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Title: Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Abstract

X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses.

Authors:
 [1];  [2];  [3];  [4];  [1]; ORCiD logo [5];  [6]; ORCiD logo [7];  [4];  [4];  [4];  [6];  [6];  [6];  [6];  [7]; ORCiD logo [8];  [9];  [10];  [10] more »;  [10];  [11]; ORCiD logo [11];  [5] « less
  1. Kyoto Univ. (Japan); RIKEN SPring-8 Center (Japan)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Argonne National Lab. (ANL), Lemont, IL (United States); Paul-Scherrer Inst. (Switzerland); Ecole Polytechnique Federale Lausanne (Switzerland)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
  4. Kyoto Univ. (Japan)
  5. RIKEN SPring-8 Center (Japan); Tohoku Univ., Sendai (Japan)
  6. Tohoku Univ., Sendai (Japan)
  7. Hiroshima Univ. (Japan)
  8. Synchrotron SOLEIL, Gif-sur-Yvette (France); National Inst. for Physics and Nuclear Engineering (Romania); Univ. Paris-Saclay, Gif-sur-Yvette (France)
  9. Synchrotron SOLEIL, Gif-sur-Yvette (France)
  10. Japan Synchrotron Radiation Research Inst. (JASRI), Hyogo (Japan)
  11. RIKEN SPring-8 Center (Japan)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Chemical Sciences, Geosciences & Biosciences Division; National Natural Science Foundation of China (NNSFC)
OSTI Identifier:
1598410
Grant/Contract Number:  
[AC02-76SF00515; 11604003]
Resource Type:
Accepted Manuscript
Journal Name:
Applied Sciences
Additional Journal Information:
[ Journal Volume: 9; Journal Issue: 22]; Journal ID: ISSN 2076-3417
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; XFEL; diffractive imaging; fluorescence spectroscopy; ion spectroscopy

Citation Formats

Nishiyama, Toshiyuki, Bostedt, Christoph, Ferguson, Ken R., Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Miron, Catalin, Nicolas, Christophe, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, and Ueda, Kiyoshi. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. United States: N. p., 2019. Web. doi:10.3390/app9224932.
Nishiyama, Toshiyuki, Bostedt, Christoph, Ferguson, Ken R., Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Miron, Catalin, Nicolas, Christophe, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, & Ueda, Kiyoshi. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. United States. doi:10.3390/app9224932.
Nishiyama, Toshiyuki, Bostedt, Christoph, Ferguson, Ken R., Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Miron, Catalin, Nicolas, Christophe, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, and Ueda, Kiyoshi. Sat . "Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses". United States. doi:10.3390/app9224932. https://www.osti.gov/servlets/purl/1598410.
@article{osti_1598410,
title = {Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses},
author = {Nishiyama, Toshiyuki and Bostedt, Christoph and Ferguson, Ken R. and Hutchison, Christopher and Nagaya, Kiyonobu and Fukuzawa, Hironobu and Motomura, Koji and Wada, Shin-ichi and Sakai, Tsukasa and Matsunami, Kenji and Matsuda, Kazuhiro and Tachibana, Tetsuya and Ito, Yuta and Xu, Weiqing and Mondal, Subhendu and Umemoto, Takayuki and Miron, Catalin and Nicolas, Christophe and Kameshima, Takashi and Joti, Yasumasa and Tono, Kensuke and Hatsui, Takaki and Yabashi, Makina and Ueda, Kiyoshi},
abstractNote = {X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses.},
doi = {10.3390/app9224932},
journal = {Applied Sciences},
number = [22],
volume = [9],
place = {United States},
year = {2019},
month = {11}
}

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