMaterials.4.024407

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