A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control

Chandrasekhar, Venkat

doi:10.1063/1.5131657

Title: A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control

Abstract

An inexpensive yet versatile transducer controller for non-contact scanning probe microscopy (SPM) based on a PIC32 microcontroller from Microchip Technology, Inc is described. In addition to feedback control using the amplitude or phase of the signal from the non-contact transducer, the controller includes a phase-locked loop for frequency-shift feedback, as well as fixed-amplitude, quality factor (Q) control, and self-excitation modes. Apart from the input amplifiers, output buffers, and the Q-control circuit, all other functions of the controller are instantiated in software on the microchip, enabling rapid changes in operating parameters if needed. The controller communicates with a host personal computer via a simple serial connection. The controller has been tested with a quartz tuning-fork transducer but can be used with any oscillating non-contact transducer.

Authors:

Chandrasekhar, Venkat ^[1]

Northwestern Univ., Evanston, IL (United States). Dept. of Physics

Publication Date:: Tue Feb 11 00:00:00 EST 2020

Research Org.:: Northwestern Univ., Evanston, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1800392

Alternate Identifier(s):: OSTI ID: 1598916

Grant/Contract Number:: FG02-06ER46346

Resource Type:: Accepted Manuscript

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 91; Journal Issue: 2; Journal ID: ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; Instruments & Instrumentation; Physics; Phase lock loop; Feedback control system; Phase detector; Microcontroller; Scanning probe microscopy; Tuning forks

Citation Formats


                    Chandrasekhar, Venkat. A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control.  United States: N. p., 2020. 
Web.  doi:10.1063/1.5131657.

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                    Chandrasekhar, Venkat. A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control.  United States.  https://doi.org/10.1063/1.5131657

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                    Chandrasekhar, Venkat. Tue .  
"A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control".  United States.  https://doi.org/10.1063/1.5131657.  https://www.osti.gov/servlets/purl/1800392.

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@article{osti_1800392,

  title        = {A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control},

  author       = {Chandrasekhar, Venkat},

  abstractNote = {An inexpensive yet versatile transducer controller for non-contact scanning probe microscopy (SPM) based on a PIC32 microcontroller from Microchip Technology, Inc is described. In addition to feedback control using the amplitude or phase of the signal from the non-contact transducer, the controller includes a phase-locked loop for frequency-shift feedback, as well as fixed-amplitude, quality factor (Q) control, and self-excitation modes. Apart from the input amplifiers, output buffers, and the Q-control circuit, all other functions of the controller are instantiated in software on the microchip, enabling rapid changes in operating parameters if needed. The controller communicates with a host personal computer via a simple serial connection. The controller has been tested with a quartz tuning-fork transducer but can be used with any oscillating non-contact transducer.},

  doi          = {10.1063/1.5131657},

  journal      = {Review of Scientific Instruments},

  number       = 2,

  volume       = 91,

  place        = {United States},

  year         = {Tue Feb 11 00:00:00 EST 2020},

  month        = {Tue Feb 11 00:00:00 EST 2020}

}

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https://doi.org/10.1063/1.5131657

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Works referenced in this record:

RTSPM: Real-time Linux control software for scanning probe microscopy
journal, January 2013

Chandrasekhar, V.; Mehta, M. M.
Review of Scientific Instruments, Vol. 84, Issue 1
DOI: 10.1063/1.4775717

A hybrid analog-digital phase-locked loop for frequency mode non-contact scanning probe microscopy
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Mehta, M. M.; Chandrasekhar, V.
Review of Scientific Instruments, Vol. 85, Issue 1
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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
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Giessibl, Franz J.
Applied Physics Letters, Vol. 76, Issue 11
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Scanning Probe Microscopy
book, January 2007

Kalinin, Sergei; Gruverman, Alexei
Springer New York, NY
DOI: 10.1007/978-0-387-28668-6

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016

Dagdeviren, Omur E.; Götzen, Jan; Hölscher, Hendrik
Nanotechnology, Vol. 27, Issue 6
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The qPlus sensor, a powerful core for the atomic force microscope
journal, January 2019

Giessibl, Franz J.
Review of Scientific Instruments, Vol. 90, Issue 1
DOI: 10.1063/1.5052264

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Title: A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control

Abstract

Citation Formats

RTSPM: Real-time Linux control software for scanning probe microscopy journal, January 2013

A hybrid analog-digital phase-locked loop for frequency mode non-contact scanning probe microscopy journal, January 2014

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork journal, March 2000

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RTSPM: Real-time Linux control software for scanning probe microscopy
journal, January 2013

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journal, January 2014

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
journal, March 2000

Scanning Probe Microscopy
book, January 2007

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016

The qPlus sensor, a powerful core for the atomic force microscope
journal, January 2019