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Title: A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control

Authors:
 [1]
  1. Department of Physics, Northwestern University, Evanston, Illinois 60208, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1598916
Grant/Contract Number:  
FG02-06ER46346
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 91 Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Chandrasekhar, Venkat. A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control. United States: N. p., 2020. Web. doi:10.1063/1.5131657.
Chandrasekhar, Venkat. A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control. United States. doi:10.1063/1.5131657.
Chandrasekhar, Venkat. Sat . "A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control". United States. doi:10.1063/1.5131657.
@article{osti_1598916,
title = {A microchip microcontroller-based transducer controller for non-contact scanning probe microscopy with phase-locked loop, amplitude, and Q control},
author = {Chandrasekhar, Venkat},
abstractNote = {},
doi = {10.1063/1.5131657},
journal = {Review of Scientific Instruments},
number = 2,
volume = 91,
place = {United States},
year = {2020},
month = {2}
}

Journal Article:
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Works referenced in this record:

RTSPM: Real-time Linux control software for scanning probe microscopy
journal, January 2013

  • Chandrasekhar, V.; Mehta, M. M.
  • Review of Scientific Instruments, Vol. 84, Issue 1
  • DOI: 10.1063/1.4775717

A hybrid analog-digital phase-locked loop for frequency mode non-contact scanning probe microscopy
journal, January 2014

  • Mehta, M. M.; Chandrasekhar, V.
  • Review of Scientific Instruments, Vol. 85, Issue 1
  • DOI: 10.1063/1.4862818

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016


The qPlus sensor, a powerful core for the atomic force microscope
journal, January 2019

  • Giessibl, Franz J.
  • Review of Scientific Instruments, Vol. 90, Issue 1
  • DOI: 10.1063/1.5052264