Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy
Abstract
Abstract Atomic‐resolution imaging of halide perovskites (HPs) using transmission electron microscopy (TEM) is challenging because of the sensitivity of their structures to the electron beam. In this article, recent achievements in this area are reviewed, covering both all‐inorganic and organic–inorganic hybrid HPs, with an emphasis on the specific imaging conditions that have proven to be effective in avoiding electron beam‐induced structural damage. The discussion focusses on the total electron dose that HPs can bear before being damaged and the effects of different imaging modes, accelerating voltages, and temperatures. The crucial role of a direct‐detection electron‐counting camera in reducing the required electron dose is outlined, which is indispensable for imaging extremely sensitive organic–inorganic hybrid perovskites. In addition to reviewing published works, the results of initial attempts to perform atomic‐resolution elemental mapping for an all‐inorganic HP and image a hybrid HP using scanning TEM are introduced. The preparation of a TEM specimen from macroscopic crystals or devices of HPs, which is very important for practical applications but has not yet received attention, is also discussed. This article aims to provide guidance on the acquisition of atomic‐resolution TEM images of HPs and inspire the development of more imaging technologies for sensitive materials.
- Authors:
-
[1]
- Advanced Membranes and Porous Materials Center Division of Physical Sciences and Engineering King Abdullah University of Science and Technology (KAUST) Thuwal 23955‐6900 Kingdom of Saudi Arabia
- Multi‐scale Porous Materials Center Institute of Advanced Interdisciplinary Studies &, School of Chemistry and Chemical Engineering Chongqing University Chongqing 400044 P. R. China
- Department of Chemistry University of Wisconsin‐Madison 1101 University Avenue Madison WI 53706 USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1597543
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Advanced Energy Materials
- Additional Journal Information:
- Journal Name: Advanced Energy Materials Journal Volume: 10 Journal Issue: 26; Journal ID: ISSN 1614-6832
- Publisher:
- Wiley Blackwell (John Wiley & Sons)
- Country of Publication:
- Germany
- Language:
- English
Citation Formats
Song, Kepeng, Liu, Lingmei, Zhang, Daliang, Hautzinger, Matthew P., Jin, Song, and Han, Yu. Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy. Germany: N. p., 2020.
Web. doi:10.1002/aenm.201904006.
Song, Kepeng, Liu, Lingmei, Zhang, Daliang, Hautzinger, Matthew P., Jin, Song, & Han, Yu. Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy. Germany. https://doi.org/10.1002/aenm.201904006
Song, Kepeng, Liu, Lingmei, Zhang, Daliang, Hautzinger, Matthew P., Jin, Song, and Han, Yu. Wed .
"Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy". Germany. https://doi.org/10.1002/aenm.201904006.
@article{osti_1597543,
title = {Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy},
author = {Song, Kepeng and Liu, Lingmei and Zhang, Daliang and Hautzinger, Matthew P. and Jin, Song and Han, Yu},
abstractNote = {Abstract Atomic‐resolution imaging of halide perovskites (HPs) using transmission electron microscopy (TEM) is challenging because of the sensitivity of their structures to the electron beam. In this article, recent achievements in this area are reviewed, covering both all‐inorganic and organic–inorganic hybrid HPs, with an emphasis on the specific imaging conditions that have proven to be effective in avoiding electron beam‐induced structural damage. The discussion focusses on the total electron dose that HPs can bear before being damaged and the effects of different imaging modes, accelerating voltages, and temperatures. The crucial role of a direct‐detection electron‐counting camera in reducing the required electron dose is outlined, which is indispensable for imaging extremely sensitive organic–inorganic hybrid perovskites. In addition to reviewing published works, the results of initial attempts to perform atomic‐resolution elemental mapping for an all‐inorganic HP and image a hybrid HP using scanning TEM are introduced. The preparation of a TEM specimen from macroscopic crystals or devices of HPs, which is very important for practical applications but has not yet received attention, is also discussed. This article aims to provide guidance on the acquisition of atomic‐resolution TEM images of HPs and inspire the development of more imaging technologies for sensitive materials.},
doi = {10.1002/aenm.201904006},
journal = {Advanced Energy Materials},
number = 26,
volume = 10,
place = {Germany},
year = {Wed Feb 05 00:00:00 EST 2020},
month = {Wed Feb 05 00:00:00 EST 2020}
}
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