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Title: Probing the surface oxidation process in hexagonal boron nitride epilayers

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]
  1. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1598727
Grant/Contract Number:  
AR000964
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
AIP Advances
Additional Journal Information:
Journal Name: AIP Advances Journal Volume: 10 Journal Issue: 2; Journal ID: ISSN 2158-3226
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Wang, Q. W., Li, J., Lin, J. Y., and Jiang, H. X. Probing the surface oxidation process in hexagonal boron nitride epilayers. United States: N. p., 2020. Web. doi:10.1063/1.5134993.
Wang, Q. W., Li, J., Lin, J. Y., & Jiang, H. X. Probing the surface oxidation process in hexagonal boron nitride epilayers. United States. doi:10.1063/1.5134993.
Wang, Q. W., Li, J., Lin, J. Y., and Jiang, H. X. Sat . "Probing the surface oxidation process in hexagonal boron nitride epilayers". United States. doi:10.1063/1.5134993.
@article{osti_1598727,
title = {Probing the surface oxidation process in hexagonal boron nitride epilayers},
author = {Wang, Q. W. and Li, J. and Lin, J. Y. and Jiang, H. X.},
abstractNote = {},
doi = {10.1063/1.5134993},
journal = {AIP Advances},
number = 2,
volume = 10,
place = {United States},
year = {2020},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.5134993

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